User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

4- 18 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Main Screen
Run Option
This dialog box appears by clicking the Run Option button and is used to set the data
record functions (Auto Record and Auto Export) and the Multi Display function.
This dialog box provides the following GUI.
• Record Test Result Data Automatically
This check box changes the status of the data re
cord functions (Auto Record and
Auto Export). The functions provide four status shown in Table 4-1. Removing
the check sets Auto Export=Auto Record=OFF. And putting the check again
returns the status to
the previous one.
In the checked status, the data record functions can be set to one of three status
except for Auto Export=Auto R
ecord=OFF. To set the functions, use “Test
Results Data Auto Export (page 4-24)”.
In the unchecked status (Auto Export=Auto Record=OFF), the test result data
will not be record
ed. If a measurement is performed in this status, the Save Data
button will appear to the right side of the Run Option button. Clicking the Save
Data button will save the last measurement data as a test result record.
When the automatic data record function is enabled, one test execution result is
stored in one tes
t record. For the classic test, one test result is stored in one test
record. For the application test, all test results taken by executing one
application test are stored in one test record. However, the automatic data export
function using the Text File type exports the file for each test result.
Table 4-1 Record Test Result Data Automatically Ch
eck Box and Data Record Functions
• Allocate Data Display for each test
This check box sets the Multi Display function ON (checked) or OFF. This
function cont
rols the operation of the Data Display window.
OFF Test result data will be always displayed on the singular Data
Display w
indow even if the test setup is changed.
Checked status Unchecked status
Auto Export Auto Record Auto Export Auto Record
ON OFF OFF OFF
ON ON
OFF ON