User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 3- 49
Installation
Capacitance Compensation When Using Switching Matrix
In Figure 3-18, C1 (DATA04), C2H (DATA05), C2L (DATA06), C3H (DATA07),
C3L (DATA08) are the compensation coefficients defined
in the compensation data
file. where, CxH is for the path connected to the MFCMU Hc-Hp terminal, and CxL
is for the path connected to the MFCMU Lc-Lp terminal.
When Agilent B2220A probe card interface is used, obtain the coefficients for C3x,
and create your
compensation data file. In this case, probe card will be used for the
C3x path.
When the connector plate is used, obtain the coefficients for C
2x and C3x, and
create your compensation data file. In this case, triaxial cable with connector plate
will be used for the C2x path. And coaxial cable with positioner will be used for the
C3x path.
For obtaining the compensation coefficients and creating the co
mpensation data file,
see “To Create Compensation Data File” on page 3-50.
Figure 3-18 Extension Cables and Compensation Coefficients
Agilent N1300A
+ BNC-T adapters
Agilent B2200A with B2210A or
Agilent B2201A with B2211A or
Agilent E5250A with E5252A
Agilent B1500A/MFCMU
B2210A outputs or
B2211A outputs or
E5252A outputs
Perform open calibration at this plane.
Short calibration is optional.
to CMH
to CML
High
Low
C2H, C3H, DATA05, DATA07: for CMH path
C2L, C3L, DATA06, DATA08: for CML path
Extended triaxial
cables
with connector plate
(C2H, DATA05, need update)
(C2L, DATA06, need update)
Extended coaxial
cables and positioners
(C3H, DATA07, need update)
(C3L, DATA08, need update)
Agilent 16495F/G
Agilent 16494A/B
(C1, DATA04, fixed)
Case 2. Connector plate
Agilent B2220A (C2H, DATA05, need update)
(C2L, DATA06, need update)
Agilent 16494A/C
(C1, DATA04, fixed)
Probe card etc.
(C3H, DATA07, need update)
(C3L, DATA08, need update)
Case 1. Probe card interface
Case 1 is not available
for E5250A.