Agilent Technologies 8935 Series E6380A CDMA Cellular/PCS Base Station Test Set Assembly Level Repair Firmware Version B.03.
Notice Information contained in this document is subject to change without notice. All Rights Reserved. Reproduction, adaptation, or translation without prior written permission is prohibited, except as allowed under the copyright laws. This material may be reproduced by or for the U.S. Government pursuant to the Copyright License under the clause at DFARS 52.227-7013 (APR 1988).
Contents 1. General Information Manufacturer's Declaration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Safety Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . SAFETY SYMBOLS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Safety Considerations for this Instrument . . . . . . . . . . . . . . . . . . . . . . .
Contents AF, RF, & CDMA Diagnostics (Step 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68 AF Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .68 RF Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .70 CDMA Diagnostics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents Removing the External and Internal Covers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . External Covers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Internal Covers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Top Internal Covers. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents A Word About Storing Calibration Factors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .162 Running the Periodic, IQ, or Eb/No Calibration Programs . . . . . . . . . . . . . . . . . . . . . . . . . . .163 Running the System Power Calibration Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .164 Periodic Calibration Menu Descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents AF Generator DC Level Accuracy Performance Test 9. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . AF Generator Residual Distortion Performance Test 10. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Procedure. . . . . . . . . . . . .
Contents Procedure 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .220 CDMA Generator Amplitude Level Accuracy Performance Test 25 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .221 Setup 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .221 Procedure 1 . . . . . . . . . . . . . . .
Contents AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . AF Analyzer DC Level Accuracy Performance Test 15 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents CDMA Signal Analysis. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .299 Power Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .299 CDMA Generator Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .302 Data Generation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1 General Information This chapter contains generic information about the product, safety, warranty, sales and service offices, power-cables, and other information.
General Information Manufacturer's Declaration Manufacturer's Declaration This statement is provided to comply with the requirements of the German Sound Emission Directive, from 18 January 1991. This product has the following sound pressure emission specification: • sound pressure Lp <70 dB(A) • at the operator position • under normal operation • according to ISO 7779:1988/EN 27779:1991 (Type Test).
General Information Safety Considerations Safety Considerations GENERAL This product and related documentation must be reviewed for familiarization with safety markings and instructions before operation. This product has been designed and tested in accordance with IEC Publication 61010-1+A1+A2:1992 Safety Requirements for Electrical Equipment for Measurement, Control and Laboratory Use and has been supplied in a safe condition.
General Information Safety Considerations Safety Considerations for this Instrument WARNING Whenever it is likely that the protection has been impaired, the instrument must be made inoperative and be secured against any unintended operation. If this instrument is to be energized via an autotransformer (for voltage reduction), make sure the common terminal is connected to the earth terminal of the power source.
General Information Safety Considerations WARNING ! This product is a Safety Class I instrument (provided with a protective earthing ground incorporated in the power cord). The mains plug shall only be inserted in a socket outlet provided with a protective earth contact. Any interruption of the protective conductor inside or outside of the product is likely to make the product dangerous. Intentional interruption is prohibited.
General Information Safety Considerations WARNING Always use the three-prong ac power cord supplied with this product. Failure to ensure adequate earth grounding by not using this cord may cause personal injury and/or product damage. This product is designed for use in Installation Category II and Pollution Degree 3 per IEC 61010 and IEC 60664 respectively. This product has autoranging line voltage input, be sure the supply voltage is within the specified range.
General Information Product Markings Product Markings The CE mark shows that the product complies with all relevant European legal Directives (if accompanied by a year, it signifies when the design was proven). The CSA mark is a registered trademark of the Canadian Standards Association.
General Information Certification Certification Agilent Technologies certifies that this product met its published specifications at the time of shipment from the factory. Agilent further certifies that its calibration measurements are traceable to the United States National Institute of Standards and Technology, to the extent allowed by the Institute’s calibration facility, and to the calibration facilities of other International Standards Organization members.
General Information Certification DECLARATION OF CONFORMITY according to ISO/IEC Guide 22 and EN 45014 Manufacturer’s Name: Agilent Technologies Manufacturer’s Address: Spokane Site 24001 E.
General Information Agilent Technolgies Warranty Statement for Commercial Products Agilent Technolgies Warranty Statement for Commercial Products E6380A CDMA/Cellular PCS Base Station Test Set Duration of 1. Agilent warrants Agilent hardware, accessories and supplies against Warranty: 1 Year defects in materials and workmanship for the period specified above.
General Information Agilent Technolgies Warranty Statement for Commercial Products 7. TO THE EXTENT ALLOWED BY LOCAL LAW, THE ABOVE WARRANTIES ARE EXCLUSIVE AND NO OTHER WARRANTY OR CONDITION, WHETHER WRITTEN OR ORAL IS EXPRESSED OR IMPLIED AND Agilent SPECIFICALLY DISCLAIMS ANY IMPLIED WARRANTIES OR CONDITIONS OR MERCHANTABILITY, SATISFACTORY QUALITY, AND FITNESS FOR A PARTICULAR PURPOSE. 8.
General Information Assistance Assistance Product maintenance agreements and other customer assistance agreements are available for Agilent Technologies products. For any assistance, contact your nearest Agilent Technologies Sales and Service Office. By internet, phone, or fax, get assistance with all your test and measurement needs. Table 1-1 Contacting Agilent Online assistance: www.agilent.
General Information Power Cables Power Cables Table 1-2 Power Cables Plug Type Earth Ground Line Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions Straight/Straight Straight/90° 8120-1689 8120-1692 79 inches, mint gray 79 inches, mint gray Neutral Used in the following locations Afghanistan, Albania, Algeria, Angola, Armenia, Austria, Azerbaijan, Azores Bangladesh, Belgium, Benin, Bolivia, Boznia-Herzegovina, Bulgaria, Burkina Faso, Burma, Burundi, Byelarus Cameroon
General Information Power Cables Table 1-2 Power Cables Plug Type Earth Ground Line Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions Straight/Straight Straight/90° 8120-1689 8120-1692 79 inches, mint gray 79 inches, mint gray Neutral Tajikistan, Thailand, Togo, Tunisia, Turkey, Turkmenistan USSR, Ukraine, Uzbekistan Western Africa, Western Sahara Yugoslavia Zaire Table 1-3 Power Cables Plug Type Plug Descriptions male/female Agilent Part # (cable & plug) Cable
General Information Power Cables Table 1-5 Power Cables Plug Type 125V Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions Straight/Straight Straight/90 Straight/Straight 8120-1378 8120-1521 8120-1751 90 inches, jade gray 90 inches, jade gray 90 inches, jade gray Earth Ground Neutral Line Used in the following locations American Samoa Bahamas, Barbados, Belize, Bermuda, Brazil, Caicos, Cambodia, Canada, Cayman Islands, Columbia, Costa Rica, Cuba Dominican Republic Ecu
General Information Power Cables Table 1-6 Power Cables Plug Type JIS C 8303, 100 V Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions Straight/Straight Straight/90° 8120-4753 8120-4754 90 inches, dark gray 90 inches, dark gray Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions 90° /STRAIGHT 8120-2956 8120-2957 8120-3997 79 inches, gray 79 inches, gray 79 inches, gray Earth Ground Neutral Line Used in the following locations Japan Ta
General Information Power Cables Table 1-8 Power Cables Plug Type Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions Lesotho Malawi South-West Africa (Namibia), Swaziland Zambia, Zimbabwe Table 1-9 Power Cables Plug Type (Male) Earth Ground Line Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions 90°/Straight 8120-1351 8120-1703 90 inches, mint gray 90 inches, mint gray 90°/90° Neutral Used in the following locations Bahrain, British
General Information Power Cables Table 1-10 Power Cables Plug Type Earth Ground Plug Descriptions male/female Agilent Part # (cable & plug) Cable Descriptions Straight/Straight Straight/90° 8120-1369 8120-0696 79 inches, gray 80 inches, gray Neutral Line Used in the following locations Argentina, Australia China (People’s Republic) New Zealand Papua New Guinea Uruguay Western Samoa Table 1-11 Power Cables Plug Type Earth Ground Line Neutral Plug Descriptions male/female Agilent Part # (ca
General Information Power Cables ATTENTION Static Sensitive Devices This instrument was constructed in an ESD (electro-static discharge) protected environment. This is because most of the semiconductor devices used in this instrument are susceptible to damage by static discharge. Depending on the magnitude of the charge, device substrates can be punctured or destroyed by contact or mere proximity of a static charge.
General Information Documentation Documentation Conventions Used in This Manual The following conventions are used throughout this manual to help clarify instructions and reduce unnecessary text: • “Test Set” refers to the Agilent 8935 CDMA Cellular/PCS Base Station Test Set. • Test Set keys are indicated like this: Preset • Test Set screen information, such as a measurement result or an error message, is shown like this: TX Channel Power -1.3 dBm NOTE HP-IB and GPIB are one and the same.
General Information Documentation Chapter 6 , “Replaceable Parts,” on page 135. This chapter contains the replaceable assembly and component information for the Test Set. Use the illustrations in this chapter to identify the replaceable parts and the “Parts List” on page 150 for part numbers. Chapter 7 , “Periodic Adjustments,” on page 157. This chapter contains the periodic adjustment procedures for the Test Set. Chapter 8 , “Performance Tests,” on page 173.
General Information Documentation Which Document is Required? The following documents are part of the Agilent 8935 document set. Use the table to help you decide which document you need. Table 1-12 Document Navigation Document Part Number Usage CDMA Application Guide E6380-90016 Use this manual for basic CDMA measurements and for getting started with the Test Set. AMPS Application Guide E6380-90017 Use this manual for making AMPS base station measurements.
General Information Trademark Acknowledgements Trademark Acknowledgements Hewlett-Packard and HP are registered trademarks of Hewlett-Packard Company. Microsoft‚ Windows, and MS-DOS‚ are registered trademarks of Microsoft Corporation. ProComm‚ is a registered trademark of DataStorm Technologies, Inc. HyperTerminal is a registered trademark of Hilgraeve, Incorporated. Pentium is a registered trademark of Intel Corporation.
General Information Trademark Acknowledgements 34 Chapter 1
2 Product Information This chapter contains general information about the Test Set and how to service it.
Product Information Instrument Description Instrument Description The Agilent 8935 CDMA Cellular/PCS Base Station Test Set is a one-box tool designed to meet the needs of installation teams, service providers, and network manufacturers when installing, testing, and maintaining CDMA base stations at both the cellular and PCS frequency bands. It also can be used to test AMPS base stations.
Product Information Instrument Description The user interface features pull down menus, one-key measurement execution, and fast measurement speed. Measurement data can be output to a printer or a PCMCIA memory card. The Test Set’s firmware is user upgradeable with a PCMCIA card to flash memory. Thus, new features and capabilities can be added without returning the unit to the service center.
Product Information Instrument Description Instrument Assemblies Table 2-1 and Figure 2-2 on page 39 describe the assemblies of the Agilent 8935 CDMA Cellular/PCS Base Station Test Set. Table 2-1 Chapter 1 , “General Information,” on page 11.
Product Information Instrument Description Table 2-1 Chapter 1 , “General Information,” on page 11.
ANT IN Input Attenuator OPP Receiver & Demod IF (FM, AM, SSB) A2A21 Downconverter A2A115 Block Speaker (Bandpass Filters) (Distortion) Volume SCOPE MONITOR OUT A2A40 A2A80 AUDIO IN Power Detector RF IN/OUT Measurement (Scope) (Voltmeter) (Counter) 100 W Attenuator A2A200 RF Analyzer DUPLEX OUT RPP Output Attenuator EXT AC Input RF I/O A2A130 Signaling Analyzer A2A32 LO/IF Conversion A2A120 Regulators A3A1 Power Supplies EXT SCOPE TRIGGER IN A2A33 Audio Analyzer Splitter Receive DS
Product Information Upgrades Upgrades Hardware and Firmware Enhancements The hardware and firmware for this Test Set are being enhanced on a continuous basis. Hardware can be upgraded by ordering a specific retrofit kit. Firmware is upgraded by downloading new software or installing new PROMs. The firmware for this Test Set has gone through several revisions to improve performance and fix problems.
Product Information Upgrades 4. Follow the instructions on the screen. 5. After the firmware is downloaded, be sure to cycle the Test Set’s power off-and-on to complete this procedure. Load the DSP Firmware The following procedure loads the digital signal processor firmware. 1. Press the Preset key. 2. Insert the E6380-10002 memory card into the Test Set. 3. Press the Menu key. 4. Set the Select Procedure Location: field to Card. 5. Set the Select Procedure Filename field to DLFIRM. 6.
Product Information Upgrades 14.Enter the firmware code word: This code word is unit specific and can only be used with the unit for which it was ordered. If you have more than one test set to upgrade you must associate the upgrade kit with the serial number of the test set for which it was ordered. 15.Once the codeword is entered the program will prompt you to cycle power to enable the CDMA 2000 feature.
Product Information Upgrades Figure 2-3 SERVICE Screen Title Bar SERVICE Screen SERVICE Voltage V Frequency kHz Voltmeter Connection RFIO_DIAG_0 Counter Connection AUD1_COUNT Gate Time 50.0 ms Latch sgnl_revision value 19950310 hex RAM Initialize Clear all RAM and restart service3.eps 5. Select the Latch field. 6. Move the cursor to rx_dsp_revision under the Choices: menu and press the knob. 7. Read the Value data field. This is the RX DSP firmware revision level.
Product Information Repair Process Repair Process WARNING SHOCK HAZARD. NO OPERATOR SERVICEABLE PARTS INSIDE METALLIC ENCLOSURE. SERVICE BY QUALIFIED PERSONNEL ONLY. Repairing the Test Set consists of the following steps: 1. Isolate the problem to a faulty assembly within the Test Set. Refer to Chapter 3 , “Troubleshooting,” on page 47. 2. Replace the faulty assembly. 3. Calibrate the Test System by regenerating calibration data, see Chapter 7 , “Periodic Adjustments,” on page 157. 4.
Product Information Manuals Manuals Operation and servicing the Agilent 8935 CDMA Cellular/PCS Base Station Test Set are discussed in the following manuals: • CDMA Application Guide E6380-90016 This manual explains how to use the Agilent 8935 Test Set to manually test a CDMA Base Station. This document presents a step-by-step approach to CDMA base station testing using the Test Set, including what you need to know before you can start testing.
Product Information Service Information Service Information Factory Support Troubleshooting assistance is available by e-mail (electronic mail), website, or telephone: • Internet e-mail address support_wsp@agilent.com • Agilent Support Website Use the URL: http://www.agilent.com, select Products & Services, then select Test & Measurement and finally select Technical Support. A wide range of documentation, hardware drivers and support information is available, including a part number search engine. • U.S.A.
3 Troubleshooting This chapter explains how to isolate a problem to the defective assembly. Troubleshooting uses the Test Set’s built-in diagnostics. If diagnostics can’t identify the faulty assembly, supplementary information in the form of manual troubleshooting procedures is provided.
Troubleshooting How to Troubleshoot the Test Set How to Troubleshoot the Test Set Document the result of each step in case you need to contact Agilent Technologies for service assistance. General troubleshooting steps are illustrated in Figure 3-2 on page 49. NOTE Periodic Adjustment Interval The calibration programs Periodic Calibration, IQ Calibration and Eb/No Calibration should be performed after the replacement of any assembly referred to in Table 7-1 on page 159, or at least every 24 months.
Troubleshooting How to Troubleshoot the Test Set Figure 3-2 Agilent 8935 Test Set Troubleshooting Flowchart BEGIN Step 1. Power-up the Test Set to run self diagnostics. Did you hear the fan running? Check for faulty: 1. fan, 2. power supply 3. assembly pulling line voltage low. See "If the Test Set Fails to Power-up" on page 52. NO YES YES NO Perform "Product Verification" on page 90. Turn off Test Set and remove external and internal covers.
Troubleshooting Self-Test Diagnostics (Step 1) Self-Test Diagnostics (Step 1) On power-up the Test Set runs a self-test diagnostic test. Most of the Test Set’s digital functions are tested. The outcome of the test appears on the display (if operating) and on four LEDs viewable through an access hole on the top internal cover. The self-test diagnostic can be run three ways: 1. The test runs automatically when the Test Set is turned on.
Troubleshooting Self-Test Diagnostics (Step 1) To Start Troubleshooting 1. Turn on the Test Set to automatically run the self test diagnostics. • If the Test Set does not power up, see “If the Test Set Fails to Power-up” on page 52. • If all self-test diagnostics pass, and the front-panel keys and knob work, you can assume that the digital control assemblies work. 2. After power-up, the top line of the Test Set’s display should show copyright information and the firmware revision code.
