User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 3- 53
Installation
Capacitance Compensation When Using Switching Matrix
To obtain compensation coefficients
Obtain the compensation coefficients as shown below.
1. Select the measurement frequency (Fmeas) used for the capacitance
measurement of a device under test (DUT), and set it to the MFCMU. The
coefficients must be measured at the same frequency.
2. Perform the MFCMU open calibration at the measurement term
inal. Optionally,
perform short calibration if you want.
3. See Table 3-10 and Figure 3-19, and set the MFCMU.
4. Connect the path/cable corresponding to C3H (DATA07) shown in Figure 3-18
to the MFCMU. Then measure and record the R, L, and
C values.
5. Connect the path/cable corresponding to C3L (DATA08
) to the MFCMU. Then
measure and record the R, L, and C values.
6. If you use the connector plate, perform the following procedure.
a. Connect the path/cable corresponding to C2H (DATA05) to the MFCMU.
Then measure and record
the R, L, and C values.
b. Connect the path/cable corresponding to C2L (DATA06) to the MFCMU.
Then measure and record
the R, L, and C values.
Table 3-10 R, L, C Measurement Conditions
Figure 3-19 Compensation Coefficient Measurement T
erminals of Extended Cables
Parameter Frequency Function Terminals
R
1 kHz to 5 MHz
a
a. R, L, C of all coefficients must be measured with the same frequency setting.
− A and B
L SERIES
see note
b
b. For triaxial cable, connect B to F directly, and measure L between A and E.
For coaxial cable, ignore E and F, and connect B to D directly, and measure
L between A and C.
C PARALLEL A and C
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