User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities
3- 40 Agilent B1500 User’s Guide, Edition 7
Installation
Connecting Measurement Devices
Connecting Measurement Devices
This section describes how to connect device under test (DUT) to the 16442B test
fixture, and how to connect cables to the connector plate.
If you use a wafer prober, see wafer prober manuals.
Note that you must set the module output off when connecting or disconnecting
DUTs. If not
, the DUTs may be damaged.
To set the module output off, press the
Stop key.
This section has the following descriptions:
• “Using Test Fixture”
• “Using Connector Plate”
NOTE Kelvin connection and non-Kelvin connection
To make the Kelvin connection, use both Force and Sense terminals. Connecting the
Force and Sense lines together at the terminal of the DUT (device under test)
minimizes the measurement error caused by the residual resistance of the
connection cables. The Kelvin connection is effective for the low resistance
measurement and the high current measurement.
If you want to simplify the cable connections, open the Sense terminals and use the
Force terminals only. This is the non-Kelvin connection. The Force terminals can be
used to force and measure dc voltage or current.