User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 4- 13
Using EasyEXPERT
Main Screen
Count Displays the number of single measurements executed for the test setup now
opened. Effective for the measurements triggered by both Single and Repeat.
Device ID This entry field is used to enter a string in the test record. The string can data ID,
d
evice ID, te
st ID, or anything you want.
Performing measurement and changing setup do not change
the value in this field.
Change the value if you want.
Save The button saves the present test setup into the present preset
group as a new test
setup of the group.
Recall The button recalls the selected test setup. This means opening and displaying the
meas
urement definition of th
e selected test setup.
My Favorite Setup The test setups you create or modify MUST be saved to My Favorite group (preset
g
roup) to reuse t
hem.
Click the My Favorite Setup button to display the menu that provides the following
functions
. Select the preset group by using the field below the button. The test
setups can be recalled by using the area below the field.
Cancel Closes the menu.
Preset Group Provides the following seven functions.
Add New Preset Group Opens the Add Preset Group dialog box. Creates a new
preset grou
p and saves it as the specified name.
Rename This Preset
Group Open
s the Rename Preset Group dialog box. You can
change the name of the present p
reset group.
Duplicate This Preset
Group Opens
the Duplicate Preset Group dialog box. Creates
a copy of the present pr
eset group and saves it as the
specified name.
Delete This Preset Group You can delete the present preset group.
Import Preset Group... Opens the Preset Group Import dialog box. Imports the
specified preset group
.
Export This Preset
Group... Opens the Preset Gro
up Export dialog box. Exports the
present preset gr
oup as the specified name.