User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

4- 28 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Application Test
Open Definition of This Test...
Opens the “Test Definition Window (page 6-3)” to
display the definition of the present (selected)
application test o
r to modify the definition.
Delete Definition of This Test Deletes the present (selected) application test. The
test will be d
eleted from the application library.
Import Test Definition... Opens a dialog box used to specify the test
definition to
import.
Export Test Definition... Opens a dialog box used to export the present
application test d
efinition. The test definition will
be saved to the specified file.
Search Incremental search. Used to search the app
lication test def
initions listed in the
Library area.
Setup Name Used to set the name of test setup. The name must be the identification for the test
setup save
d to a My Favorite group (preset group). Enter a unique name that is
distinct from other setup.
The name is stored in the test result data and is used
to differentiate the records in
the test record list area.
Device Parameters This area displays the device parameter entry fields if the device parameters are
d
efined
as the variables in the application test definition.
Enter the appropriate value to the entry fields before st
arting measurement.
Test Parameters This area displays the device connection diagram if it is specified
in the application
test definition.
This area also displays the test parameter entry fields if the test parameters are
defined as
the variables in the application test definition. Enter the appropriate value
to the entry fields before starting measurement. If the entry field needs to enter a
vector data, see “Define vector data” on page 5-18.
Extended Setup This button opens the Extended Setup dialog box that displays the extended
p
arameter entry fiel
ds. See “Ext” on page 6-6 for the parameters shown in this
dialog box.
Enter the appropriate value to the entry fields and click Clo
se button.