User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
4- 26 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Main Screen
Data Storage Remove a check from the following check box to disable the Auto Record function
(automatic data record).
• Enable automatic data record to the internal storage device
OK Applies
the setup, and closes this dialog box.
Cancel Cancels the setup, and closes this dialog box.
NOTE Automatic Data Record Output
When the automatic data record function is enabled, one test execution result is
stored in one test record. For the classic test, one test result is stored in one test
record. For the application test, all test results taken by executing one application
test are stored in one test record. However, the automatic data export function using
the Text File type exports the file for each test result.
Test Results Data Properties
This dialog box appears by clicking Results > Properties... and is used to set the
maximum number of test records listed in the main screen and saved in the
Delete-group.
Test Result List
Vi
ew
Sets th
e maximum number of test records listed in the main screen.
Non-preserved
data
Sets th
e maximum number of test records saved in the Delete-group.
Close Closes this dialog box.