Troubleshooting Self-Test Diagnostics (Step 1) If the Test Set Fails to Power-up 1. Is the Test Set plugged in? Listen for fan operation. If you don’t hear it, check the line fuse (Figure 3-3) and the GFI reset button, see “Reset and GFI-Test Buttons (older units with GFI circuit)” on page 98. Figure 3-3 Fuse Line Fuse (A3F1) Spare Fuse (A3F1) fuse1.eps 2. If there is no image on the display, remove the Test Set’s covers and check the power supply LEDs: +5V, −12V, +12V (see Figure 3-4).
Troubleshooting Self-Test Diagnostics (Step 1) Figure 3-4 Power Supply LEDs 3. Check the LEDs on the A2A31 Controller assembly, see Figure 3-5 on page 53. The LEDs should all light up immediately on power-up, and then go off several seconds after a beep is heard. If the LEDs do not light when the Test Set is powered-up, either the Controller or the Memory/SBRC (A2A30) assembly is faulty.
Troubleshooting Self-Test Diagnostics (Step 1) Figure 3-6 VIDEO OUT Signal 500mV/div. 500µs/div. Reading Front Panel or GPIB Codes Failure codes are listed in the table below. If more than one failure occurs, the failure code will be the sum of the individual failure codes. The nature of the failure and the assembly most-likely at fault is also listed.
Troubleshooting Self-Test Diagnostics (Step 1) Table 3-1 Return Values for Self-Test Diagnostic Failures Detected Failure Failed Assembly Returned Error Code Hexadecimal (displayed) Decimal (GPIB) Microprocessor A2A31 Controller 0002 2 ROM A2A31 Controller 0004 4 RAM A2A30 Memory/SBRC 0008 8 RAM A2A30 Memory/SBRC 0010 16 Timer A2A31 Controller 0020 32 Real-Time Clock A2A30 Memory 0040 64 Keyboard (stuck key) A1A2 Keypad1 0080 128 RS-232 I/O A2A30 Memory/SBRC 0100 256 Se
Troubleshooting Self-Test Diagnostics (Step 1) Reading LED Codes When the self-test diagnostic reports a failure, more information about the failure may be available inside the Test Set. This additional information is output to the four LEDs on the top of the A2A31 Controller assembly. The failure codes are sent out as code sequences. Figure 3-7 on page 58 and the tables following it document some of the more useful code sequences.
Troubleshooting Self-Test Diagnostics (Step 1) The pattern generated by the LEDs can be interpreted as a binary-weighting code. The LED (labeled 0) is the least-significant bit (see Figure 3-7 on page 58). For example if the LEDs blinking pattern is Off, On, On, On (reading left-to-right or LEDs “3 2 1 0”), the binary number is 0111 or decimal 7. The error codes shown in Table 3-1 on page 55 are weighted by the binary value. The weighted value for this example is decimal 27 = 128 or hexadecimal 80.
Troubleshooting Self-Test Diagnostics (Step 1) Figure 3-7 Reading the Self-Test Diagnostic. The Internal LEDs 1. Remove the Test Set’s external cover. LEDs 32 10 2. Turn power on. 3. Read the LED sequence (see illustration on right) and compare with the patterns below. NOTE For multiple failures, the failure patterns described below will repeat for all failures detected.
Troubleshooting Self-Test Diagnostics (Step 1) Figure 3-8 First LED Patterns If the first LED pattern displayed is... 3 2 1 Then the failure is... 0 ROM Checksum (See note 1.) LED Legend = off = rapid blink RAM (See note 2.) = steady on or slow blink Microprocessor RAM (See note 3.) Timer Real-Time Clock Keyboard (stuck key or faulty key-down detector) Control Interface, A2A70 (See note 4.
Troubleshooting Self-Test Diagnostics (Step 1) Figure 3-9 Non-blinking LED Codes For Serial Bus Communication Failure If the second and third LED patterns displayed are.... 3 2 1 0 3 2 Then the failure is...
Troubleshooting Self-Test Diagnostics (Step 1) Figure 3-10 Non-Blinking LED Codes for Miscellaneous Hardware Failure Then the failure is...
Troubleshooting Functional Diagnostics (Step 2) Functional Diagnostics (Step 2) The Functional Diagnostics (of the SERVICE MENU, shown in Figure 3-11 on page 65) check whether or not major portions of the Test Set are functioning. They may pinpoint faults in the circuitry to the faulty assembly, or they may direct the use of any or all of the AF, RF, CDMA diagnostics to more extensively test the circuitry. Accessing the Diagnostic Tests CAUTION A fifteen minute warm up is required.
Troubleshooting Functional Diagnostics (Step 2) For descriptions of the diagnostic options, refer to: • “Functional Diagnostics Menu” on page 66. • “AF Diagnostics” on page 68. • “RF Diagnostics” on page 70. • “CDMA Diagnostics” on page 72. Define Test Conditions 1. On the SOFTWARE MENU screen (see Figure 3-11 on page 65), select Execution Cond to access the TESTS (Execution Conditions) screen. 2. Set up the Output Results To: field. Select: • Crt to view measurements only on the display.
Troubleshooting Functional Diagnostics (Step 2) Configuring a Printer Only perform the following steps if you want to print test results to a printer. 1. If you are not already at the SOFTWARE MENU screen, press the Menu key. 2. Under SET UP TEST SET:, select Print to access the “TESTS (Printer Setup)” screen. 3. Under PRINT SETUP:, select Model: and the printer of your choice. 4. Set the Printer Port: for the side-panel connector your printer is connected to (Parallel 15, Serial 9, or GPIB).
Troubleshooting Functional Diagnostics (Step 2) Figure 3-11 SERVICE4 Program Screens SOFTWARE MENU Screen SOFTWARE MENU 1 Run Test LOAD TEST PROCEDURE: Select Procedure Location: ROM Select Procedure Filename: SERVICE4 Functional Diagnostics Screen 2 Continue 1 Library: [NO LIB] Program: ROM Description: Launches disgnostic and calibration programs. 4 Help Move the pointer to the desired test using the knob then press the knob. Press Serv Menu to go to the Service Menu, Exit key to abort.
Troubleshooting Functional Diagnostics (Step 2) Functional Diagnostics Menu To run the functional diagnostics, see “Accessing the Diagnostic Tests” on page 62. NOTE The diagnostics are intended to help in locating the source of catastrophic failures. Occasionally, a test will fail with the test results being only slightly out of limits. Such failures do not necessarily indicate that the Test Set is operating outside of its published specifications or that it is otherwise faulty.
Troubleshooting Functional Diagnostics (Step 2) Figure 3-12 Functional Diagnostics Screen SERVICE MENU Screen 1 SERVICE MENU Move pointer to desired program using the knob then press the knob. Press Help for information on the tests. Press Exit to abort. => Functional Diagnostics AF Diagnostics RF Diagnostics CDMA Diagnostics Edit RF Diagnostic Limits Periodic Calibration IQ Calibration Eb/No Calibration Move the pointer to the desired test using the knob then press the knob.
Troubleshooting AF, RF, & CDMA Diagnostics (Step 3) AF, RF, & CDMA Diagnostics (Step 3) NOTE The diagnostics are intended to help in locating the source of catastrophic failures. Occasionally, a test will fail with the test results being only slightly out of limits. Such failures do not necessarily indicate that the Test Set is operating outside of its published specifications or that it is otherwise faulty. Further testing (such as running the performance tests) will be required in such cases.
Troubleshooting AF, RF, & CDMA Diagnostics (Step 3) Figure 3-13 AF Diagnostics Screen SERVICE MENU Screen 1 SERVICE MENU Move pointer to desired program using the knob then press the knob. Press Help for information on the tests. Press Exit to abort. => Functional Diagnostics AF Diagnostics RF Diagnostics CDMA Diagnostics Edit RF Diagnostic Limits Periodic Calibration IQ Calibration Eb/No Calibration Move the pointer to the desired test using the knob then press the knob.
Troubleshooting AF, RF, & CDMA Diagnostics (Step 3) RF Diagnostics This program tests the RF functions of the following assemblies: • A2A115 Downconverter • A2A24 RF Output • A2A25 Signal Generator Synthesizer • A2A23 Reference • A2A21 Receiver • A2A22 Receiver Synthesizer • A2A20 Spectrum Analyzer • A2A130 RF I/O • A2A110 Upconverter Some tests require cabling before the RF Diagnostics can be run; but all tests can be run in a loop mode without further intervention.
Troubleshooting AF, RF, & CDMA Diagnostics (Step 3) Figure 3-14 RF Diagnostics Screen SERVICE MENU Screen 1 SERVICE MENU Move pointer to desired program using the knob then press the knob. Press Help for information on the tests. Press Exit to abort. => Functional Diagnostics AF Diagnostics RF Diagnostics CDMA Diagnostics Edit RF Diagnostic Limits Periodic Calibration IQ Calibration Eb/No Calibration Move the pointer to the desired test using the knob then press the knob.
Troubleshooting AF, RF, & CDMA Diagnostics (Step 3) CDMA Diagnostics This program tests the local oscillators and the power supplies of the following assemblies: • A2A120 LO IF/IQ Modulator - LO IF portion only • A2A100 CDMA Generator Reference To run CDMA diagnostics, see “CDMA Diagnostics” on page 72. NOTE Before ordering a replacement assembly... Before ordering an assembly based on the results of the diagnostics, you should verify the diagnostics by other means if possible.
Troubleshooting Frequently Encountered Diagnostic Messages Frequently Encountered Diagnostic Messages Warning/Error Messages Error messages that appear on the second line of the Test Set’s display frequently occur while any of the SERVICE4 program diagnostic tests are running. The most complete and general list of error messages is in the “Error Messages” chapter of the Test Set’s Reference Guide.
Troubleshooting Frequently Encountered Diagnostic Messages Time-outs Certain failures may cause a frequency or voltage reading to time out, that is, the time required for the measurement will be unreasonably long. If a timeout occurs, measurement execution will stop and an error message will be displayed. • If frequency or voltage readings have been successfully made before the timeout, the assembly currently being tested or a multiplexer on the A2A33 Measurement assembly may be at fault.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Manual Troubleshooting Procedures (Step 4) If you are not sure a problem exists, you should attempt to duplicate the suspected problem. This is especially important if the Test Set is being used in a new application where misapplication, or incorrect operation of the Test Set may be involved.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Table 3-2 Relating Assemblies to Troubleshooting Aids Ref. Designator Assembly Name SERVICE4 Program Diagnostic Test: Sub-Test Performance Periodic Cal.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Table 3-2 Relating Assemblies to Troubleshooting Aids Ref. Designator Assembly Name SERVICE4 Program Diagnostic Test: Sub-Test Performance Periodic Cal.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Verify Test Set’s Reference Path Out-of-Lock (OOL) LEDs Out-of-lock (OOL) LEDs light when a phase-locked loop inside an assembly is failing. The Signal Generator Synthesizer, A2A25, and the Receiver Synthesizer, A2A22, assemblies have these LEDs mounted close to the top of the modules. The location of each LED is labeled on the assembly.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Figure 3-17 Simplified Reference Path Block Diagram Receiver Synth CDMA Reference Generator Reference EXT REF IN 10 MHz REF OUT Signal Generator Synthesizer If the 10 MHz signal is present, then this verifies the reference path through the CDMA Generator Reference and the Reference (A2A22) assemblies. NOTE There are other functions on these assemblies that are NOT verified. CDMA Generator Reference (A2A100) Assembly Verification 1.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Reference, A2A23, Verification 1. Turn the Test Set off and re-install the Reference assembly. 2. Use screwdrivers to remove the Receiver Synthesizer (A2A22) assembly. 3. Turn the Test Set on and verify that a 1 MHz signal of approximately −1 dBm is present on pin 3 of J21. This is the reference signal from the Reference assembly. 4. If the 1 MHz signal is not present, then the Reference assembly is probably faulty.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Swapping Known-Good Assemblies Most swapped assemblies which use calibration data will operate well enough with the original assembly’s calibration data to troubleshoot and to run the diagnostics; do not expect the Test Set to meet its specifications. Some assemblies may appear to fail because of incorrect calibration data. It is also important to keep track of the original assemblies in the Test Set.
Troubleshooting Manual Troubleshooting Procedures (Step 4) The assemblies that require a periodic calibration procedure are: • A2A100 CDMA Generator Reference • A2A130 RF Input/Output • A2A120 LO IF/IQ Modulator • A2A200 100W Attenuator • A2A34 Data Buffer • A2A80 Audio Analyzer 1 • A2A40 Audio Analyzer 2 • A2A33 Measurement • A2A44 Modulation Distribution Generally, these assemblies can be swapped without an immediate need of recalibration.
Troubleshooting Manual Troubleshooting Procedures (Step 4) Figure 3-18 ANT IN Isolating the RF Analyzer Input Attenuator OPP Down Conversion Receiver & IF Receiver Synthesizer Demod (FM, AM, SSB) Spectrum Analyzer Power Detector RF IN/OUT 100 W Attenuator Splitter RF Analyzer DUPLEX OUT RPP Output Attenuator Reference RF I/O FROM RF SOURCE To isolate an RF analyzer problem: 1. On the Test Set: a. Press Preset. b. Press the Inst Config to access the INSTRUMENT CONFIGURE screen.
Troubleshooting Manual Troubleshooting Procedures (Step 4) 3. Set the RF signal generator’s frequency to 100, then 500, 900, and 1800 MHz. For each frequency reset the Tune Freq to that frequency. The Test Set’s measurements should read as follows: a. TX Power should read approximately 0.001 W for each frequency. b. Frequency should read 100, 500, 900, and 1800 MHz respectively. c. Press the Spec Anl key to access the analog spectrum analyzer. Observe the level and frequency of the signal.
Troubleshooting Manual Troubleshooting Procedures (Step 4) To isolate the RF Source: 1. On the Test Set: a. Press Preset. b. Press the Inst Config key to access the INSTRUMENT CONFIGURE screen. • Set the RF Display field to Freq. • Set the RF Offset field to Off. c. Press the RF Gen key (to go to the analog RF GENERATOR screen). d. Set RF Gen Freq to 1800 MHz. e. Set Amplitude to 0 dBm. f. Set Output Port to Dupl. 2. On the external RF modulation analyzer or spectrum analyzer: a.
Troubleshooting Service Screen Service Screen A large number of latch and DAC settings used throughout the Test Set can also be read and/or set to alter standard operation. The Service screen uses the internal voltmeter and frequency counter functions to monitor specific nodes in most assemblies.
Troubleshooting Service Screen 3. Rotate the knob and select SERVICE. The SERVICE screen appears. For field descriptions, see “Field Names and Descriptions” on page 87. Field Names and Descriptions Voltmeter Connection This field selects the desired circuit node for voltage measurements. To change the voltmeter connection, use the knob to select the Voltmeter Connection field. A Choices menu will appear. Move the cursor to the desired circuit node in the list and push the cursor control knob.
Troubleshooting Service Screen Latch This field is used to manually select the circuit latches that control switch, DAC, and gain settings within the Test Set. The value of the selected latch is displayed and changed in the Value field. Some settings are read-only. To set a switch, DAC, or gain setting: 1. Use the knob to select the Latch field. A Choices menu will appear. 2. Move the cursor to the desired latch name and press the knob to select it. 3. Use the knob to select the Value field.
Troubleshooting Service Screen The first part of the names in the Choices menu relates to the assembly where the switch, DAC, or gain setting is located. Some latch names are not listed here.
Troubleshooting Product Verification Product Verification This section provides steps for verifying the Test Set’s operation after a repair. Although in most cases this will be sufficient, this does not verify the ability of the instruments to meet CDMA Cellular/PCS Base Station specifications. Only by performing all of the Performance Tests in Chapter 8 , “Performance Tests,” on page 173 can you verify the instrument’s performance. The following steps are suggested, you may choose to do more. 1.
Troubleshooting Product Verification 2. Perform a wideband sweep: a. Press Preset then press Spec Anal to get the SPECTRUM ANALYZER screen. b. Set the RF Gen controls to Track, and the Port/Sweep field to Dupl. This directs the tracking generator to the DUPLEX OUT port. c. Connect the DUPLEX OUT port to the ANT IN port. d. Set the Main control to Ant. e. Set the Center Freq to 501 MHz, and the Span to 1 GHz. You should see a (roughly) flat line across the screen, varying about 4 dB.
