User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

2- 54 Agilent B1500 User’s Guide, Edition 7
Introduction
Specifications
• SCUU supplemental information
•SMU path
Offset current: < 20 fA
Offset voltage: < 100 μV
at 300 sec
C
losed channel residual resistance: < 200 mΩ
Channel isolation resistance: > 10
15
Ω
•CMU path
• Test signal
• Signal output level additional errors (CMU bias, open load):
± 2 % (direct docking)
± 7 % (indirect docking)
• Signal output level additional errors (SMU bias, open load):
± 5 % (direct docking, ≥ 10
kHz)
± 10 % (in
direct docking, ≥ 10 kHz)
• Outpu
t impedance: 50 Ω, typical
• Signal lev
el monitor additional errors (open load):
± 2 % (CMU bias), direct docking
± 5 % (SMU bias), direct docking
± 7 % (CMU bias), indirect docking
± 10 % (SMU bias), indirect docking
• DC bias function
• DC voltage bias (CMU bias)
Range: 0 to ± 25 V
Resolution: 1 mV
Additional errors (for CMU bias): ± 100 μV (open load)
• DC voltage bias (SMU bias)
Range: 0 to ± 100 V
Resolution: 5 mV