User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 4- 79
Using EasyEXPERT
Text File Export settings
Measurement data
section
Record items of the measurement data. It may contain the measurement parameter
names, data units, and data size. See Table 4-13 for the definition of the record
items. Check the box for the items you want to record, and uncheck the box
for the
items you do not want to record.
Tag information for the measurement data is string value; Dimension1, Dimension2,
Data Name, Da
ta Unit, or Data Value, which means the type of data put in the same
row (in case of By Row orientation) or column (in case of By Column orientation)
in the exported test record. The tag information will be recorded in the test record if
the Tag information box is checked.
See Table 4-10 for the By Row orientation. All data relative to a measurement
parameter will be put in the same column. The first column (ex. column A) contains
th
e tag info
rmation. For the By Column orientation, see Table 4-11. All data relative
to a measurement parameter will be put in the same row. And the first row (ex. row
1) contain
s the tag information. If the Tag information box is unchecked (default),
the tag information is not recorded and the measurement data is shifted.
Table 4-10 By Row Orientation Export Example
Table 4-11 By Column Orientation Export Example
A B C D E F
1 Dimension1 101 101 101 1
2 Dimension2 1 1 1 1
3 Data Name Vg Id Gm Vth
4 Data Unit V A S V
5 Data Value 0 4.55E-09 1.24E-10 1.23
6 Data Value 0.02 8.59E-09 5.25E-10
A B C D E F
1 Dimension1 Dimension2 Data Name Data Unit Data Value Data Value
2 101 1 Vg V 0 0.02
3 101 1 Id A 4.55E-09 8.59E-09
4 101 1 Gm S 1.24E-10 5.25E-10
5 1 1 Vth V 1.23
6