Troubleshooting Product Verification 92 Chapter 3
4 Preventative Maintenance This chapter describes the preventative maintenance procedures recommended for the Test Set.
Preventative Maintenance Hardware Maintenance Hardware Maintenance The following procedures should be performed on a regular basis to insure that your Test Set maintains optimum performance. NOTE Periodic Adjustment Interval The adjustment programs Periodic Calibration, IQ Calibration, and Eb/No Calibration should be performed after any assembly referred to in Table 7-1 on page 159 is replaced, or at least every 24 months. These program can be run anytime to optimize the performance of the Test Set.
Preventative Maintenance Hardware Maintenance • Real Time Clock The Test Set operates with a real-time clock that is user set. The real-time clock consists of both a numerical date and a time-of-day setting which may require changing due to repair (such as a battery or hardware repair) or shipping to a different time zone. The clock and date should be checked as part of routine maintenance. Incorrect settings may be an indication of faulty battery backup.
Preventative Maintenance Hardware Maintenance Integrity The Test Set has been designed for rugged conditions, however parts can become loose or damaged over time and may require repair or maintenance. • Module Insertion and Alignment The Test set contains circuit assemblies and RF modules that are mounted in sockets and board guides. It is extremely important that these assemblies be firmly seated and aligned in their guides.
Preventative Maintenance Maintenance Procedures Maintenance Procedures Cleaning the Air Filter NOTE The cleaning interval is dependent on the environmental conditions and application, it can be as often as six months in extremely dusty or dirty environments or as long as two years in a clean, well maintained facility. The Test Set’s internal air filter requires periodic cleaning.
Preventative Maintenance Maintenance Procedures To change the AA batteries, use the following procedure: 1. Switch power off and unplug the Test Set. 2. Remove the six TX-15 torx screws in the rear frame, see Figure 4-1 on page 99. It is not necessary to remove the front frame or external cover. 3. Remove the rear frame. 4. Replace the AA batteries. Do not use rechargeable batteries, and dispose the used batteries properly. 5. Re-install the rear frame.
Preventative Maintenance Maintenance Procedures Figure 4-1 AA Batteries, Air Filter, and GFI Reset/Test Buttons Rear Frame Screws (x6) Air Filter Chassis Rear View Vent AA Battery aabat1.eps GFI Test (Red) Button Reset (Black) Button PC Card Battery CAUTION BEFORE REMOVING THE BATTERY from the PC card, insert the card into a powered-up Test Set. Removing the battery without an alternate power source will destroy the data in the card.
Preventative Maintenance Maintenance Procedures Figure 4-2 PCMCIA Card Battery Replacement Battery Holder Lock Locked Unlocked Read Only Write Write Protect Switch Battery Holder Battery Battery Holder CAUTION: INSERT CARD INTO A POWERED-UP TEST SET BEFORE REMOVING BATTERY. changbat.
5 Disassembly This chapter explains how to disassemble the Test Set for major assembly replacement.
Disassembly Service Tools Service Tools Tools One or more of the following tools may be required to access and/or remove various internal assemblies in the Test Set: • TX-10 torx screwdriver • TX-15 torx screwdriver • Flat blade screwdriver • 1/16-inch allen wrench • 3/16-inch socket wrench • 5/16-inch open-end wrench (for SMC connectors) • 15/64-inch open-end wrench (for SMA connectors) • 9/16-inch open-end wrench (for BNC connectors) • 3/4-inch open-end wrench (for Type-N connectors) Recommended Torque
Disassembly Assembly Replacements Assembly Replacements With some assemblies you will receive a memory card that contains factory-generated calibration data for that assembly. For new replacements, there will also be an instruction sheet for loading the calibration data into your Test Set. External equipment is not required for running the diagnostic routines. If diagnostic routines cannot isolate the problem, an oscilloscope, voltmeter, and spectrum analyzer may be required for further troubleshooting.
Disassembly Removing the External and Internal Covers Removing the External and Internal Covers To access most of the components inside the Test Set, you must remove the front frame, external cover, and internal covers (see Figure 5-1 and Figure 5-2). It is not necessary to remove the side panel or rear frames in most cases. You must remove the rear frame to access the memory AA backup-batteries, power supply assemblies, or to test and/or reset the ground fault interrupter (GFI). External Covers 1.
Disassembly Removing the External and Internal Covers Internal Covers There are internal covers protecting the top- and bottom-side assemblies of the Test Set. To remove the top covers, see Figure 5-2 below. To remove the bottom cover, see “Bottom Internal Cover” on page 108. Top Internal Covers 1. Remove the front frame and external cover, see “External Covers” on page 104. Side panel and rear frame removal is not necessary. 2.
Disassembly Removing the External and Internal Covers Figure 5-2 Top Internal Covers Screws (x17) MP12 Cover-Top Screws (x14) MP13 Cover-Mod MP14 Cover-Digital intcvr3.
Disassembly Removing the External and Internal Covers Figure 5-3 Topside View of Test Set A3 Assembly MOD. DISTRIBUTION, A2A44 6kHz BP A2A80A2 AUDIO 2, A2A40 C-MSSG A2A80A1 AUDIO 1, A2A80 CONTROL INTERFACE A2A70 MOTHERBOARD A2A1 RECEIVE DSP, A2A36 W204 DATA BUFFER, A2A34 C MEASUREMENT, A2A33 D SIGNAL SOURCE, A2A32 F D.
Disassembly Removing the External and Internal Covers Bottom Internal Cover To access the assemblies on the bottom side of the Test Set, turn the Test Set over, remove the screws shown in Figure 5-4, and lift the bottom internal cover from the chassis. CAUTION If the top covers are off, be careful. The exposed digital boards can be easily damaged. Some of the digital boards have pull-rings that can easily get hooked and pull assemblies from their connections.
Disassembly Removing the External and Internal Covers Figure 5-5 Bottom View of Test Set (without Bottom Cover) A2J1 W1 W2 W3 W4 W5 W6 W7 W8 W9 W10 A2J2 A2J3 W12 W11 W11 W12 W13 W14 RED BLU WHT GRY W54 YEL W15 PRL W55 W58 BLK RED W16 W17 ORG GRN W14 W13 A2P1 A2P2 A2P1 A2P2 A2P3 A2P2 A2J4 W16 W15 W17 W101 W61 BLU A1 J17 J15 J16 A2A110 Assembly W210 W100 W24 A2 J9 J11 J13 J14 J12 J10 J7 J5 J6 J8 W53 BRN J1 J2 W121 W62 GRY A2A130 Assembly W122 W56 GRY W57 ORG W63 YEL W6
Disassembly A1 Disassembly A1 Disassembly 1. Remove the front frame, external cover, and internal top and bottom covers, see “Removing the External and Internal Covers” on page 104. 2. Remove the eight screws securing the A1 assembly to the A2 assembly, see Figure 5-6. 3. Disconnect cables W200 and W202 from connectors J79 and J49 on the A2A1 motherboard. To replace a component or subassembly on the A1 assembly, see Figure 5-7 on page 111.
Disassembly A1 Disassembly Figure 5-7 A1 Assemblies and Components Keypad A1A2 (sheet metal frame included) Screen MP35 Frame MP34 MP103 (x8) MP38 Adhesive Speaker A1LS1 Knob MP31 Knob MP32 Nut MP36 Washer MP37 Knob MP30 Display A1A1 MP102 (x4) J1 J5 J2 J5 W200 A1A3 W203 W202 MP104 (x3) A1R1 a1parts1.
Disassembly A2 Disassembly A2 Disassembly This section describes how to disassemble the A2 assembly. Use Table 5-1 below to see which assemblies are replaceable. NOTE Periodic Adjustment Intervals The adjustment programs Periodic Calibration, IQ Calibration, and Eb/No Calibration should be performed after any assembly referred to in Table 7-1 on page 159 is replaced, or at least every 24 months. These program can be run anytime to optimize the performance of the Test Set.
Disassembly A2 Disassembly NOTE For cable routing information see Table 5-2 on page 130.
Disassembly A2 Disassembly Figure 5-9 PC Board Assemblies 114 Chapter 5
Disassembly A2 Disassembly A2A80A1 and A2A80A2 Filter Assembly Removal To remove either of the filter option assemblies on the A2A80 Audio Analyzer 1 assembly: 1. Remove the A2A80 assembly from the Test Set. 2. Turn the plastic hex nut on each standoff a quarter turn and push the standoffs through their holes to release the filter board from the host board, see Figure 5-10. It may be necessary to compress or squeeze the expandable flanges to slide them through the mounting holes.
Disassembly A2 Disassembly PCMCIA Assembly 1. Remove the front frame, external cover, and the front internal cover from the Test Set, see “Top Internal Covers” on page 105. 2. Remove the memory card from the card slot. 3. See Figure 5-11. Remove the two screws and disconnect ribbon cable W201 from the PCMCIA assembly. Lift the assembly from the chassis.
Disassembly A2 Disassembly Control Interface Assembly 1. Remove the standoffs and screwlocks from the connector panel as shown in Figure 5-12 on page 117 from the Test Set. 2. Disconnect ribbon cable W204 from the A2A70 assembly to remove the assembly. Figure 5-12 Control Interface Assembly Removal J3 Control Interface Board A2A70 J8 J2 Washer MP108 (x10) J4 Screwlock MP107 (x10) J5 J6 Washer MP109 (x2) Screw (x4) MP110 A2J3 Nut MP106 (x2) A2J2 Same for A2J3 and A2J4.
Disassembly A2 Disassembly RF Input/Output, Upconverter, & Downconverter Assemblies The RF Input/Output A2A130, Upconverter A2A130, and Downconverter A2A115 assemblies are secured in an interlocking manner and are disassembled in the following order: RF Input/Out Assembly Removal 1. Remove the bottom cover of the Test Set. See “Removing the External and Internal Covers” on page 104. 2. Disconnect cables: W101, W122, W121, W110, W211, W67, and W120. See Figure 5-13 on page 119. 3.
Disassembly A2 Disassembly Figure 5-13 RF Input/Output, Upconverter, & Downconverter Removal W211 W50 to A2A1 J34 RF Input/Output Assembly A2A130 J7 W110 or W125 J1 W121 W122 J5 J4 J6 MP101 W100 J3 W120 MP105 W210 to A2A1 J32 MP101 J2 W24 MP111 J3 W101 MP105 MP101 W212 J4 J1 MP101 MP111 MP100 MP 110 J2 J4 W56 Upconverter Assembly A2A110 W57 W110 or W124 MP110 MP105 J3 J2 J1 MP105 Downconverter Assembly A2A115 Chapter 5 partmod1.
Disassembly A2 Disassembly LO IF/IQ Modulator and CDMA Generator Reference (Gen Ref) Assemblies The LO IF/IQ Modulator and Gen Ref assemblies need to be removed in the following order. See Figure 5-14 on page 121. Removing the LO IF/IQ Modulator Assembly 1. Remove the bottom cover, see “Bottom Internal Cover” on page 108. 2. Disconnect the cables shown in Figure 5-14 on page 121. 3. Remove the nine torx screws that secure this assembly to the chassis. Removing the Gen Ref Assembly 1.
Disassembly A2 Disassembly Figure 5-14 LO IF/IQ Modulator & CDMA Generator Reference Removal MP101 (x9) LO IF/IQ MOD Assembly A2A120 W214 Gen Ref Assembly A2A100 J 3 W215 MP101 (x7) 1 J 6 1 J 7 1 J 2 1 J 4 3 1 1 J J 5 1 J 2 J 0 1 J 1 1 J MP101 (x8) W216 8 J 9 J 7 J 6 5 J J Gen Ref Assembly A2A100 J16 J17 J15 J14 J12 J10 J8 J6 J7 J9 J5 J13 J11 W61 W58 BLU RED W17 W16 GRN ORG W15 PRL W55 BLK W14 GRY W54 YEL MP101 (x8) W13 W12 W11 WHT BLU RED W58 RED LO IF/IQ MOD Assembly A2A12
Disassembly A2 Disassembly Attenuator Assembly 1. Remove the front, side, and rear external covers, and the top and bottom internal covers, see “Removing the External and Internal Covers” on page 104. 2. Remove the power supply assembly, see “A3 Disassembly” on page 126. 3. Turn the Test Set over and disconnect flex connectors W120 and W123 from the attenuator, see Figure 5-15. 4. Remove the four screws that secure the attenuator to the chassis, see Figure 5-15.
Disassembly A2 Disassembly Figure 5-15 Attenuator Assembly Removal A2 Assembly (Rear View) Attenuator A2A200 A2 Assembly (Rear View) Attenuator A2A200 W120 (A2A200 OUT) W123 (A2A200 INPUT) MP 101 (4x) a2a200 1.
Disassembly A2 Disassembly Motherboard Assembly 1. Remove the all external and internal (top and bottom) covers from the Test Set, see “Removing the External and Internal Covers” on page 104. 2. Remove all the modules and PC board assemblies. See “Module and PC Board Assemblies” on page 112. 3. Remove the A1 front panel and A3 rear panel assemblies. See “A1 Disassembly” on page 110 and “A3 Disassembly” on page 126. 4.
Disassembly A2 Disassembly Figure 5-16 Motherboard Removal Sheet Metal Divider MP19 MP101 (x11) Motherboard A2A1 MP101 (x3) S P E C R C V R R E C E IV E R A N A LY Z E R O U T P U T R E F E R E N C E S Y N T H S P E C S IG S E C T G E N S Y N T H R C V R R E C E IV E R A N A LY Z E R O U T P U T R E F E R E N C E S Y N T H S IG S E C T G E N S Y N T H Sub Frame MP16 Gasket MP18 MP101 (x3) mom1.
Disassembly A3 Disassembly A3 Disassembly 1. Remove the Test Set’s external and internal covers, see “Removing the External and Internal Covers” on page 104. 2. Remove the eighteen torx screws securing the A3 assembly to the A2 assembly, see Figure 5-17. 3. Move the A3 assembly away from the A2 assembly and disconnect cables W220 and W221. Figure 5-17 A3 Rear Panel Assembly W221 W220 A2 Assembly (Rear View) MP101 (x18) A3 Assembly 126 A3disas1a.
Disassembly A3 Disassembly Removing the Power Supply Regulator Assembly To remove the A3A1 regulator assembly, disconnect the cables and the four torx screws shown in Figure 5-18. Figure 5-18 A3A1 Regulator Assembly W221 W223 J6 Regulator Assembly A3A1 r O pw P to W l pp su E y R S W J3 A F N to J4 J1 to pw Power Switch Cable (part of A3S1) hr ot l pp su m r bd y J2 J7 W222 J5 W220 Fan Cable (part of A3A1) Battery Cable (part of A3A4) 4 J1 3 J1 J7 A3A1 Assembly reg_rmv2.
Disassembly A3 Disassembly Figure 5-19 Power Supply Removal Power Supply Cover Rear Sub-Panel J1 4 J1 3 ps_cvr1.eps J7 W222 Power Supply Assembly J1 4 W223 J1 3 Part of GFI Assembly. J7 J7 Rear Sub-Panel ps_rmv2.
Disassembly A3 Disassembly Power Supply Switch, Fan, & Battery Holder Assemblies 1. Remove the regulator assembly, see “Removing the Power Supply Regulator Assembly” on page 127, and power-supply cover and subassemblies, see “Removing the Power Supply Assembly” on page 127. 2. To remove the fan, remove the three screws shown in Figure 5-20 3. The A3S1 power switch assembly is normally riveted in place. However this assembly is replaceable and screws can be used to replace the rivets, see Figure 5-20.
Disassembly Wire/Cable Information Wire/Cable Information Table 5-2 Wire/Cable List Wire # From To Part Number W1 "AUDIO OUT" (Panel) A2A1 J8 E6380-61039 W2 "AUDIO IN - HI" (Panel) A2A1 J9 E6380-61039 W3 "AUDIO IN - LO" (Panel) A2A1 J11 E6380-61039 W4 "BASEBAND OUT - I" (Panel) A2A34 J402 E6380-61043 W5 "BASEBAND OUT - Q" (Panel) A2A34 J502 E6380-61043 W6 "DATA IN" (Panel) A2A34 J22 E6380-61045 W7 "ANALOG MODULATION IN" (Panel) A2A1 J36 E6380-61039 W8 "SCOPE MONITOR OUT"
Disassembly Wire/Cable Information Table 5-2 Wire/Cable List Wire # From To Part Number W25 A2A1 J76 A2A34 J709 "1.2200 MHz_DATA_OUT" E6380-61044 W26 A2A1 J75 A2A34 J4 "19.
