User`s guide

Power Tests Performance Tests
Agilent 81600B Tunable Laser Source Family, Fourth Edition 99
Power Flatness versus Wavelength
For definition, see “Power flatness versus wavelength” on page 42.
Measurement Principle
At a fixed power level, the wavelength is tuned over a given wavelength
span. At each wavelength, the power is measured. Ideally, all power
levels would be identical. Any deviation is expressed as power flatness.
Figure 28 Power Flatness.
At the start of the test the TLS is set:
To its lowest specified wavelength,
To the highest power the TLS can deliver over the full wavelength range,
Such that any modulation is off.
The wavelength is increased in 5 nm increments and the difference
between the measured and the displayed power is recorded.
At the end of the test, the TLS is set to its maximum specified wavelength.
Test Procedure - Low SSE output
This test procedure is applicable to the:
81600B #140, #142 To avoid conflicts with water absorption lines, the
power flatness measurement begins at 1420.2 nm.
NOTE
Agilent 81600B #200 (Output 1, Low SSE)
Agilent 81600B #160 (Output 1, Low SSE)
Agilent 81600B #150 (Output 1, Low SSE)
Agilent 81600B #140 (Output 1, Low SSE)
Agilent 81600B #130 (Output 1, Low SSE)