User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 3- 47
Installation
Capacitance Compensation When Using Switching Matrix
Capacitance Compensation When Using
Switching Matrix
When the capacitance/conductance measurement is performed through Agilent
B2200A/B2201A/E5250A switching matrix, Agilent B1500A measures the
capacitance/ conductance of the path including a DUT (device under test), matrix
switches, extension cables and so on. So, the data measured by the B1500A is far
from the DUT’s capacitance/conductance.
Agilent EasyEXPERT provides the functions used to compensate the data measured
in the environ
ments described in “Required Conditions” on page 3-48. This section
explains how to perform compensation.
• “Required Conditions”
• “To Create Compensation Data File”
NOTE Corrected data by the function is not guaranteed. But typical data (supplemental
data) is as follows.
Capacitance measurement accuracy (typical): ±1 % ±0.5 pF
This typical data is for the following measurement conditions:
Measurement frequency: 1 kHz to 5 MHz
Measurement range: Maximum 1000 pF
Measurement terminal: At the end of Agilent 16494A/B/C cable connected to
th
e switch mo
dule output terminals.
The typical data does not apply to anything extended
from the 16494A/B/C cable.
The conditions described in “Required Conditions” on page 3-48 must be satisfied.