Disassembly Wire/Cable Information Table 5-2 Wire/Cable List Wire # From W65-W99 NOT USED W100 A2A1 J3 "RF OUT" A2A110 J1 E6380-61021 W101 A2A110 J2 A2A130 J2 E6380-61020 W102-W109 NOT USED W110 A2A115 J1 W120 NOT USED W121 A2A130 J4 A2 J2 "ANT IN" (Panel) E6380-61019 W122 A2A130 J6 A2 J3 "DUPLEX OUT" (Panel) E6380-61018 W123 A2 J4 "RF IN/OUT" (Panel) A2A200 "INPUT" E6380-61016 W124 A2U1 “DC BLOCK” A2A200 “OUT” E6380-61111 W125 A2A130 J3 A2U1 “DC BLOCK” E6380-61112 W1
Disassembly Wire/Cable Information Table 5-2 Wire/Cable List Wire # From To Part Number W221 A3A1 J5 A2A1 J73 (multiconductor power cable) E6380-61036 W222 A3A1 J6 POWER SUPPLY, A3A2 J14 E6380-61049 W223 A3A1 J1 POWER SUPPLY, A3A2 J13 E6380-61035 (cable part of A3A4 assembly) BATTERY HOLDER ASSEMBLY, A3A4 A3A1 J7 N/A (cable part of A3S1 assembly) POWER SWITCH, A3S1 A3A1 J3 N/A (cable part of A3B1 assembly) FAN ASSEMBLY, A3B1 A3A1 J4 N/A (cable part of A3A3 assembly) LINE MODUL
Disassembly Wire/Cable Information 134 Chapter 5
6 Replaceable Parts This chapter contains the replaceable assembly and component information for the Test Set. Use the illustrations in this chapter to identify the replaceable parts and the “Parts List” on page 150 for part numbers.
Replaceable Parts Replacement & Ordering Parts Replacement & Ordering Parts Direct Parts Ordering See “Factory Support” on page 46. The Agilent Support Materials Organization can help you order and identify parts. Assembly Replacements With some assemblies you will receive a Memory Card that contains factory-generated calibration data for that assembly. There will also be an instruction sheet for loading the calibration data into your Test Set after you’ve replaced the assembly.
Replaceable Parts Parts Identification Parts Identification Major Assembly Overview Shown below is a top view of the Test Set with external and internal covers removed. The Test Set can be separated into three major assemblies designated: A1, A2, and A3. Throughout this chapter the reference designator for each sub assembly is prefixed with its major assembly’s designator.
Replaceable Parts Parts Identification Covers and Chassis Parts Figure 6-2 External and Internal Covers 138 Chapter 6
Replaceable Parts Parts Identification A1 Assemblies Figure 6-3 A1 Assembly - Front Panel Keypad A1A2 (sheet metal frame included) Screen MP35 Frame MP34 MP103 (x8) MP33 Knob MP31 Knob MP32 Nut MP36 Speaker A1LS1 Washer MP37 Knob MP30 Display A1A1 MP102 (x4) J1 J5 J2 J5 W200 A1A3 W203 W202 MP104 (x3) A1R1 a1parts1.
Replaceable Parts Parts Identification A2 Assemblies Module and PCB Board Assemblies Figure 6-4 A3 Assembly MOD. DISTRIBUTION, A2A44 6kHz BP A2A80A2 AUDIO 2, A2A40 C-MSSG A2A80A1 AUDIO 1, A2A80 CONTROL INTERFACE A2A70 MOTHERBOARD A2A1 RECEIVE DSP, A2A36 W204 DATA BUFFER, A2A34 C MEASUREMENT, A2A33 D SIGNAL SOURCE, A2A32 F MEMORY A2A30A1 MEMORY (SBRC), A2A30 D.
Replaceable Parts Parts Identification PCB Assemblies Figure 6-5 AU DIO DATA BUFFER, A2A34 Assembly J709 J22 W4 W25 J402 "RP I SIG" to A2A1 J76 "DATA IN" W6 J400 "SIG OUT" J401 "I INPUT" to panel "DATA IN" J501 "Q INPUT" J500 "Q SIG OUT" J4 J502 "RP Q SIG" "19.6 MHz IN" (Fi lte C- r OP MS T SG 1 ) W32 W28 W27 W31 A2 A8 #1, A2 A8 0A sse mb ly 0A 1 W5 W26 to A2A1 J75 (Fi "16X CHIP" lte r 6k OPT BP 2 F) A2 A8 0A 2 1/4 turn to remove or secure option board.
Replaceable Parts Parts Identification PCMCIA Assembly Figure 6-6 J1 J5 J2 J5 a2a10.eps MP101 PCMCIA Assembly A2A10 MP101 W201 J1 to Motherboard A2A1 J59 Attenuator Assembly Figure 6-7 A2 Assembly (Rear View) Attenuator A2A200 A2 Assembly (Rear View) W120 (A2A200 OUT) W123 (A2A200 INPUT) Attenuator A2A200 MP 101 (4x) a2a200_1.
Replaceable Parts Parts Identification Control Interface Assembly & Connectors Figure 6-8 J3 Control Interface Board A2A70 J8 J2 Washer MP108 (x10) J4 Screwlock MP107 (x10) J5 J6 Washer MP109 (x2) Screw (x4) MP110 A2J3 Nut MP106 (x2) A2J2 Same for A2J3 and A2J4. Nut MP20 (17x) A2J2 Control Interface Board A2A70 to Controller Assembly A2A31 J1 J1 W204 J7 J10 a2a70_2.
Replaceable Parts Parts Identification RF/IO, Up Converter, and Down Converter Assemblies Figure 6-9 W211 W52 to A2A1 J34 RF Input/Output Assembly A2A130 W121 J7 W110 J1 W122 J5 J4 J6 MP101 W100 (from A2A1 J4) J3 MP105 W210 W24 (from A2A1 J4) to A2A1 J32 MP111 J3 5 W120 MP101 J2 W101 MP105 MP101 W212 J4 J1 MP101 MP111 MP100 MP 110 J2 J4 W56 Upconverter Assembly A2A110 W57 W110 MP110 MP105 J3 J2 J1 MP105 Downconverter Assembly A2A115 144 partmod1.
Replaceable Parts Parts Identification LO IF/IQ MOD and GEN REF Assemblies Figure 6-10 MP101 (x9) LO IF/IQ MOD Assembly A2A120 W214 Gen Ref Assembly A2A100 J3 W215 MP101 (x7) J1 7 J1 J1 6 J1 J1 5 4 J1 J1 3 2 J1 0 J2 J1 1 MP101 (x8) W216 J9 J8 J7 J6 J5 Gen Ref Assembly A2A100 J16 J17 J15 J8 J6 J12 J10 J14 J7 J9 J5 J13 J11 W61 W58 BLU RED W17 W16 GRN ORG W15 PRL W55 BLK W14 GRY W54 YEL W13 W12 W11 WHT BLU RED MP101 (x8) W58 RED LO IF/IQ MOD Assembly A2A120 W63 YEL W50 BLK W51
Replaceable Parts Parts Identification Motherboard and Sub Frame Figure 6-11 Sheet Metal Divider MP19 MP101 (x11) Motherboard A2A1 MP101 (x3) S P E C R C V R R E C E IV E R A N A LY Z E R O U T P U T R E F E R E N C E S Y N T H S P E C S IG S E C T G E N S Y N T H R C V R R E C E IV E R A N A LY Z E R O U T P U T R E F E R E N C E S Y N T H S IG S E C T G E N S Y N T H Sub Frame MP16 MP101 (x3) Gasket MP18 mom_rmv1.
Replaceable Parts Parts Identification A3 Rear Panel Assembly Figure 6-12 W221 Regulator Assembly A3A1 MP101 (x4) to r pw P ly pp su E W O R W S J6 J3 N A F J4 to to r pw hr ot m bd ly pp su J1 W223 J7 J2 J5 W220 Switch A3S1 Part of A3A4 Battery Holder Assembly MP102 (x10) W222 Power Supply Cover MP51 to A3A1 J4 MP101 (x4) Fan A3B1 4 J1 3 J1 Power Supply A3A2 from GFI assembly J7 MP101 (x4) MP101 (x4) Rear Sub-Panel MP50 MP101 (x3) Switch A3S1 to A3A1 J7 Battery Holder A3A4 MP101
Replaceable Parts Parts Identification Cable Assemblies Figure 6-13 Cables, Top View W30 "E" W28 "F" W31 "D" W29 "A" W32 "C" W27 "B" F E B A D C Motherboard Top Side A3 POWER SUPPLY MP 112 Washer (6x) MP 113 Nut (6x) Motherboard Bottom Side 6kHz BPF A2A80A2 MOD.
Replaceable Parts Parts Identification Figure 6-14 Cables, Panel and Bottom Side Views Chapter 6 149
Replaceable Parts Parts List Parts List Table 6-1 Ref. Des. Description Part Number A1 FRNT PNL KIT E6380-61891 A1A1 EL DISPLAY 6.
Replaceable Parts Parts List Table 6-1 Ref. Des.
Replaceable Parts Parts List Table 6-1 Ref. Des.
Replaceable Parts Parts List Table 6-1 Ref. Des. Description Part Number MP37 WSHR LK .256ID 2190-0027 MP50 SUBPANEL-REAR E6380-61107 MP51 COVER-POWER SUPPLY E6380-00064 MP100 CLAMP-CABLE 1400-1391 MP101 SMM4.0 10SEMPNTX 0515-0380 MP102 SMM3.0 8SEMPNTX 0515-0374 MP103 SMM3.0 6 FL TX 0515-1227 MP104 SMM3.0 6SEMPNTX 0515-2126 MP105 SMM4.0 20MML 0515-0456 MP106 STDF .327L 6-32 0380-0644 MP107 CONN SCREWLOCK F 0380-2079 MP108 WSHR-LK HLCL #4 2190-0003 MP109 WSHR LK .
Replaceable Parts Parts List Table 6-1 Ref. Des.
Replaceable Parts Parts List Table 6-1 Ref. Des.
Replaceable Parts Parts List 156 Chapter 6
7 Periodic Adjustments This chapter contains the periodic adjustment procedures for the Test Set.
Periodic Adjustments Periodic Adjustments Periodic Adjustments Some assemblies or combinations of assemblies require periodic adjustments to compensate for variations in circuit performance due to age or environment.
Periodic Adjustments Periodic Adjustments Table 7-1 Assembly Calibration Information Assembly Where calibration data is located.
Periodic Adjustments Periodic Adjustments Equipment Equipment for the Periodic Adjustments Programs • For the Timebase Reference Using a Counter calibration you will need to connect a frequency counter to the rear-panel 10 MHz REF OUTPUT connector. The accuracy of the counter will determine the accuracy of the Test Set’s internal reference. You will use the counter to set the timebase reference DACs.
Periodic Adjustments Periodic Adjustments Equipment Needed for the System Power Calibration Program For the System Power Calibration program you will need the equipment listed in Table 7-2. Because this calibration program is written specifically for this equipment, no substitutions are possible.
Periodic Adjustments A Word About Storing Calibration Factors A Word About Storing Calibration Factors You should understand the calibration-factor-storage process before running any of the following programs: Periodic Calibration, IQ Calibration, Eb/No Calibration, or System Power Calibration. As a program runs, calibration factors are computed and applied. When all the calibration factors have been acquired, the program stops and asks if the user wants the calibration factors to be stored.
Periodic Adjustments Running the Periodic, IQ, or Eb/No Calibration Programs Running the Periodic, IQ, or Eb/No Calibration Programs 1. Press Menu to access the SOFTWARE MENU screen. 2. Select the field under Select Procedure Location:. 3. Select ROM under the Choices: menu. 4. Select the field under Select Procedure Filename:. 5. Select SERVICE4, see Figure 7-2 on page 163. 6. Select Run Test (key k1). 7. From the SERVICE MENU, select the desired calibration program to perform.
Periodic Adjustments Running the System Power Calibration Program Running the System Power Calibration Program This adjustment program is not found in ROM of the Test Set. This program resides on a PCMCIA Memory Card, part-number E6380-61811. It has to be downloaded from the memory card. This program generates system power calibration factors for the Test Set. The purpose of this program is to generate calibration factors for the RF Input/Output Section module, high power attenuator, and cables.
Periodic Adjustments Periodic Calibration Menu Descriptions Periodic Calibration Menu Descriptions This section describes the adjustment programs listed under the Periodic Calibration menu. Figure 7-3 Periodic Calibration SERVICE MENU Screen 1 SERVICE MENU Move pointer to desired program using the knob then press the knob. Press Help for information on the tests. Press Exit to abort.
Periodic Adjustments Periodic Calibration Menu Descriptions As an alternate method, you can select the option Timebase Reference Using a Source (see following section) and adjust the timebase to a time standard connect to the front-panel ANT IN connector. Timebase Reference Using a Source This program automatically tunes the timebase tuning DACs to the signal at the front-panel ANT IN connector, which is input at the frequency that is keyed in from the front-panel keypad.
Periodic Adjustments Periodic Calibration Menu Descriptions Figure 7-4 Measurement (A2A33) Assembly Test Points Measurement Board Assembly +REF SGND -REF a2a33_1.eps Audio Frequency Generator Gain The gain of the following paths is calibrated: • The internal paths that run from Audio Frequency Generators 1 and 2 (individually) through the Modulation Distribution assembly, to the monitor select output, then onto Audio Analyzer 1 to the DVM.
Periodic Adjustments Periodic Calibration Menu Descriptions External Modulation Path Gain The Audio Frequency Generator Gain program should be performed before running the External Modulation Path Gain program. The “path” in this program runs from the external MODULATION IN connector through the Modulation Distribution assembly, through the Monitor Select Switch, and then through Audio Analyzer 1 to the Test Set’s internal DVM.
Periodic Adjustments Setting the Timebase Latches Setting the Timebase Latches The refs_DAC_coarse and ref_DAC_fine values adjust the frequency of the Test Set’s internal 10 MHz reference. They are stored in memory. The controller reads the values and sends the appropriate adjustment to the A2A23 Reference assembly. The following procedure is to be used when running the program “Timebase Reference Using a Counter” on page 165. 1. Press Shift, Duplex Config to access the CONFIGURE screen. 2.
Periodic Adjustments IQ Calibration Program Description IQ Calibration Program Description The goal of IQ Calibration is to minimize the carrier feedthrough while maximizing the Rho of the IQ signal. There are four DACs involved in this adjustment: • buffModN_I_DC_offset_DAC, • buffModN_Q_DC_offset DAC, • buffModN_signal_delta_DAC, • genRef_IQ_quad_DAC The I and Q dc offset DACs and the signal delta DAC are on the A2A34 Data Buffer assembly and the Quad DAC is on the A2A100 CDMA Generator Reference.
Periodic Adjustments Eb/No Calibration Program Description Eb/No Calibration Program Description The Eb/No calibration is a CDMA loopback measurement. Before the Eb/No measurement begins, four preliminary measurements are made with the CDMA generator in the data mode: (1) The difference in channel power between forward and reverse modes is measured to determine the loss to be accounted for when the all-pass filter is in forward mode. (2) Rho is measured in both the forward and reverse paths.
Periodic Adjustments Eb/No Calibration Program Description 172 Chapter 7
8 Performance Tests This chapter contains the performance test procedures for the Test Set. The tests in this chapter verify that the Test Set performs to its published specifications.
Performance Tests Procedure and Equipment Procedure and Equipment How to Use the Performance Tests • Run the Performance Tests in Table 8-2, “Performance Tests & Records Location,” on page 176 using the specified Test Equipment from Table 8-1, “Required Test Equipment by Model,” on page 175. • Compare and record the data for each test onto the applicable Performance Test Record (PTR).
