User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

5- 2 Agilent B1500 User’s Guide, Edition 7
Classic Test Definition
This chapter provides the reference information of the graphical user interface in the
classic test mode of Agilent EasyEXPERT software.
• “I/V Sweep”
• “Multi Channel I/V Sweep”
• “I/V List Sweep”
• “I/V-t Sampling”
• “C-V Sweep”
• “Direct Control”
• “Function Setup”
• “Auto Analysis Setup”
• “Display Setup”
• “SMU Range Setup Window”
• “ADC and Integration Time Setup Window”
• “Advanced Setup Window”
• “CMU Range Setup Window”
• “Advanced Setup Window for C-V Sweep”
• “Switching Matrix Control”
• “SPGU Control”
• “SPGU Pulse Setup Window”
• “Load Z Setup Window”
• “Pulse Switch Setup Window”
• “SPGU ALWG Setup Window”
• “Define ALWG Waveform Window”
To perform measurement, see “Main Screen” on page 4-10.
To display measurement data and perform data analysis, see “Data Display” on page
4-51.
To perform self-test or diagnostics, see “Configuration” on page 4-41.
To perform self-calibration, see “Calibration” on page 4-35.