User`s guide
Table Of Contents
- User’s Guide
- 1 Getting Started
- 2 Introduction
- 3 Installation
- 4 Using EasyEXPERT
- 5 Classic Test Definition
- I/V Sweep
- Multi Channel I/V Sweep
- I/V List Sweep
- I/V-t Sampling
- C-V Sweep
- Direct Control
- Function Setup
- Auto Analysis Setup
- Display Setup
- SMU Range Setup Window
- ADC and Integration Time Setup Window
- Advanced Setup Window
- CMU Range Setup Window
- Advanced Setup Window for C-V Sweep
- Switching Matrix Control
- SPGU Control
- SPGU Pulse Setup Window
- Load Z Setup Window
- Pulse Switch Setup Window
- SPGU ALWG Setup Window
- Define ALWG Waveform Window
- 6 Application Test Definition
- 7 Function Details
- I/V Sweep Measurement
- Multi Channel I/V Sweep Measurement
- I/V-t Sampling Measurement
- C-V Sweep Measurement
- SPGU Module
- Sweep Abort Function
- Standby Function
- Bias Hold Function
- Current Offset Cancel
- SMU CMU Unify Unit
- Atto Sense and Switch Unit
- SMU/PG Selector
- SMU Ranging Mode
- SMU Compliance
- SMU Pulse
- SMU Measurement Time
- SMU Filter
- SMU Series Resistor
- Interlock Function
- Auto Power Off Function
- Initial Settings
- 8 Built-in Programming Tool
- 9 If You Have a Problem
- When You Operate B1500A
- When You Perform Measurement
- Measurement Takes More Time than Specified
- Noise Affects the Measured Values
- Voltage Measurement Error is Large
- SMU Oscillates for High-Frequency Device Measurements
- SMU Oscillates for Negative Resistance Measurements
- Large Current Causes High Temperature (Thermal Drift)
- Measurement Damages the Device under Test
- Leaving Connections Damages Devices after Measurement
- Unexpected Sampling Measurement Data is Returned
- MFCMU Causes Unbalance Condition
- Before Shipping to Service Center
- Data Backup and Recovery
- B1500A System Recovery
- Updating EasyEXPERT
- Error Codes
- 10 Application Library and Utilities

2- 52 Agilent B1500 User’s Guide, Edition 7
Introduction
Specifications
Table 2-28 Example of calculated C/G measurement accuracy
Frequency
Measured
Capacitance
C Accuracy
a
a. The calculation examples are specified under the conditions Dx = 0.1, 1 PLC integration time,
30 mVrms test signal level, and at four-terminal pair port of MFCMU.
Measured
Conductanc
e
G Accuracy
a
5 MHz 1 pF ± 0.61 % 3 μS ± 192 nS
10 pF ± 0.32 % 31 μS ± 990 nS
100 pF ± 0.
29 % 314 μS ± 9 μS
1 nF ± 0.32 % 3 mS ± 99 μS
1 MHz 1 p
F ± 0.26 % 628 nS ± 16 nS
10
pF ± 0.11 % 6 μS ± 71 nS
100 pF ± 0.10 % 63 μS ± 624 nS
1 nF ± 0.
10 % 628 μS ± 7 μS
100 kHz 10 pF ± 0.
18 % 628 nS ± 11 nS
100 pF ± 0.11 % 6 μS ± 66 nS
1 nF ± 0.10 % 63 μS ± 61
9 nS
10 nF ± 0.
10 % 628 μS ± 7 μS
10 kHz 100 pF ± 0.18 % 628 nS ± 11 n
S
1 nF ± 0.11 % 6 μS ± 66 nS
10 nF ± 0.10 % 63 μS ± 61
9 nS
100 nF ± 0.10 % 628 μS ± 7 μS
1 kHz 100 pF ± 0.
92 % 63 nS ± 6 nS
1 nF ± 0.18
% 628 nS ± 11 nS
10 nF ± 0.11 % 6 μS ± 66 nS
100 nF ± 0.10 % 63 μS ± 619 nS