Performance Tests Procedure and Equipment Table 8-1 Required Test Equipment by Model Model Number Model Name Test Number Mini-Circuits ZFL-2000 or equivalent1 Amplifier 1 5 GTC RF Products GRF 5016 or equivalent2 Amplifier 2 27, 28 Agilent 3458A Multimeter 8-9, 12, 15, 18 Agilent 5316A Counter 11, 16 Agilent 8562A Spectrum Analyzer 6-7 Agilent 8663A Signal Generator (High Performance) 4 Agilent 8648B Option 1EA Signal Generator 19 Agilent 8902A Measuring Receiver 1-5, 17, 19-22,
Performance Tests Procedure and Equipment Table 8-2 Performance Tests & Records Location Performance Test (in this chapter) Test Record in Chapter 7 , “Periodic Adjustments, ” on page 157 “RF Generator FM Distortion Performance Test 1” on page 178 page 234 “RF Generator FM Accuracy Performance Test 2” on page 181 page 236 “RF Generator FM Flatness Performance Test 3” on page 184 page 238 “RF Generator Residual FM Performance Test 4” on page 187 page 240 “RF Generator Level Accuracy Performance T
Performance Tests Procedure and Equipment Table 8-2 Performance Tests & Records Location Performance Test (in this chapter) Test Record in Chapter 7 , “Periodic Adjustments, ” on page 157 “CDMA Generator Modulation Accuracy Performance Test 26” on page 223 page 278 “CDMA Analyzer Average Power Level Accuracy Performance Test 27” on page 225 page 279 “CDMA Analyzer Channel Power Level Accuracy Performance Test 28” on page 227 page 280 “CDMA Analyzer Modulation Accuracy Performance Test 29” on page
Performance Tests RF Generator FM Distortion Performance Test 1 RF Generator FM Distortion Performance Test 1 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-1, “RF Generator FM Distortion Test 1 Record,” on page 234. The FM distortion of the RF generator is measured directly by the measuring receiver. The Test Set’s internal audio generator provides the modulation source. Two setups are shown below.
Performance Tests RF Generator FM Distortion Performance Test 1 Procedure Steps 1, 2, and 3 in the following procedure apply to both of the setups (shown in Figure 8-1 and Figure 8-2 on page 178). 1. On the measuring receiver: a. Reset the instrument. b. Set the high-pass filter to 300 Hz. c. Set the low-pass filter to 3 kHz. d. Set the measurement mode to FM. e. Set the measurement mode to audio distortion. f. If the microwave converter is being used, set the frequency offset mode to exit the mode (27.
Performance Tests RF Generator FM Distortion Performance Test 1 5. On the measuring receiver: a. Set the frequency offset mode to enter and enable the LO frequency (27.3 Special). b. Key in the LO frequency (in MHz) which is 1500. 6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the FM distortion at the deviations shown in the PTR and compare the measured distortion to the limits.
Performance Tests RF Generator FM Accuracy Performance Test 2 RF Generator FM Accuracy Performance Test 2 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-2, “RF Generator FM Accuracy Test 2 Record,” on page 236. The FM accuracy of the RF generator is measured directly by the measuring receiver. The Test Set's internal audio generator provides the modulation source. Two setups are shown below.
Performance Tests RF Generator FM Accuracy Performance Test 2 Procedure Steps 1, 2, and 3 in the following procedure apply to both of the setups (shown in Figure 8-3 and Figure 8-4 on page 181). 1. On the measuring receiver: a. Reset the instrument. b. Set the high-pass filter to 300 Hz. c. Set the low-pass filter to 3 kHz. d. Set the measurement mode to FM. e. Set the FM de-emphasis off. f. If the microwave converter is being used, set the frequency offset mode to exit the mode (27.0 Special). 2.
Performance Tests RF Generator FM Accuracy Performance Test 2 5. On the measuring receiver: a. Set the frequency offset mode to enter and enable the LO frequency (27.3 Special). b. Key in the LO frequency (in MHz) which is 1500. 6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the FM at the deviations shown in the PTR and compare the measured deviation to the limits.
Performance Tests RF Generator FM Flatness Performance Test 3 RF Generator FM Flatness Performance Test 3 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-3, “RF Generator FM Flatness Test 3 Record,” on page 238. The FM flatness of the RF generator is measured directly by the measuring receiver. The Test Set's internal audio generator provides the modulation source. Two setups are shown below.
Performance Tests RF Generator FM Flatness Performance Test 3 Procedure Steps 1, 2, and 3 in the following procedure apply to both of the setups (shown in Figure 8-5 and Figure 8-6 on page 184). 1. On the measuring receiver: a. Reset the instrument. b. Set the measurement mode to FM. c. If the microwave converter is being used, set the frequency offset mode to exit the mode (27.0 Special). 2. On the Test Set: a. Press Preset. b. Select the INSTRUMENT CONFIGURE screen. c. Set the RF Display field to Freq.
Performance Tests RF Generator FM Flatness Performance Test 3 5. On the measuring receiver: a. Set the frequency offset mode to enter and enable the LO frequency (27.3 Special). b. Key in the LO frequency (in MHz) which is 1500. 6. On the Test Set, for frequencies of 1700 and 2000 MHz, measure the FM deviation at the rates shown in the PTR. Convert the measurement results as was done in step 3 and compare the calculated deviation to the limits.
Performance Tests RF Generator Residual FM Performance Test 4 RF Generator Residual FM Performance Test 4 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-4, “RF Generator Residual FM Test 4 Record,” on page 240. The residual FM of the RF generator is measured directly by the measuring receiver. An external LO is used to improve the residual FM of the measuring receiver.
Performance Tests RF Generator Residual FM Performance Test 4 Figure 8-8 Setup for Measurements to 2 GHz Using a Microwave Converter Audio Analyzer INPUT Measuring Receiver DUPLEX OUT MODULATION OUTPUT EXT LO INPUT RF INPUT Signal Generator INPUT 50Ω Signal Generator LO IF OUTPUT Microwave Converter RF OUTPUT LO INPUT RF OUTPUT Procedure Steps 1 to 5 in the following procedure apply to both setups (shown in Figure 8-7 and Figure 8-8 on page 188). 1.
Performance Tests RF Generator Residual FM Performance Test 4 d. Set the low-pass filter to 30 kHz. 4. On the Test Set: a. Press Preset. b. Select the INSTRUMENT CONFIGURE screen. c. Set the RF Display field to Freq. d. Select the CDMA GENERATOR screen. e. Set the CW RF Path field to Bypass. f. Select the RF GENERATOR screen. g. Set the RF Gen Freq to 10 MHz. h. Set the Amplitude to -10 dBm. 5. For frequencies up to 1000 MHz and for each line in the Performance Test Record (PTR) do the following: a.
Performance Tests RF Generator Level Accuracy Performance Test 5 RF Generator Level Accuracy Performance Test 5 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-5, “RF Generator Level Accuracy Test 5 Record,” on page 242. Using a measuring receiver and sensor module, at several frequencies up to 1 GHz the Test Set is set to generate levels between −10 and 125 dBm (in 5 dB steps) at it’s DUPLEX OUT connector.
Performance Tests RF Generator Level Accuracy Performance Test 5 3. On the measuring receiver: a. Set the measurement mode to RF Power. b. Set the display to log. 4. On the Test Set: a. Press Preset. b. Select the INSTRUMENT CONFIGURE screen. c. Set the RF Display field to Freq. d. Select the CDMA GENERATOR screen. e. Set the CW RF Path field to Bypass. f. Select the RF GENERATOR screen. g. Set the RF Gen Freq to 3 MHz. h. Set the Amplitude to -10 dBm. 5.
Performance Tests RF Generator Level Accuracy Performance Test 5 Figure 8-10 Setup 2 for Measurements of 1700 and 2000 MHz DUPLEX OUT RF IN/OUT INPUT AMPLIFIER 1 OUTPUT Measuring Receiver Microwave Converter RF INPUT Signal Generator INPUT 50Ω IF OUTPUT LO INPUT RF OUTPUT Procedure 2 Steps 1 to 5 in the following procedure apply to Setup 1 shown in Figure 8-9 on page 190. 1. Connect the sensor module on the measuring receiver to the DUPLEX OUT port of the Test Set. 2. On the Test Set: a.
Performance Tests RF Generator Level Accuracy Performance Test 5 7. On the signal generator set the level to +8 dBm or whatever level is suitable for the microwave converter’s LO input. 8. For frequencies of 1700 and 2000 MHz perform the following: a. On the signal generator set the frequency to 1900 MHz CW and 2200 MHz CW respectively. b. Reset the measuring receiver. c. On the measuring receiver set the frequency offset mode to enter and enable the LO frequency (27.
Performance Tests RF Generator Level Accuracy Performance Test 5 + RF level measured at -80 dBm in step 8i – RF level measured at -80 dBm in step 8j + RF level measured in step 8k For example, if: RF power measured at −10 dBm in step 3b or 5b = −10.2 dBm RF level measured at −80 dBm in step 8i = −70.1 dB RF level measured at -80 dBm in step 8j = −52.6 dB RF level measured at -100 dBm in step 8k = −73.2 dB the corrected level at −100 dBm is −10.2 + (−70.1) − (−52.6) + (−73.2) = 100.9 dBm.
Performance Tests RF Generator Harmonics Spectral Purity Performance Test 6 RF Generator Harmonics Spectral Purity Performance Test 6 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-6, “RF Generator Harmonics Spectral Purity Test 6 Record,” on page 250. Harmonic signals with the carrier set to several frequencies and two different levels (maximum output and minimum level vernier) are searched for by an RF spectrum analyzer.
Performance Tests RF Generator Spurious Spectral Purity Performance Test 7 RF Generator Spurious Spectral Purity Performance Test 7 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-7, “RF Generator Spurious Spectral Purity Test 7 Record,” on page 254. Spurious signals with the carrier set to several frequencies and two different levels (maximum output and minimum level vernier) are searched for by an RF spectrum analyzer.
Performance Tests AF Generator AC Level Accuracy Performance Test 8 AF Generator AC Level Accuracy Performance Test 8 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-8, “AF Generator AC Level Accuracy Test 8 Record,” on page 256. There are two audio generators. AC level accuracy is measured directly with a digital multi meter. Figure 8-13 Setup AUDIO OUT Multimeter INPUT Procedure 1. Set the multimeter to measure AC volts.
Performance Tests AF Generator DC Level Accuracy Performance Test 9 AF Generator DC Level Accuracy Performance Test 9 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-9, “AF Generator DC Level Accuracy Test 9 Record,” on page 258. There are two DC generators. DC level accuracy is measured directly with a digital multi meter. Figure 8-14 Setup AUDIO OUT Multimeter INPUT Procedure 1. Set the multimeter to measure DC volts. 2.
Performance Tests AF Generator Residual Distortion Performance Test 10 AF Generator Residual Distortion Performance Test 10 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-10, “AF Generator Residual Distortion Test 10 Record,” on page 259. Audio distortion is measured directly with an audio analyzer. Figure 8-15 Setup AUDIO OUT Audio Analyzer INPUT Procedure 1. On the audio analyzer: a. Reset the instrument. b.
Performance Tests AF Generator Frequency Accuracy Performance Test 11 AF Generator Frequency Accuracy Performance Test 11 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-11, “AF Generator Frequency Accuracy Test 11 Record,” on page 261. Frequency accuracy is measured directly with a frequency counter. The counter must be able to resolve 0.005% at 20 Hz. Figure 8-16 Setup AUDIO OUT Counter INPUT Procedure 1.
Performance Tests AF Analyzer AC Level Accuracy Performance Test 12 AF Analyzer AC Level Accuracy Performance Test 12 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-12, “AF Analyzer AC Voltage Accuracy Test 12 Record,” on page 262. To measure AC voltage accuracy, an AC signal is measured by an external multi meter and compared to the Test Set’s internal AC voltmeter reading.
Performance Tests AF Analyzer Residual Noise Performance Test 13 AF Analyzer Residual Noise Performance Test 13 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-13, “AF Analyzer Residual Noise Test 13 Record,” on page 263. The AC level of the audio input is measured with no signal source connected. Figure 8-18 Setup Procedure 1. On the Test Set: a. Press Preset. b. Select the AF ANALYZER screen. c.
Performance Tests AF Analyzer Distortion and SINAD Accuracy Performance Test 14 AF Analyzer Distortion and SINAD Accuracy Performance Test 14 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-14, “AF Analyzer Distortion and SINAD Accuracy Test 14 Record,” on page 264. A calibrated distortion source is created by summing the two internal audio generators. Levels are measured separately by the internal AC voltmeter.
Performance Tests AF Analyzer DC Level Accuracy Performance Test 15 AF Analyzer DC Level Accuracy Performance Test 15 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-15, “AF Analyzer DC Level Accuracy Test 15 Record,” on page 265. To measure DC level accuracy, a DC signal is measured by an external digital multi meter and compared to the Test Set’s internal DC voltmeter reading.
Performance Tests AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-16, “AF Analyzer Frequency Accuracy to 100 kHz Test 16 Record,” on page 266.
Performance Tests AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-17, “AF Analyzer Frequency Accuracy at 400 kHz Test 17 Record,” on page 267.
Performance Tests AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 l. Set the Audio In Lo field to Gnd. 3. Measure the audio frequency on the measuring receiver and the Test Set and note the frequency difference. Compare the calculated difference to the limits shown in the Performance Test Record.
Performance Tests Oscilloscope Amplitude Accuracy Performance Test 18 Oscilloscope Amplitude Accuracy Performance Test 18 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-18, “Oscilloscope Amplitude Accuracy Test 18 Record,” on page 268. A 5 V ac signal from the audio analyzer is measured by both an external multi meter and by the Test Set’s internal oscilloscope.
Performance Tests Oscilloscope Amplitude Accuracy Performance Test 18 4. Set the frequency as shown in the Performance Test Record (PTR). For each setting, perform the following: a. Adjust the level until the digital multimeter reads 5 V. b. Set Controls to Main and adjust the Time/Div on the Test Set to display 2 to 3 cycles of the waveform. c. Set Controls to Marker and press the knob (with the cursor in the Marker To Peak+ field) to move the marker to the peak of the waveform. d.
Performance Tests RF Analyzer Level Accuracy Performance Test 19 RF Analyzer Level Accuracy Performance Test 19 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-19, “RF Analyzer Level Accuracy Test 19 Record,” on page 269. Level accuracy is measured using a system power calibration program that resides on a memory card.
Performance Tests RF Analyzer FM Accuracy Performance Test 20 RF Analyzer FM Accuracy Performance Test 20 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-20, “RF Analyzer FM Accuracy Test 20 Record,” on page 271. The AM/FM test source provides the RF signal with FM. The signal is measured both by the Test Set’s internal RF analyzer and the measuring receiver.
Performance Tests RF Analyzer FM Accuracy Performance Test 20 3. On the audio analyzer: a. Reset the instrument. b. Set the output frequency to 50 Hz. 4. On the Test Set: a. Press Preset. b. Select the INSTRUMENT CONFIGURE screen. c. Set the RF Display field to Freq. d. Select the CDMA GENERATOR screen. e. Set the CW RF Path field to Bypass. f. Select the RF ANALYZER screen. g. Set the Tune Freq to 12.5 MHz. h. Set the Input Port field to Ant. i. Set the IF Filter field to 230 kHz. j.
Performance Tests RF Analyzer FM Distortion Performance Test 21 RF Analyzer FM Distortion Performance Test 21 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-21, “RF Analyzer FM Distortion Test 21 Record,” on page 272. An audio signal from the audio analyzer provides FM for the AM/FM test source. The AM/FM test source provides an RF signal (with FM) to the Test Set’s internal RF analyzer.
Performance Tests RF Analyzer FM Distortion Performance Test 21 b. Set the output frequency to 1 kHz. c. Set the measurement mode to distortion. 4. On the Test Set: a. Press Preset. b. Select the INSTRUMENT CONFIGURE screen. c. Set the RF Display field to Freq. d. Select the CDMA GENERATOR screen. e. Set the CW RF Path field to Bypass. f. Select the RF ANALYZER screen. g. Set the Tune Freq to 400 MHz. h. Set the Input Port field to Ant. i. Set the IF Filter field to 230 kHz. j.
Performance Tests RF Analyzer FM Bandwidth Performance Test 22 RF Analyzer FM Bandwidth Performance Test 22 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-22, “RF Analyzer FM Bandwidth Test 22 Record,” on page 273. An audio signal from the audio analyzer provides FM for the AM/FM test source. The AM/FM test source provides an RF signal (with FM) to the Test Set’s internal RF analyzer.
Performance Tests RF Analyzer FM Bandwidth Performance Test 22 b. Set the output frequency to 1 kHz. 4. On the Test Set: a. Press Preset. b. Select the INSTRUMENT CONFIGURE screen. c. Set the RF Display field to Freq. d. Select the CDMA GENERATOR screen. e. Set the CW RF Path field to Bypass. f. Select the RF ANALYZER screen. g. Set the Tune Freq to 400 MHz. h. Set the Input Port field to Ant. i. Set the IF Filter field to 230 kHz. j. Set the Squelch field to Open. k. Select the AF ANALYZER screen. l.
Performance Tests RF Analyzer Residual FM Performance Test 23 RF Analyzer Residual FM Performance Test 23 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-23, “RF Analyzer Residual FM Test 23 Record,” on page 274. The AM/FM test source provides a CW signal with minimal residual FM. The FM is measured by the Test Set’s internal RF analyzer. Figure 8-28 Setup AM/FM Test Source ANT IN LOW RESIDUAL OUTPUT Procedure 1.
