User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

Agilent B1500 User’s Guide, Edition 7 2- 67
Introduction
Specifications
•CONST
A source unit can be set as a constant voltage or current source depending on the
unit.
• Staircase s
weep measurement mode
Forces swept voltage or current, and measures
DC voltage or current. One
channel can sweep current or voltage while up to ten channels can measure
current or voltage. A second channel can be synchronized with the primary
sweep channel as an additional voltage or current sweep source.
Number of steps: 1 to 1001
Sweep mode: linear or logarithmic (log)
Sweep direction: single or double sweep
Hold time: 0 to 655.35 s, 10 ms resolution
Delay time: 0 to 65.5350 s, 100 μs reso
lution
• Pul
sed sweep measurement mode
Forces pulsed swept voltage or current, and measures DC voltage
or current. A
second channel can be programmed to output a staircase sweep voltage or
current synchronized with the pulsed sweep output.
• Staircase sweep with pulsed bias measurement mode
Forces swept voltage or current, and measures DC
voltage or current. A second
channel can be programmed to output a pulsed bias voltage or current. A third
channel can be synchronized with the primary sweep channel as an additional
voltage or current sweep source.
• Sampling (time domain) measurement mode
Displays the time sampled voltage/current data (by SMU) versus time.
Sampling channels: up to 10
Sampling mode: linear or logarithmic (log)
Sampling points: 1 to 100,001/(number of channels) for linear sampling, 1 to
1 + (number of data for 11 decades) for log sampling
Sampling interval range: 100 μs +
20 μs × (numb
er of channels -1) to 2 ms in
10 μs resolution, or 2 ms to 65.535 s in 1 ms resolution
Hold time, bias hold time: -90 ms to -100 μs
in 100 μs resolution, 0 to 655.35 s
in 10 ms resolution