User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 4- 23
Using EasyEXPERT
Main Screen
Test Results Data Folder Export
This dialog box appears by clicking Results > Transport Data > Folder Export...
after the test result records are selected (highlighted).
This function is used to export the multiple test records. The test records can be
exported b
y specifying the records, the destination folder name, and the naming rule
and the file type for the exported files.
Destination for
Ex
port
Selects the fo
lder used to save the exported test records. The Browse... button opens
the Browse For Folder dialog box used to select the folder.
File Name Specifies the style of the file name f
or the exported
test records.
File name is automatically generated by using Setup Name, Device ID, Count, and
Date values defined
in the main screen. If an impermissible character is used in a
value, the character is automatically replaced with _ (underscore).
• Default Format: File name without extension is as follows.
Setup Name[Device ID(Count);Date]
Ex
ample: Id-Vd [cmos1(1) ; 1_22_2006 3_44_55 PM]
• Custo
m Format: You can specify the style by the Fil
e Name Format dialog box.
The File Name Format dialog box appears by clicking the Settings... button. In
the dialog box,
enter the desired style into the Format field, for example, the
next example sets the same style as the Default Format.
Example: {0} [{3}({2}) ; {1}]
{0}: Setu
p Name
{1}: Date, mm_dd_yyyy hh_mm_ss AM/PM
{2}: Count
{3}: Device ID
File Type Selects the file type (data format).
Test Result EasyEXPERT data format
Compressed Test Result Compressed EasyEXPERT data format
CSV CSV format
XML Spread Sheet XML spread sheet format