Performance Tests RF Analyzer Residual FM Performance Test 23 3. Read the FM deviation (residual FM) and record the deviation read on the Test Set in the Performance Test Record and compare it to the limits.
Performance Tests Spectrum Analyzer Image Rejection Performance Test 24 Spectrum Analyzer Image Rejection Performance Test 24 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-24, “Spectrum Analyzer Image Rejection (Image) Test 24 Record,” on page 275. This test has two procedures. The first procedure measures the spectrum analyzer’s ability to reject image frequencies.
Performance Tests Spectrum Analyzer Image Rejection Performance Test 24 d. Select the CDMA GENERATOR screen. e. Set the CW RF Path field to Bypass. f. Select the SPEC ANL screen. g. Set the RF In/Ant field to Ant. h. Set the Ref Level field to -25 dBm. i. Set the Span field to 5 kHz. j. Set the Controls field to Marker. k. Set the Marker To field to Center Freq. l. Set the Controls field back to Main. 3.
Performance Tests CDMA Generator Amplitude Level Accuracy Performance Test 25 CDMA Generator Amplitude Level Accuracy Performance Test 25 The amplitude level accuracy of the CDMA generator is measured directly with a power meter. These measurements are made at the top and bottom of the CDMA generator’s vernier range.
Performance Tests CDMA Generator Amplitude Level Accuracy Performance Test 25 4. On the Test Set: a. Press Preset. b. Select the CDMA GENERATOR screen. c. Set the RF Gen Freq field to 836.52 MHz. d. Set the CW RF Path field to I/Q. e. Set the Amplitude to -10 dBm. 5. Set the Test Set to the frequencies and levels listed in the PTR and record the values.
Performance Tests CDMA Generator Modulation Accuracy Performance Test 26 CDMA Generator Modulation Accuracy Performance Test 26 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-26, “CDMA Generator RF In/Out Test,” on page 277. The modulation accuracy of the CDMA generator is directly measured with a vector signal analyzer at the DUPLEX OUT port.
Performance Tests CDMA Generator Modulation Accuracy Performance Test 26 2. On the Vector Signal Analyzer: a. Press the Frequency key. b. Set center frequency to 836.52 MHz. c. Set the span to 2.6 MHz. d. Press the Instrument Mode key e. Press the Digital Demodulation (F4) key f. Press the Demodulation Setup (F5) key g. Press the Demodulation Format (F1) key h. Press the Standard Setups (F7) key. i. Press the CDMA Mobile (F7) key. j. Press the D key. 3. Use the following equation to calculate rho.
Performance Tests CDMA Analyzer Average Power Level Accuracy Performance Test 27 CDMA Analyzer Average Power Level Accuracy Performance Test 27 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-27, “CDMA Generator Modulation Accuracy Test 26 Record,” on page 278. The CDMA average-power-level accuracy is verified by comparing the measured power in a CW signal with the power level measured by a power meter.
Performance Tests CDMA Analyzer Average Power Level Accuracy Performance Test 27 3. On the Test Set: a. Press Preset b. Set the Avg Pwr Units to Watts. c. Set Tune Freq to 881.32 MHz. 4. Record the Avg Pwr reading in the PTR (see Table 9-28, “CDMA Analyzer Average Power Level Accuracy Test 27 Record,” on page 279. 5. Repeat steps 2 and 3 for each of the frequencies and levels listed in the PTR.
Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 28 CDMA Analyzer Channel Power Level Accuracy Performance Test 28 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-28, “CDMA Analyzer Average Power Level Accuracy Test 27 Record,” on page 279. The tuned channel power level accuracy is verified by comparing the measured power in a CW signal with the power level measured by a measuring receiver.
Performance Tests CDMA Analyzer Channel Power Level Accuracy Performance Test 28 2. On the signal generator: a. Set the frequency to 881.32 MHz. b. Set the output level so the measuring receiver reads 11 dBm 3. Push Preset on the Test Set. 4. On the Test Set: a. Change the Avg Pwr field to Chan Pwr. b. Set the Tune Freq to 881.32 MHz c. Select Calibrate under Chn Pwr Cal. 5. Record the Chan Pwr measurement in the PTR, see Table 9-29, “CDMA Analyzer Channel Power Level Accuracy Test 28 Record,” on page 280.
Performance Tests CDMA Analyzer Modulation Accuracy Performance Test 29 CDMA Analyzer Modulation Accuracy Performance Test 29 The purpose of this test is to verify that the Test Set meets the specification limits in PTR (Performance Test Record) Table 9-29, “CDMA Analyzer Channel Power Level Accuracy Test 28 Record,” on page 280. This test verifies the performance of the Test Set’s CDMA analyzer.
Performance Tests CDMA Analyzer Modulation Accuracy Performance Test 29 d. Ensure the CW RF path is set to IQ. e. Ensure the Output Port is set to Dupl. f. Set the Amplitude to −10 dBm. Figure 8-35 CDMA GENERATOR Screen CDMA GENERATOR Avg Pwr ADC FS dBm dB 13.91 RF Gen Freq 881.520000 Amplitude -10.0 MHz Gen Dir Fwd/Rev EQ In/Out dBm Gen Special Normal CW RF Path Bypass/IQ PN Offset 0.00 Output Port RF Out/Dupl Even Sec In Enable/Not Data Source ZeroesIn Audio Gen Mode Data Data Rate 9.
Performance Tests CDMA Analyzer Modulation Accuracy Performance Test 29 2. On the vector signal analyzer: a. Set the center frequency to 881.52 MHz. b. Set the span to 2.6 MHz. c. Press the Instrument Mode key. d. Press the Digital Demodulation (F4) key. e. Press the Demodulation Setup (F5) key. f. Press the Demodulation Format (F1) key. g. Press the Standard Setups (F7) key. h. Press the CDMA Base (F6) key. i. Press the D display button. 3. Use the following formula to calculate rho.
Performance Tests CDMA Analyzer Modulation Accuracy Performance Test 29 232 Chapter 8
9 Performance Test Records Use this chapter to record the results of the performance tests in Chapter 8 , “Performance Tests,” on page 173.
Performance Test Records RF Generator FM Distortion Performance Test 1 Record RF Generator FM Distortion Performance Test 1 Record For test procedure, see “RF Generator FM Distortion Performance Test 1” on page 178. Table 9-1 RF Generator FM Distortion Test 1 Record Level (dBm) RF (MHz) Deviation (kHz) Rate (kHz) FM Distortion Limits (%) Upper −10 10 99 1 0.50 −10 10 5 1 0.50 −10 312.5 5 1 0.50 −10 425 50 1 0.50 −10 501 99 1 0.50 −10 501 50 1 0.50 −10 501 5 1 0.
Performance Test Records RF Generator FM Distortion Performance Test 1 Record Table 9-1 RF Generator FM Distortion Test 1 Record Level (dBm) RF (MHz) Deviation (kHz) Rate (kHz) FM Distortion Limits (%) Upper −10 1000 6 1 0.50 −10 1000 7 1 0.50 −10 1000 8 1 0.50 −10 1000 9 1 0.50 −10 998.401 8 1 0.50 −10 768.001 8 1 0.50 −0 512.001 8 1 0.50 −10 511.601 8 1 0.50 −10 511.201 8 1 0.50 Actual The following entries are for the 2 GHz setup. −10 1700 99 1 1.
Performance Test Records RF Generator FM Accuracy Performance Test 2 Record RF Generator FM Accuracy Performance Test 2 Record For test procedure, see “RF Generator FM Accuracy Performance Test 2” on page 181. Table 9-2 Level (dBm) RF Generator FM Accuracy Test 2 Record RF (MHz) Deviation (kHz) Rate (kHz) FM Deviation Limits (kHz) Lower Upper −10 10 99 1 95.035 102.965 −10 10 3 1 2.845 3.155 −10 312.5 3 1 2.845 3.155 −10 425 50 1 47.750 52.25 −10 501 99 1 95.035 102.
Performance Test Records RF Generator FM Accuracy Performance Test 2 Record Table 9-2 Level (dBm) RF Generator FM Accuracy Test 2 Record RF (MHz) Deviation (kHz) Rate (kHz) FM Deviation Limits (kHz) Lower -10 1000 3 1 Upper 2.845 3.155 Actual The following entries are for the 2 GHz setup. −10 1700 99 1 95.035 102.965 −10 1700 50 1 47.750 52.25 −10 1700 3 1 2.845 3.155 −10 2000 99 1 95.035 102.965 −10 2000 50 1 47.750 52.25 −10 2000 3 1 2.845 3.
Performance Test Records RF Generator FM Flatness Performance Test 3 Record RF Generator FM Flatness Performance Test 3 Record For test procedure, see “RF Generator FM Flatness Performance Test 3” on page 184. Table 9-3 Level (dBm) RF Generator FM Flatness Test 3 Record RF (MHz) Deviation (kHz) Rate (kHz) Computed FM Flatness Limits (dB) Measured Reading (kHz) Computed Results (dB) Lower Reading Computed Upper −10 521 50 1 −10 521 50 0.1 −1 1 −10 521 50 0.
Performance Test Records RF Generator FM Flatness Performance Test 3 Record Table 9-3 Level (dBm) RF Generator FM Flatness Test 3 Record RF (MHz) Deviation (kHz) Rate (kHz) Computed FM Flatness Limits (dB) Measured Reading (kHz) Computed Results (dB) Lower Upper Reading Computed −10 2000 50 0.
Performance Test Records RF Generator Residual FM Performance Test 4 Record RF Generator Residual FM Performance Test 4 Record For test procedure, see “RF Generator Residual FM Performance Test 4” on page 187. Table 9-4 LO (MHz) RF Generator Residual FM Test 4 Record RF (MHz) Residual FM Limits (Hz) Upper 11.5 10 7 101.5 100 7 249.5 248 7 251.5 250 4 401.5 400 4 501.5 500 4 502.5 501 7 512.701 511.201 7 513.101 511.601 7 513.501 512.001 7 626.5 625 7 736.5 735 7 741.
Performance Test Records RF Generator Residual FM Performance Test 4 Record Table 9-4 LO (MHz) RF Generator Residual FM Test 4 Record RF (MHz) Residual FM Limits (Hz) Upper 1001.5 1000 Actual 7 The following entries are for the 2 GHz setup. 201.5 1700 14 501.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record RF Generator Level Accuracy Performance Test 5 Record For test procedure, see “RF Generator Level Accuracy Performance Test 5” on page 190. Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper Actual The following entries are for Procedure 1. DUPLEX OUT 3 −10 −11.500 −8.500 DUPLEX OUT 3 −15 −16.500 −13.500 DUPLEX OUT 3 −20 −21.500 −18.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper DUPLEX OUT 3 −120 −121.500 −118.500 DUPLEX OUT 3 −125 −126.500 −123.500 RF IN/OUT 3 −40 −41.000 −39.000 RF IN/OUT 3 −45 −46.000 −44.000 RF IN/OUT 3 −50 −51.000 −49.000 RF IN/OUT 3 −55 −56.000 −54.000 RF IN/OUT 3 −60 −61.000 −59.000 RF IN/OUT 3 −65 −66.000 −64.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper DUPLEX OUT 687.5 −50 −51.500 −48.500 DUPLEX OUT 687.5 −55 −56.500 −53.500 DUPLEX OUT 687.5 −60 −61.500 −58.500 DUPLEX OUT 687.5 −65 −66.500 −63.500 DUPLEX OUT 687.5 −70 −71.500 −68.500 DUPLEX OUT 687.5 −75 −76.500 −73.500 DUPLEX OUT 687.5 −80 −81.500 −78.500 DUPLEX OUT 687.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper RF IN/OUT 687.5 −100 −101.000 −99.000 RF IN/OUT 687.5 −105 −106.000 −104.000 RF IN/OUT 687.5 −110 −111.000 −109.000 RF IN/OUT 687.5 −115 −116.000 −114.000 RF IN/OUT 687.5 −120 −121.000 −119.000 RF IN/OUT 687.5 −125 −126.000 −124.000 DUPLEX OUT 1000 −10 −11.500 −8.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper DUPLEX OUT 1000 −120 −121.500 −118.500 DUPLEX OUT 1000 −125 −126.500 −123.500 RF IN/OUT 1000 −40 −41.000 −39.000 RF IN/OUT 1000 −45 −46.000 −44.000 RF IN/OUT 1000 −50 −51.000 −49.000 RF IN/OUT 1000 −55 −56.000 −54.000 RF IN/OUT 1000 −60 −61.000 −59.000 RF IN/OUT 1000 −65 −66.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper DUPLEX OUT 1700 −45 −46.500 −43.500 DUPLEX OUT 1700 −50 −51.500 −48.500 DUPLEX OUT 1700 −55 −56.500 −53.500 DUPLEX OUT 1700 −60 −61.500 −58.500 DUPLEX OUT 1700 −65 −66.500 −63.500 DUPLEX OUT 1700 −70 −71.500 −68.500 DUPLEX OUT 1700 −75 −76.500 −73.500 DUPLEX OUT 1700 −80 −81.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper RF IN/OUT 1700 −95 −96.000 −94.000 RF IN/OUT 1700 −100 −101.000 −99.000 RF IN/OUT 1700 −105 −106.000 −104.000 RF IN/OUT 1700 −110 −111.000 −109.000 RF IN/OUT 1700 −115 −116.000 −114.000 RF IN/OUT 1700 −120 −121.000 −119.000 RF IN/OUT 1700 −125 −126.000 −124.
Performance Test Records RF Generator Level Accuracy Performance Test 5 Record Table 9-5 RF Generator Level Accuracy Test 5 Record Port RF (MHz) Level (dBm) Level Limits (dBm) Lower Upper DUPLEX OUT 2000 −115 −116.500 −113.500 DUPLEX OUT 2000 −120 −121.500 −118.500 DUPLEX OUT 2000 −125 −126.500 −123.500 RF IN/OUT 2000 −40 −41.000 −39.000 RF IN/OUT 2000 −45 −46.000 −44.000 RF IN/OUT 2000 −50 −51.000 −49.000 RF IN/OUT 2000 −55 −56.000 −54.
Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record RF Generator Harmonics Spectral Purity Performance Test 6 Record For test procedure, see “RF Generator Harmonics Spectral Purity Performance Test 6” on page 195. Table 9-6 Level (dBm) RF Generator Harmonics Spectral Purity Test 6 Record RF Freq (MHz) Harmonic Number Harmonic Limits (dBc) Upper -10 1 2nd −25.000 -10 1 3rd −25.000 -10 2 2nd −25.000 -10 2 3rd −25.000 -10 5 2nd −25.
Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record Table 9-6 Level (dBm) RF Generator Harmonics Spectral Purity Test 6 Record RF Freq (MHz) Harmonic Number Harmonic Limits (dBc) Upper -10 600 3rd −25.000 -10 700 2nd −25.000 -10 700 3rd −25.000 -10 800 2nd −25.000 -10 800 3rd −25.000 -10 900 2nd −25.000 -10 900 3rd −25.000 -10 1000 2nd −25.000 -10 1000 3rd −25.000 -10 1700 2nd −25.000 -10 1700 3rd −25.
Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record Table 9-6 Level (dBm) RF Generator Harmonics Spectral Purity Test 6 Record RF Freq (MHz) Harmonic Number Harmonic Limits (dBc) Upper -11 50 3rd −25.000 −11 100 2nd −25.000 −11 100 3rd −25.000 −11 200 2nd −25.000 −11 200 3rd −25.000 −11 300 2nd −25.000 −11 300 3rd −25.000 −11 400 2nd −25.000 −11 400 3rd −25.000 −11 500 2nd −25.000 −11 500 3rd −25.000 −11 600 2nd −25.
Performance Test Records RF Generator Harmonics Spectral Purity Performance Test 6 Record Table 9-6 Level (dBm) RF Generator Harmonics Spectral Purity Test 6 Record RF Freq (MHz) Harmonic Number Harmonic Limits (dBc) Upper −12 Chapter 9 2000 3rd Actual −25.
Performance Test Records RF Generator Spurious Spectral Purity Performance Test 7 Record RF Generator Spurious Spectral Purity Performance Test 7 Record For test procedure, see “RF Generator Spurious Spectral Purity Performance Test 7” on page 196. Table 9-7 Spurious Source RF Generator Spurious Spectral Purity Test 7 Record Level (dBm) RF Freq (MHz) Spur Freq (MHz) Spurious Signal Limits (dBc) Upper 3/2 Mixer −10 242 274 −45.000 3/2 Mixer −10 247 259 −45.000 Supply −11 100 100.03 −45.
