User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

4- 14 Agilent B1500 User’s Guide, Edition 7
Using EasyEXPERT
Main Screen
Organize Preset Group... Opens the “Organize Preset Group (page 4-33)” dialog
box used to organize the preset group.
Rename You can change the name of the selected test setup.
Duplicate Creates a copy of the selected test setup.
Delete Deletes the selected test setup.
Delete All Deletes all test setups in the present preset group.
Flag Shows the flag, Important (!), Valid (#), or Questionable (
?) set to the record. The
top button sorts the test records by the flag.
While the “Show Deleted Data (page 4-15)” function is
enabled, the list area can
show the test records in Delete-group. For the records, * is set to the column to the
left of the Fl
ag column. The top button sorts the list by *.
Setup Name Shows the test setup name. The top button sorts the test records by name, in
l
exicographi
cal order.
Date Shows the date that the test result is recorded. The top button sorts the test records
b
y date, i
n chronological order.
Count Shows the measurement count shown in the C
ount field.
The top button sorts the
test records by count, in numerical order.
Device ID Shows the string set to the record by using t
he Device ID
field. The top button sorts
the test records by device ID, in lexicographical order.
Remarks Shows the remarks set to the record. The top button sorts the test records by the
rem
arks in the lexicogr
aphic order.
Auto Record OFF This indicator is located at the bottom of the EasyEXPERT main screen and is lit
wh
ile the Auto Record
(automatic data record) function is disabled.
Auto Export ON This indicator is located at the bottom of the EasyEXPERT main screen and is lit
while the Auto Exp
ort (automatic data export) function is enabled.
SMU Zero ON This indicator is located at the bottom of the EasyEXPERT main screen and is lit
while the SMU current of
fset cancel function is enabled.