User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
Agilent B1500 User’s Guide, Edition 7 3- 43
Installation
Connecting Measurement Devices
Using Connector Plate
This section provides the information useful for connecting cables and probing
needles to a connector plate.
• “To Reduce Leakage Current”
• “To Measure Low Resistance”
To Reduce Leakage Current
To reduce the leakage current caused by connection cables, the guard technique is
effective. Connect the probing needles to the terminals of the connector plate by
using coaxial cables as shown below:
1. At end of cable, connect coaxial center conductor to force terminal
of connector
plate, and connect coaxial outer conductor to guard terminal of connector plate.
2. At another end, connect coaxial center conducto
r to tail of the probing needle.
Never connect the outer conductor at this cable end.
Extend the outer conductor as close as possible to the probing needle.
Example
The following example connection can be used to reduce the leakage current.
Extend the outer conductor as close as possible to the probing needle. This also
reduces the induced noise.
WARNING Do not touch the guard terminal with bare hands because you may be shocked
by high voltage. The potential of the guard terminal is equal to the output
voltage.
CAUTION Never connect the guard terminal to any other output, including circuit common,
frame ground, or the terminals of any other unit. Doing so may damage the unit.
3URELQJQHHGOH
&RQWDFWSDG
&RQQHFWRUSODWH
&HQWHUFRQGXFWRU
2XWHUFRQGXFWRU
&RD[LDOFDEOH