Performance Test Records RF Generator Spurious Spectral Purity Performance Test 7 Record Table 9-7 Spurious Source RF Generator Spurious Spectral Purity Test 7 Record Level (dBm) RF Freq (MHz) Spur Freq (MHz) Spurious Signal Limits (dBc) Upper 5/4 Mixer −11 221 105 −45.000 5/4 Mixer −11 227 135 −45.000 5/4 Mixer −11 231 155 −45.000 5/4 Mixer −11 237 185 −45.000 Ref 10 MHz −11 165 175 −45.000 Ref 1 MHz −11 150 150.2 −45.000 Ref 1 MHz −11 150 149.8 −45.
Performance Test Records AF Generator AC Level Accuracy Performance Test 8 Record AF Generator AC Level Accuracy Performance Test 8 Record For test procedure, see “AF Generator AC Level Accuracy Performance Test 8” on page 197. Table 9-8 AF Generator AC Level Accuracy Test 8 Record AF Generator Frequency (Hz) Level (mV) AC Level Limits (mV) Lower Upper 1 25000 4000 3885.000 4115.000 1 25000 700 682.500 717.500 1 25000 75 70.000 80.000 1 10000 4000 3885.000 4115.
Performance Test Records AF Generator AC Level Accuracy Performance Test 8 Record Table 9-8 AF Generator AC Level Accuracy Test 8 Record AF Generator 2 Frequency (Hz) 100 Chapter 9 Level (mV) 75 AC Level Limits (mV) Lower Upper 70.000 80.
Performance Test Records AF Generator DC Level Accuracy Performance Test 9 Record AF Generator DC Level Accuracy Performance Test 9 Record For test procedure, see “AF Generator DC Level Accuracy Performance Test 9” on page 198. Table 9-9 AF Generator AF Generator DC Level Accuracy Test 9 Record Level (mV) DC Level Limits (mV) Lower Upper 1 4000 3820.000 4180.000 1 1000 925.000 1075.000 2 4000 3820.000 4180.000 2 1000 925.000 1075.
Performance Test Records AF Generator Residual Distortion Performance Test 10 Record AF Generator Residual Distortion Performance Test 10 Record For test procedure, see “AF Generator Residual Distortion Performance Test 10” on page 199. Table 9-10 AF Generator AF Generator Residual Distortion Test 10 Record Frequency (Hz) Level (mV) Distortion Limits (%) Upper 1 25000 4000 0.125 1 25000 2000 0.125 1 25000 200 0.125 1 10000 4000 0.125 1 10000 2000 0.125 1 10000 200 0.
Performance Test Records AF Generator Residual Distortion Performance Test 10 Record Table 9-10 AF Generator AF Generator Residual Distortion Test 10 Record Frequency (Hz) Level (mV) Distortion Limits (%) Upper 2 260 100 200 Actual 0.
Performance Test Records AF Generator Frequency Accuracy Performance Test 11 Record AF Generator Frequency Accuracy Performance Test 11 Record For test procedure, see “AF Generator Frequency Accuracy Performance Test 11” on page 200. Table 9-11 AF Generator AF Generator Frequency Accuracy Test 11 Record Frequency (Hz) Frequency Limits (Hz) Lower Upper 1 25000 24993.750 25006.250 1 10000 9997.500 10002.500 1 5000 4998.750 500.125 1 2000 1999.500 2000.500 1 1000 999.750 1000.
Performance Test Records AF Analyzer AC Level Accuracy Performance Test 12 Record AF Analyzer AC Level Accuracy Performance Test 12 Record For test procedure, see “AF Analyzer AC Level Accuracy Performance Test 12” on page 201. Table 9-12 Frequency (Hz) AF Analyzer AC Voltage Accuracy Test 12 Record Level (mV) AC Voltage Limits (mV) Lower Upper 15000 5000 4849.550 5150.450 2000 5000 4849.550 5150.450 200 5000 4849.550 5150.450 20 5000 4849.550 5150.450 15000 500 484.550 515.
Performance Test Records AF Analyzer Residual Noise Performance Test 13 Record AF Analyzer Residual Noise Performance Test 13 Record For test procedure, see “AF Analyzer Distortion and SINAD Accuracy Performance Test 14” on page 203.
Performance Test Records AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record AF Analyzer Distortion and SINAD Accuracy Performance Test 14 Record For test procedure, see “AF Analyzer Distortion and SINAD Accuracy Performance Test 14” on page 203.
Performance Test Records AF Analyzer DC Level Accuracy Performance Test 15 Record AF Analyzer DC Level Accuracy Performance Test 15 Record For test procedure, see “AF Analyzer DC Level Accuracy Performance Test 15” on page 204. Table 9-15 AF Generator 1 Level (mV) AF Analyzer DC Level Accuracy Test 15 Record DC Voltage Limits (mV) Lower Upper 5000 4905.000 5095.000 500 450.000 550.
Performance Test Records AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16 Record For test procedure, see “AF Analyzer Frequency Accuracy to 100 kHz Performance Test 16” on page 205. Table 9-16 Frequency (Hz) AF Analyzer Frequency Accuracy to 100 kHz Test 16 Record Frequency Limits (Hz) Lower Upper 20 19.896 20.104 100 99.880 100.120 1000 999.700 1000.300 10000 9997.90 10002.10 100000 99979.9 100020.
Performance Test Records AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17 Record For test procedure, see “AF Analyzer Frequency Accuracy at 400 kHz Performance Test 17” on page 206. Table 9-17 AF Analyzer Frequency Accuracy at 400 kHz Test 17 Record Frequency Difference Limits (kHz) Lower Upper −0.080 0.
Performance Test Records Oscilloscope Amplitude Accuracy Performance Test 18 Record Oscilloscope Amplitude Accuracy Performance Test 18 Record For test procedure, see “Oscilloscope Amplitude Accuracy Performance Test 18” on page 208. Table 9-18 Frequency (kHz) Oscilloscope Amplitude Accuracy Test 18 Record Amplitude Limits (V) Lower Upper 1 6.765 7.377 10 6.765 7.377 50 5.000 10.
Performance Test Records RF Analyzer Level Accuracy Performance Test 19 Record RF Analyzer Level Accuracy Performance Test 19 Record For test procedure, see “RF Analyzer Level Accuracy Performance Test 19” on page 210. Table 9-19 Frequency (MHz) RF Analyzer Level Accuracy Test 19 Record Level Difference Limits (dB) Lower Upper 30 −0.531 0.531 50 −0.531 0.531 100 −0.531 0.531 150 −0.531 0.531 200 −0.531 0.531 250 −0.531 0.531 300 −0.531 0.531 350 −0.531 0.531 400 −0.531 0.
Performance Test Records RF Analyzer Level Accuracy Performance Test 19 Record Table 9-19 Frequency (MHz) RF Analyzer Level Accuracy Test 19 Record Level Difference Limits (dB) Lower Upper 1750 −0.531 0.531 1775 −0.531 0.531 1800 −0.531 0.531 1825 −0.531 0.531 1850 −0.531 0.531 1875 −0.531 0.531 1900 −0.531 0.531 1925 −0.531 0.531 1950 −0.531 0.531 1975 −0.531 0.531 2000 −0.531 0.
Performance Test Records RF Analyzer FM Accuracy Performance Test 20 Record RF Analyzer FM Accuracy Performance Test 20 Record For test procedure, see “RF Analyzer FM Accuracy Performance Test 20” on page 211. Table 9-20 RF Analyzer FM Accuracy Test 20 Record RF (MHz) Deviation (kHz) Rate (Hz) FM Deviation Limits (kHz) Lower Upper 12.5 1 50 0.960 1.040 12.5 1 1000 0.960 1.040 12.5 1 25000 0.960 1.040 12.5 10 50 9.600 10.400 12.5 10 1000 9.600 10.400 12.5 10 25000 9.
Performance Test Records RF Analyzer FM Distortion Performance Test 21 Record RF Analyzer FM Distortion Performance Test 21 Record For test procedure, see “RF Analyzer FM Distortion Performance Test 21” on page 213. Table 9-21 FM Deviation (kHz) RF Analyzer FM Distortion Test 21 Record FM Distortion Limits (%) Upper 5 1.000 25 1.000 75 1.
Performance Test Records RF Analyzer FM Bandwidth Performance Test 22 Record RF Analyzer FM Bandwidth Performance Test 22 Record For test procedure, see “RF Analyzer FM Bandwidth Performance Test 22” on page 215. Table 9-22 RF Analyzer FM Bandwidth Test 22 Record FM Deviation Difference Limits (dB) Upper Actual 3.
Performance Test Records RF Analyzer Residual FM Performance Test 23 Record RF Analyzer Residual FM Performance Test 23 Record For test procedure, see “RF Analyzer Residual FM Performance Test 23” on page 217. Table 9-23 RF Analyzer Residual FM Test 23 Record FM Deviation Limits (Hz) Upper Actual 7.
Performance Test Records Spectrum Analyzer Image Rejection Performance Test 24 Record Spectrum Analyzer Image Rejection Performance Test 24 Record For test procedure, see “Spectrum Analyzer Image Rejection Performance Test 24” on page 219. Table 9-24 Spectrum Analyzer Image Rejection (Image) Test 24 Record RF Generator Frequency (MHz) Spectrum Analyzer Frequency (MHz) Image Response Limits (dB) Upper 613.6 385.0 −50 873.6 645.0 −50 883.6 655.0 −50 1023.6 795.0 −50 1000.0 771.4 −50 576.
Performance Test Records Spectrum Analyzer Image Rejection Performance Test 24 Record Table 9-25 Spectrum Analyzer Image Rejection (Residual) Test 24 Record Spectrum Analyzer Center Frequency (MHz) Residual Response Limits (dBm) Upper 500.
Performance Test Records CDMA Generator Amplitude Level Accuracy Performance Test 25 Record CDMA Generator Amplitude Level Accuracy Performance Test 25 Record For test procedure, see “CDMA Generator Amplitude Level Accuracy Performance Test 25” on page 221. Table 9-26 RF (MHz) CDMA Generator RF In/Out Test Level (dBm) Measured Level Limits (dBm) Lower Upper 836.52 −10 −11.5 −8.5 836.52 −11 −12.5 −9.5 1851.25 −11 −12.5 −9.5 1851.25 −12 −13.5 −10.
Performance Test Records CDMA Generator Modulation Accuracy Performance Test 26 Record CDMA Generator Modulation Accuracy Performance Test 26 Record For test procedure, see “CDMA Generator Modulation Accuracy Performance Test 26” on page 223. Table 9-27 RF (MHz) CDMA Generator Modulation Accuracy Test 26 Record Level (dBm) Measured EVM (%rms) Calculated Rho Lower Limit 836.52 −10 0.96 1851.25 −10 0.
Performance Test Records CDMA Analyzer Average Power Level Accuracy Performance Test 27 Record CDMA Analyzer Average Power Level Accuracy Performance Test 27 Record For test procedure, see “CDMA Analyzer Average Power Level Accuracy Performance Test 27” on page 225. Table 9-28 RF (MHz) CDMA Analyzer Average Power Level Accuracy Test 27 Record Level (mW) Measured Level Limits (mW) Lower Upper Actual 881.52 4 3.65 4.35 881.52 10 9.20 10.80 1931.25 4 3.65 4.35 1931.25 10 9.20 10.
Performance Test Records CDMA Analyzer Channel Power Level Accuracy Performance Test 28 Record CDMA Analyzer Channel Power Level Accuracy Performance Test 28 Record For test procedure, see “CDMA Analyzer Channel Power Level Accuracy Performance Test 28” on page 227. Table 9-29 RF (MHz) CDMA Analyzer Channel Power Level Accuracy Test 28 Record Level (dBm) Measured Level Limits (dBm) Lower Upper 881.52 11 10.25 11.75 881.52 6 5.25 6.75 881.52 1 0.25 1.75 881.52 −4 −4.75 −3.25 881.
Performance Test Records CDMA Analyzer Modulation Accuracy Performance Test 29 Record CDMA Analyzer Modulation Accuracy Performance Test 29 Record For test procedure, see “CDMA Analyzer Modulation Accuracy Performance Test 29” on page 229. Table 9-30 RF (MHz) CDMA Analyzer Modulation Accuracy Test 29 Record Level (dBm) Calculated Rho Error Lower Limit Upper Limit 881.52 −10 −0.005 0.005 1931.25 −10 −0.005 0.
Performance Test Records CDMA Analyzer Modulation Accuracy Performance Test 29 Record 282 Chapter 9
10 Block Diagrams This chapter contains block diagrams and descriptions that focus on how the Test Set generates signals and makes measurements. It also has I/O signal and pin number information that can be used to help isolate a problem to the assembly level if the Test Set’s diagnostic programs are unable to do so.
Block Diagrams Introduction Introduction Shown in Figure 10-1 on page 285 is a block-diagram overview of the Test Set.
ANT IN Input Attenuator OPP Receiver & Demod IF (FM, AM, SSB) A2A21 Downconverter A2A115 RF IN/OUT Spectrum Analyzer A2A20 Audio Analyzer SCOPE MONITOR OUT A2A40 A2A80 AUDIO IN Measurement (Scope) (Voltmeter) (Counter) 100 W Attenuator A2A200 RPP Output Attenuator EXT AC Input RF I/O A2A130 Signaling Analyzer A2A32 LO/IF Conversion A2A120 Regulators A3A1 Power Supplies EXT SCOPE TRIGGER IN A2A33 Audio Analyzer Splitter RF Analyzer DUPLEX OUT Volume (Bandpass Filters) (Distortion) P
Block Diagrams RF Input/Output Section RF Input/Output Section RF Power Measurement An RF power measurement can only be made by supplying a signal to the RF IN/OUT port of the Test Set. See Figure 10-2 on page 287. A power splitter then splits the signal between an RF analysis path and a power measurement path. The power detector has a direct path to the A2A36 Receive DSP where average power measurements are made.
Figure 10-2 J4 SMA J5 OVER POWER PROTECT 0-35 dB ATTEN 50 100W ATTENUATOR A2A200 50 -22 dB HIGH POWER PAD 16 dB SMA SMA DET_OUT TO SMB RCV_DSP POWER DETECTOR 4V PK -12 dB J3 J7 50 50 -6 db TO RF IN/OUT SMA 0 dB 5 dB STEPS CONTROL 50 SMA DC Block J6 TO DUPLEX OUT SMA REVERSE POWER PROTECT ATTENUATOR DRIVE LOGIC 50 TO DOWNCONVERTER RF Input/Output Assembly, A2A130 Chapter 10 FROM ANT IN 7 J2 CAL EEPROM ANALOG MUX GND +15V +12V 5 dB STEPS -12V SMA 0-125 dB STEP ATTEN
Block Diagrams RF Analyzer Section RF Analyzer Section Frequency Conversion The A2A115 Downconverter, see Figure 10-3 on page 290, produces an IF of 114.3, 385.7 or 614.3 MHz. The LO is provided by the A2A22 Receiver Synthesizer, see Figure 10-4 on page 291. The IF frequencies developed are as follows in Table 10-1. Table 10-1 IF Frequencies Input RF (MHz) 1st LO (MHz) IF (MHz) 0 to 385.7 614.7 to 1000 614.3 385.7 to 800 500 to 914.3 114.3 800 to 1000 685.7 to 885.7 114.3 1400 to 2200 1014.
Block Diagrams RF Analyzer Section Spectrum Analysis The LO on the A2A20 Spectrum Analyzer is swept across the span by the Controller, see Figure 10-6 on page 293. The LO starts sweeping when the oscilloscope circuits on the A2A33 Measurement board trigger the display sweep to start. As the LO sweeps, the spectrum analyzer filters and then amplifies the IF signal in a logarithmic detector so the signal voltage will be proportional to the log of power.
Figure 10-3 3 dB 2-12 dB PAD 1400 385.7 MHz 2200 MHz TUNE 3 TUNE 2 SMA FROM RF/IO 1 +13 dBm ATTEN SET TO MUX DOUBLED_LO_LEVEL _ -10 dBm < 1200-1620 MHz TO MUX HIGH_BAND_DET X2 5 dB ATTEN 1826-2647 MHz 1826-2647 150 MHz PINS 1600-2000 MHz PINS 386 MHz 150 MHz J3 2-12 dB +12 dB 6 dB PAD 8 dB < _ -16 dBm 600 1000 MHz 700 MHz TUNE 1 TUNE 3 ATTEN SET BPF SEL LB_RF_DIAG +7 dBm MIN 614.
