User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
4- 52 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Data Display
NOTE About Display Mode
The Data Display window provides two display mode Overwrite and Append.
In Overwrite mode, the “Display Data (page 4-15)” function opens a new Data
Display window and displays data.
In Append mode, the “Display Data (page 4-15)” function creates a new display
layer on the present Data Display window and displays data.
NOTE Updating Data Calculation
When the classic test result is displayed, you can update the calculation results of the
user function, analysis function, and auto analysis function. So use the Apply
button. See “Function Setup (page 5-42)”.
NOTE Append Measurement
After the Append measurement, you will see tabs between the tool bar and the graph
plot area. The tabs are used to select the display layer for data display and analysis
operation. The Data Display window can have maximum 10 display layers.
NOTE Multi Display Function
In the Multi Display OFF status, the test result data will be always displayed on the
singular Data Display window even if the test setup is changed.
In the Multi Display ON status, the test result data of the same test setup name will
be displ
ayed on the exclusive Data Display window and the test result data of the
different test setup name will be displayed on the new Data Display window.
NOTE The settings on the Display Setup are applied to the X-Y Graph on the Data Display
window. The X-Y Graph can handle one X data on the X axis and up to eight Y data
on the Y axis.
Define the X axis carefully when plotting Multi Channel I/V Sweep measurement
results that may contain data measured by multiple VAR1 channels, as the result
may contain multiple X data that can be selected for the X axis.
The Display Setup must be set properly to match the X axis data and the X data of
the plot to be displayed.