User`s guide

4- 78 Agilent B1500 User’s Guide, Edition 7
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Table 4-9 Identification Section Record Items
Setup data section Record items which describes the test conditions. They are the test parameters, DUT
parameters, and analysis
setup. See Table 4-12 for the definition of the record items.
Check the box for the items you want to record, and uncheck the box for the items
you do not w
ant to record.
Tag information for the setup data is string value; TestParameter, DutParameter, or
AnalysisSetu
p, which means the type of data put in the same row in the exported
test record. If Tag information box is unchecked (default), the tag information is not
recorded. Then, the setup parameter names, such as Channel.Unit, are recorded in
the first column in the test record and the parameter values are recorded in the
following columns. If the Tag information box is checked, the tag information is
recorded in the first column and the parameter names and values are shifted to the
next columns.
The pull-down menu specifies the action for
recording
the items in the Setup data
section. See Table 4-8 to specify the action.
Item Description
Setup title Test setup name
Classic test
name
Classic test name. I/V Sweep, Multi Channel I/V Sweep, I/V-t
Sampling
, C-V Sweep, SPGU Control, Switching Matrix Control,
or Direct Control. This record item is exclusive against the
“Application test name” record item.
Application
test name
Appl
ication test name. This record item is exclusive against the
“Classic test name” record item.
Test date Test execution date corresponding to the date part of the
RecordTime me
ta data.
Test time Test execution time corresponding to the time part of the
RecordTime me
ta data.
Device ID Device ID corresponding to the TestTarget meta data.
Count Test count corresponding to the IterationIndex meta data.
Flags Flags set to the test result data, corresponding to the Flag meta
data.
Remarks R
emarks set to the test result data, corresponding to the Remarks
meta data.