User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 4- 37
Using EasyEXPERT
Calibration
CMU Calibration
The CMU calibration tab screen is used to perform the measurement data correction
of the multi frequency capacitance measurement unit (MFCMU). For the easy way,
perform the phase compensation and the open correction at least.
See also “Error Correction” on page 7-24.
NOTE For a more accurate measurement, perform correction data measurement at the
measurement frequency before starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below,
click the Advanced Options... button and set the measurement frequency on the
Frequency area of the Advanced Options for CMU Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M,
2.7 M, 3 M, 3.2 M, 3.5 M, 3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
Measure... Opens a dialog box used to perform correction/compensation data measurement. To
perform the measurement, follow the dialog box.
The correction/compensation measurement data is saved and managed by the
workspace. And
the last measured correction/compensation data will be loaded
when the workspace will be opened next time.
Advanced
Op
tions...
Opens
the “Advanced Options for CMU Calibration (page 4-39)” dialog box used to
set the frequencies for the correction data measurement and the referenc
e values of
the working standard.
Phase
Co
mpensati
on
This check box is effective after the phase compensation data is measured, and is
used to enable or disable the phase compensation. Uncheck this box to disable the
phase compensation.
To measure the compensation data, open the measurement
terminals at the end of
the device side and click the Measure... button.
If you extend the measurement cables to the device end by using
the four terminal
pairs method, do not forget to connect following terminals together at the device
end.
• the high potential (Hp) terminal and the high current (Hc) termin
al
• the low potential (Lp) terminal and the low current (Lc) terminal