User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 4- 3
Using EasyEXPERT
To start EasyEXPERT, see “Start EasyEXPERT” on page 4-4 and “Workspace
Configurator” on page 4-5.
To perform application test setup, see “Application Test” on page 4-27.
To perform classic test setup, see “Classic Test Definition” on page 5-1.
To perform quick test setup, see “Quick Test” on page 4-29.
To perform measurement, see “Main Screen” on page 4-10.
To display measurement data and perform data analysis, see “Data Display” on page
4-51.
To perform self-test or diagnostics, see “Configuration” on page 4-41.
To perform self-calibration, see “Calibration” on page 4-35.
To control Agilent B2200A/B2201A/E5250A switching matrix connection, see
“Switching Matrix Operation Panel” on page 4-48.
To set the standby channels and the standby mode, see “Standby Channel
Definition” on page 4-50.
To define your application test, see “Application Test Definition” on page 6-1.
NOTE Touch Screen Operation
If you use touch screen operation than mouse, change the font size of menu. Font
size 14 is recommended for the touch screen operation.
Open the Control Panel, select Appearance and Th
emes, and select Display to open
the Display Properties dialog box. Select the Appearance tab, and click the
Advanced button to open the Advanced Appearance dialog box. On the dialog box,
set Item to Menu, and set the Size of Font to 14.