User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
4- 22 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Main Screen
Test Results Data Filter
This dialog box appears by clicking Results > Filter > Filter... and is used to specify
the test records listed in the lower area of the EasyEXPERT main screen.
Data records in
S
ave-gr
oup
Check this box to list the test records in Save-group.
Data records in
Delete-g
roup
Check this box to list the test records in Delete-group.
Flag Select or enter a flag in this field to list the test
records with the specified flag.
Setup Name Select or enter a test name in this field to list the test records of the specified name.
Date Specify the date to list the test records within the specified period.
Count Specify the count values to list the tes
t records within
the specified range.
Device ID Select or enter the device ID to list the test records o
f the specified device ID.
Remarks Specify the remarks value to list the test records with
the specified value.
OK Performs filtering, and closes this dialog box.
Cancel Cancels filtering, and closes this dialog box.
Export in My Format
This dialog box appears by clicking Results > Transport Data > Export in My
Format..., and is used to export the test record by performing the style conversion
using the XSLT filter.
My Format Specify the full path name of the XSLT filter
(XML style sheet) u
sed to convert the
style of the test record. The Browse... button opens the Select XML Style Sheet File
dialog box used to select the file.
Export As... Opens the Export As dialog box. Specify the file name and the file type, and export
the t
est reco
rd.
Cancel Cancels data export, and closes this dialog box.