User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 3- 45
Installation
Connecting Measurement Devices
To Measure Low Resistance
When you measure a low resistance, high current flows through the DUT. This high
current increases the measurement error caused by the residual resistance of cables.
To cancel the effect of this resistance, you can use Kelvin connections (4-wire),
which means the force and sense lines are extended separately to the DUT.
Connect the probing needles to the terminals of the connect
or plate by using test
leads or coaxial cables. Following instruction uses the coaxial cables:
1. At end of cable, connect coaxial center conductor to force terminal
of connector
plate, and connect coaxial outer conductor to guard terminal of connector plate.
2. At another end, connect coaxial center conducto
r to tail of the probing needle.
Never connect the outer conductor at this cable end.
Extend the outer conductor as close as possible to the probing needle.
3. Repeat 1 and 2 for the sense terminal of connector plate.
4. Contact the probing needles from force and s
ense terminals as
close as possible
to the DUT.
Example
The following example connection can be used to measure low
resistance. The sense
line is extended to the probing pad, and contacts the force line through the pad, so
the voltage drop due to the residual resistance caused by cables and test leads is
canceled.
This example uses test leads. To reduce the leakage current, use co
axial cables.
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