User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 3- 51
Installation
Capacitance Compensation When Using Switching Matrix
• For E5250A:
The lines DATA05 to DATA08 should be modified fo
r each measurement
environment. See Table 3-9. Do not modify the other lines.
Table 3-9 Compensation Coefficients and Modifica
tions
# E5250A C Compensation coefficient data table
#
# CAUTION : Do not add or delete "REVISION" line and "DATAxx" line.
# Change the value for R,L,C of DATA05,06,07 or 08.
#
REVISION A.03.00
# R [ohm] L [H] C [F]
DATA00 74.65E-3 140.00E-9 58.44E-12 # Frame Path 1
DATA01 75.41E-3 90.00E-9 67.13E-12 # Frame Path 2
DATA02 231.41E-3 450.00E-9 178.85E-12 # Card Path High
DATA03 177.56E-3 390.00E-9 135.45E-12 # Card Path Low
DATA04 100.70E-3 400.00E-9 80.00E-12 # Triax Cable [/m]
DATA05 100.70E-3 400.00E-9 80.00E-12 # User Triax Cbl H [/m]
DATA06 100.70E-3 400.00E-9 80.00E-12 # User Triax Cbl L [/m]
DATA07 114.00E-3 544.00E-9 130.00E-12 # User Coax Cbl H [/m]
DATA08 114.00E-3 544.00E-9 130.00E-12 # User Coax Cbl L [/m]
DATA09 0.00E-3 0.00E-9 1.20E-12 # Stray Capacitance
# END of Data
Compensation
coefficients
Modifications of data file
C2H
(DATA05)
C2L
(D
ATA06)
Fo
r the connector plate, change the R, L, C values in the lines.
The value must
be changed to the R, L, C values of the
C2H (DATA05) path and the C2L (DATA06) path (triaxial
cable with connector plate) s
hown in Figure 3-18.
For Agilent B2220A probe card interface, do not modify the
lines.
C3H
(DA
TA07)
C3L
(D
ATA08)
Ch
ange the R, L, C values in the lines. The value must be
changed to the R
, L, C values of the C3H (DATA07) path and
the C3L (DAT
A08) path shown in Figure 3-18.
For the connector plate, the coaxial cable with positioner will
be the appropriate path.
F
or Agilent B2220A probe card interface, the probe card will
be the appropriate path.