User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

4- 80 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Text File Export settings
Table 4-12 Setup Data Section Record Items (ON: checked, OFF: unchecked)
Table 4-13 Measurement Data Section Record Items (ON
: checked, OFF: unchecked)
Item Description Default
Test parameters Test parameters defined by the classic test or the
application test.
ON
DUT p
arameters DUT parameters defined by the application test. ON
Analysis setup Data Display setup status at and after the
measurement, such as
Graph configuration, Graph
format, Graph text, Marker configuration, Cursor
configuration, Line configurations, Pointer
configuration, List configuration, and Scalar list
configuration.
OFF
Item Description Default
Data names Measurement parameter name. ON
Data units Unit of measurement data. OFF
Size Dimension1 (VAR1 size) and Dimension2 (VAR2 size)
o
f the measur
ement data.
OFF
Data values Record items can be specified by the follo
wing segments.
Segment Default
Data assigned to X-Y Graph ON
Data assigned to List Display ON
Data assigned to Parameter Display ON
User function defined but not displayed OFF
Analysis function defined but not displayed OFF
Any data referred to by the user function but not
directly disp
layed
OFF
Any data referred to by the analysis function but not
directly disp
layed
OFF