User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
4- 16 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Main Screen
Show All Append Data Check this function to see all test records created by the
append measurement. In the test record list, S indicates
the test records obtained by a single measurement, and
A indicates the records obtained by an append
measurement.
Transport Data Provides the following ten functions.
Import... Opens the Test Result Import dialog box. Imports the
specified test reco
rd.
Export As Test Result... Opens the Test Result Export dialog box. Exports the
selected test record as
the specified name in the
EasyEXPERT data format.
Export As Compressed
Test Resu
lt... Opens the Compressed Test Result Export dialog box.
Exports the s
elected test record as the specified name
in the compressed EasyEXPERT data format.
Export As CSV... Opens the CSV File Export dialog box. Exports the
selected test record as
the specified name in the CSV
format that can be read by a spread sheet software.
Export As XML Spread
Sheet... Opens the XML Style Sheet Export dialog box.
Exports the s
elected test record as the specified name
in the XML spread sheet format that can be read by a
spread sheet software.
Export in My Format... Opens the “Export in My Format (page 4-22)” dialog
box. Exports the selected test record as the specified
n
a
me in th
e s
t
y
le converted by using the specified
XSLT filter.
Export As Text File... Opens the Text File Export dialog box. Exports the
selected test record as
the specified name in the style
defined on the “Text File Export settings (page 4-77)”
dialog box.
Text File Export Setting... Opens the “Text File Export settings (page 4-77)”
dialog box used to define the style of the test record
exported by
the Export As Text File function.
Folder Export... Opens the “Test Results Data Folder Export (page
4-23)” dialog box used to export the selected multiple
test records to the specified folder.