User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 5- 15
Classic Test Definition
I/V List Sweep
Miscellaneous
Variables
This area defines the variables for the time stamp data and the index data.
Time Stamp Name Variable name of the time stamp. Time stamp data indicates
the time at which st
ep measurement was started.
Index Name Variable name of the data index. Integer above 0 is returned.
Measurement Setup
This setup screen is used to set the source channel outputs, the measurement ranging
mode, the sweep abort condition, the measurement channel A/D converter, the
series resistor, the filter, and the source output/measurement wait time.
VAR1 This area defines the primary sweep source output.
Unit Source monitor unit (SMU) used for the VAR1 output
Source Click the grid button to open the Define vector data dialog box.
See “Define vector data” on page 5-18.
Compliance Compliance value. Enter the current limit value for the voltage
source, or th
e voltage limit value for the current source.
Pwr Comp Power compliance value (in W), or OFF
NOTE To define VAR1/VAR2 step outputs
To define these parameters, create a vector data by using the Define vector data
dialog box which is opened by clicking the grid button in the vector data entry field.
See Figure 5-1.
Available array size for the vector data is as follows (column × row).
• VAR1 step output value: N
1
= 1 × 1001 maximum (initial setting: 1 × 1)
• VAR2 step output value: N
2
= 1 × 1001 maximum (initial setting: 1 × 1)
• Delay time: N
3
= 1 × 1001 maximum (initial setting: 1 × 1)
Then, the following formula must be satisfied.
1 ≤ N
1
× N
2
≤ 128128