User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
4- 38 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Calibration
Open Correction This check box is effective after the open correction data is measured, and is used to
enable or disable the open correction. Uncheck this box to disable the correction.
To measure the correction data, connect the open stand
ard that has the calibration
value or reference value, or open the measurement terminals at the end of the device
side. Then, click the Measure... button.
If you extend the measurement cables to the device end by using
the four terminal
pairs method, do not forget to connect following terminals together at the device
end.
• the high potential (Hp) terminal and the high current (Hc) termin
al
• the low potential (Lp) terminal and the low current (Lc) terminal
If the standard is used, click the Advanced Options... button and enter
the reference
value to the OPEN Reference entry fields. If you do not use the standard, enter 0 to
the fields.
Short Correction This check box is effective after the short cor
rection data is
measured, and is used to
enable or disable the short correction. Uncheck this box to disable the correction.
To measure the correction data, connect the short st
andard that has the calibration
value or reference value, or directly connect the measurement terminals at the end of
the device side. Then, click the Measure... button.
If the standard is used, click the Advanced Options... button and enter
the reference
value to the SHORT Reference entry fields. If you do not use the standard, enter 0 to
the fields.
Load Correction This check box is effective after the load correct
ion data i
s measured, and is used to
enable or disable the load correction. Uncheck this box to disable the correction.
To measure the correction data, connect the load standar
d that has the calibration
value or reference value. Then, click the Measure... button.
Before performing the load correction data measurement, click
the Advanced
Options... button and enter the reference value to the LOAD Reference entry fields.