Block Diagrams RF Analyzer Section Figure 10-4 Receiver Synthesizer Assembly, A2A22 RECEIVER SYNTHESIZER ASSEMBLY, A2A22 1500MHz REF PRESENT GAIN CTRL 4 REF PRESENT DET 27dB 14dB O 27dB OUT OF LOCK DET -..- 2 BUFFER LOOP CONTROL GAIN CONT CONTROL 4 FROM MEAS OUT OF LOCK EN/I D REF PRESENT CK SWP STRT RCVR GND -12.4 A +5.1 A +12.4 A 1MHz FROM REF +40V +43.
Figure 10-5 SQUELCH LVL IF FILTER SELECT OFFSET ZERO PRESET X +7 dBm +7 dBm 10.7 MHz CF 14 dB GAIN INV1 AMP AM DEMOD 0 dB 500 MHz LO DEMOD OUT SELECT SQUELCH LEVEL ALC ON/OFF IF1 FILTER SELECT IF1 SELECT TRACKING SSB DEMOD 125 MHz TO SQUELCH 300 kHz LPF SQUELCH FREQ BFO ON/OFF DEMOD OUTPUT SELECT 10M Hz REF EN/I GND -12.4 +5.1 10 MHz REF TO SSB BFO & FM DEMOD +12.
CAL EN BW 114.3 MHz BPF PAD 11.26 MHz PAD -8 dB +8 dB VARIABLE GAIN BW O, 10, 20 dB Figure 10-6 GAIN 20 dB GAIN TEMP X COMP Spectrum Analyzer Assembly, A2A20 Chapter 10 1 MHz BW TUNE TC 110 MHz +7 dBm (TO SCOPE) LOG AMP LOOP BW 500Hz 3 16/17 0, 5, 10 dB TEMP COMP BW TUNE DACS (3) GAIN CAL EN TUNE +2 OUT OF LOCK CAL EN -8 dB BW +8 dB CYCLE SLIP VARIABLE GAIN RUN IO SYNTH 3 GAIN DAC TUNE GAIN NC CONTROL SA_SCP3 SA_SCP2 GND +5.
Block Diagrams Audio Analyzer Section Audio Analyzer Section Input Level Control Switchable gain amplifiers on the A2A80 Audio Analyzer #1 (see Figure 10-7 on page 295) and A2A40 Audio Analyzer #2 (see Figure 10-8 on page 296) assemblies keep the audio input signal within a range suitable for the detectors. AC and DC Level Measurements Detected voltages from the Peak+, Peak −, and RMS detectors are measured on the A2A33 Measurement assembly.
Figure 10-7 FILTER 2 SELECT FILTER 1 SELECT LF INPUT SELECT 50 Hz 300 Hz FILTERED AUDIO OUT 0/20/40 GAIN AMP AUX 1 300 Hz 3 kHz A3A1 OPT 15 kHz TO AUDIO ANALYZER 2 AUX 2 MON OUT FROM MOD DIST AUX 3 FREQ CNT FIL ID 1 FIL ID 2 PEAK DET INPUT VOLTAGE MEAS AUDIO IN LO TO VOLTMETER RESET PK + - FIL 2 SEL FIL 1 SEL GAIN=1 LF GAIN 1 FLOT/GND INP SEL +- 10 AUDIO IN HI INPUT PEAK VOLTAGE TO MEASUREMENT A3A2 A3A3 OPT AUX 4 Audio Analyzer 1, A2A80 Chapter 10 FROM RCVR DEMOD DC-25 kHz
3 PIN KEYBOARD SPKR 8 Ohms TO MEAS POS PEAK VOLTAGE OUT 100 kHz -PEAK 0/10/20/30 HI/LOW BEEP AUDIO MEAS TO VOLTMETER NEG PEAK VOLTAGE OUT SETTLE RESET RMS DET KEYBOARD PRE-NOTCH RMS + - TIME CONST 212 Hz TIME CONST 0.1 0/20 dB/40 dB PK DET RESET PEAK EXP SEL PK DET SEL FREQ.
Figure 10-9 MEASUREMENT ASSY. CRT_MEAS_BUS A2A33 5 SIGNAL TRIGGER FROM SIG. SRC & ANAL. 16 7 EXT. TRIGGER 0 TO 5V (R.P.) I/O FROM CONTROLLER SCOPE RAM GREF_CNT_INOUT AUDIO CNT A-D CNTR MUX DIGITAL CONTROL STATEMACHINE ANALOG MEAS 700 kHz IF CNT 20 MHz FROM REF SECT +10 dBm GAIN & OFF SET S C O P E M U X TRIG_IN AUDIO OUTPUT (FROM AUDIO ANALYZER 2) SA_SCP SA_SCP2 SA_SCP3 DET_LO IN_VOLT TO SPECT. ANALYZER FROM RFIO +5 ..2 -12.4 +12.
Figure 10-10 SIGNALING SOURCE & ANALYZER ASSEMBLY, A2A32 GATED BUS FROM MEMORY SBRC INTFC UPC i8051 E P R O M RAM LFS1 NSM DIAG DAC LFS2 GLUE LFS GND PROCESSING -12.4 +5.1 +12.4 GND GND ANALOG FILTERS GND DIGITAL SIGNALING AUDIO FROM AUDIO ANALYZER 2 D B A GND TRIGGER TO SCOPE Block Diagrams Audio Analyzer Section DAC 12 MHz Signal Source & Analyzer Assembly, A2A32 298 DIAG 6.
Block Diagrams CDMA Analyzer Section CDMA Analyzer Section IF Conversion To down convert the CDMA the signal, the 114.3 MHz IF is mixed with a 110.6136 MHz LO to produce a 3.6864 MHz IF in the A2A120 LO IF/IQ Modulator assembly, see Figure 10-11 on page 300. The oscillator that produces the LO signal is phase locked to a 10 MHz signal from the A2A100 CDMA Generator Reference assembly, see Figure 10-13 on page 303. CDMA Signal Analysis The 3.
Block Diagrams CDMA Analyzer Section Figure 10-11 LO IF/IQ Modulator Assembly, A2A120 LO IF Conversion POWER TO IQ MODULATOR TO RECEIVER DSP 3 SMB 3.6864 MHz IF PWR +5 +12 -12 -5 3.6864 MHz 7 MHz .2 dB 15.6 MHz NOTCH X SMB (FROM CDMA GEN/REF) S E R 15 I A L 110.6136 MHz 10 MHz REF IN 114.3 IF +10 O 8/9 LOOP -..
Figure 10-12 RECEIVE DSP ASSEMBLY, A2A36 100 ohm SMB DET_OUT FROM RF IO ASSY 33 MHz 256K FAST RAM -10 TO +30 dB GAIN 8 MHz 12 12 BIT ADC DE-MUX 1 INTO 1 NC SERIAL PORT 1 6 SERIAL PORT 2 6 NC 6 TCLKO/1 2 12 TO 24 32 SMB PRIMARY BUS DATA XF1 INTMED MUX Fs TMS320C30 ADDR 24 SAMPLE CLOCK GENERATOR NC DSP 3 Fs/2 EXT Fs SMB (FROM CDMA GEN/REF) D_RCV_ DSP_TRIG RESET NC ADDR DECODE EXP BUS DATA LATCHES (4) 1 DIAG NC Receive DSP Assembly, A2A36 Chapter 10 128K FLASH EPROM 31
Block Diagrams CDMA Generator Section CDMA Generator Section Data Generation The A2A34 Data Buffer, see Figure 10-14 on page 304, generates or buffers external data that emulates a CDMA traffic channel and outputs this data to the A2A100 CDMA Generator Reference, see Figure 10-13 on page 303. The CDMA Generator Reference assembly converts the data into I and Q drive signals and sends it back to the Data Buffer to be summed with calibrated noise sources.
TO IQ MODULATOR QUAD ADJ TO DATA BUFFER I SMB QUADRATURE 8 Q I_OFFSET 8 Q_OFFSET 3 dB MOD_DATA I_OUT (9.0) REV Q_OUT (9.0) EVEN_SEC SYNC CKT FWD ASIC LOGIC TO DATA BUFFER CASS_STROBE 2_SEC D_RCV_DSP_TRIG TO RECEIVE DSP SER_CLOCK 80_MS 10 PIN N.C. 20_MS 26.67_MS SER_DATA TRIGGER QUALIFIER IN 4X CHIP TO RECEIVE DSP 1.2288 MHz OUT CHIP CLK SIDE PANEL FRAME CLOCK OUT 4X CHIP SMB 19.
Figure 10-14 TO IQ MODULEATOR I SMB SMB SMB I 16X CHIP Q SIGNAL CONTROL DAC GAUSSIAN TABLE/ BUFF/MODNOISE CONFIG I SIGNAL CONTROL FROM MEMORY/ SBRC PARALLEL OUTPUTS DATA BUFFER DAC I SIGNAL GAIN DELTA 128Kx8 128Kx16 FLASH SRAM DAC MODNOISE BUFF CLOCK/SYNC FROM GEN/REF BD DATA BUFFER CONTROL SERIAL BUS EMO SERIAL s_CLK s_DATA I.O.
Block Diagrams Audio Generator Section Audio Generator Section Waveform Generation The A2A32 Signal Source and Analyzer, see Figure 10-15 on page 306, gets frequency and wave shape information from the Controller. Waveform values are calculated real-time by a digital waveform synthesis IC. The LFS1 output is always a sine-wave. The LFS2 output is a sine-wave unless one of the function generator waveforms is selected, or signaling is selected from the front panel.
Figure 10-15 SIGNAL SOURCE & ANALYZER ASSEMBLY, A2A32 GATED BUS FROM MEMORY SBRC INTFC UPC i8051 E P R O M RAM LFS1 NSM DIAG DAC LFS2 GLUE LFS GND PROCESSING GND GND ANALOG -12.4 +5.1 +12.4 FILTERS GND DIGITAL SIGNALING AUDIO FROM AUDIO ANALYZER 2 D B A GND TRIGGER TO SCOPE Block Diagrams Audio Generator Section DAC 12 MHz Signal Source & Analyzer Assembly, A2A32 306 DIAG 6.
Figure 10-16 NC NC NC IO 10 TO MIC ON/OFF (MIC AMPL) NC AUDIO MONITOR SELECT MIC AUDIO INPUT MON OUT TO AUDIO ANALYZERS XMTR KEY MOD LVL1 MOD LVL0 (1, 0.1) AC/DC ANALOG MODULATION INPUT (SIDE PANEL) LFS1 LVL1 LFS2 LVL0 PRE-EMP11 LFS1 (FROM SIGNALING SOURCE) + - FM MOD POLARITY (1, 0.1) 150 kHz S.P. AUDIO OUT + DAC S.P. GND KEY IN KEY OUT (1, 0.1) B A <1W Z OUT 307 Block Diagrams Audio Generator Section -12.4 B EN/I D CK GROUP SERIAL I/O GNDA AUD MON SEL +5.1 MOD LVL I.
Block Diagrams RF Generator Section RF Generator Section Frequency Generation The A2A25 Signal Generator Synthesizer (Figure 10-17 on page 310) develops a 500 MHz to 1000 MHz signal which is phase-locked to the 200 kHz reference from the A2A23 Reference Assembly (Figure 10-21 on page 315). An out-of-lock indicator LED lights if the phase-lock-loop is out-of-lock. When you turn the Test Set’s power on, the LED lights for a few seconds then goes out. If it stays on or comes on again, the loop is out-of-lock.
Block Diagrams RF Generator Section Level Control The A2A44 Output Section assembly (Figure 10-19 on page 312) has an automatic-level-control (ALC) loop that acts as a vernier control of RF level between −2 and +9 dBm. A step attenuator in the A2A130 RF Input/Output assembly takes the level down to −127 dBm (−137 dBm at the RF IN/OUT connector) in 5 dB steps. Assemblies that affect output level calibration have factory-generated calibration data stored in the Test Set’s EEPROM.
Figure 10-17 SIGNAL GENERATOR SYNTHESIZER ASSEMBLY, A2A25 DELAY COMPENSATION FILTER OUT OF BAND FM GAIN CTRL 8 1500MHz 14dB OUT OF BAND FM DAC REF PRESENT DET OUT-OFLOCK DET 12 f IN SWP GAIN CONT 2 4 SDFM INTERFACE A-D 3 3 F(s) 3 CYCLE SLIP OUT OF LOCK ACFM/DCFM I.O. FM ON/OFF REF PRESENT GROUP SERIAL I/O EN/I D FROM MEAS 12 8 CK -12.4 A A A GND +12.4 P/O MOTHERBOARD A2A1 +5.1 FM MOD FROM MOD DISTR 4V=100 kHz DC - 25 kHz Z OUT < 10W +40 V Chapter 10 FROM REF +43.
Block Diagrams RF Generator Section Figure 10-18 IQ Modulator Assembly (Part of LO IF/IQ Modulator Assembly), A2A120 I/Q MODULATOR, A2A120 SMB 14 dB SMB RF IN RF OUT RF OUT 14 dB 1 GHz SMB Chapter 10 Q DRIVE I-DRIVE DRIVE QUADRATURE I/Q MOD ASSEMBLY PWR +12 V, +12V AUX SMB Q IN I IN SMB GEN/REF RF IN 2 FROM LO/IF DATA BUFFER 311
Figure 10-19 OUTPUT SECTION ASSEMBLY, A2A24 LPF 1 GHz BPF LO AMP 3 dB PAD AMP IF X AMP AMP AMP 300 MHz 1 GHz ON/OFF RF TEMP COMP ALC LOOP INTEGRATOR 2 4.5 dB PAD +- 2 REF DET MOD PERIODIC CAL OUTPUT LVL AM LVL AM DIST ALC BW 3 0 V REF. TF TUNE DAC AM MODULATION 3 5 UPCNV_IN +40V CK TO MEAS EN/I A DIAG 1GHz LO CARRIER LEVEL REF I.O. D +43.5 A MUX GND -12.4 7 6 A 4 +5.1 2 OPEN ACL DRIVE +12.
Figure 10-20 UPCONVERTER ASSEMBLY, A2A110 < 1000 MHz J1 <+10 dBm 50 1710-1890 MHz 800-1000 MHz UPCNV_OUT TO RF I/O SMC SMA -10 dBm 1840-2000 MHz +8 dBm DAC DAC SMB 1.5-3 GHz AMP J3 UPCNV_REF (FROM REF) . .- 4 -2 dBm 20 MHz O + f A(S) - CONTROL MEAS_CHIRP_TRIG VOLTAGE MUX J2 LO-SPEED I.O.
Block Diagrams Reference/Regulator Section Reference/Regulator Section Reference All frequencies are derived from a 10 MHz reference which can come from an external reference or from a 10 MHz crystal oscillator on the A2A23 Reference assembly. There are two versions of the Reference assembly. The standard Reference assembly has a temperature compensated crystal oscillator (TCXO), and the Option 005 (High Stability Time Base) Reference assembly has an oven controlled crystal oscillator (OCXO).
Figure 10-21 REFERENCE ASSEMBLY, A2A23 10MHz TCXO 2 DACS OR OPTIONAL OCXO FREQ ADJUST 1GHz VCO LOCK 1GHz Reference Assembly, A2A23 Chapter 10 S Y N T H +50 500 kHz HPF 10MHz OUT-OF-LOCK OUT-OF-LOCK 10 MHz REF IN EXT REF X2 FREQ ARE < -90dBc SPURS > 5K OFF 10M (RCVR) < -110 dBc > 5 kHz DOUBLER LO 1000MHz .20M +10M REFS OUT: 1000 MHz ON/OFF 1000 MHz ON/OFF OVERRIDE +2 10-20MHz +10/ OSC FREQ +50 I.O.
Figure 10-22 POWER SUPPLY REGULATOR ASSEMBLY, A3A1 J1 16-PIN RIBBON CONNECTOR POWER SUPPLY INPUT/OUTPUT J6 20-PIN MINI FIT JR. CONNECTOR POWER SUPPLY INPUT/OUTPUT +12 ALDC REGULATOR PR–158 W 2-SPEED FAN REGULATOR PR-0.81 W T HI > –5° C +5 D REGULATOR PR-2.94 W +5 A REGULATOR PR-1.69 W +15 V @ 315 mA J5 16-PIN MINI FIT JR. CONNECTOR TO MOTHER BOARD +12 A REGULATOR PR-4.4 W +12.37 V @ 1.62 A +5.11 V @1.90 A +5.11 V @ 3.30 A +9.0 V 5.20 mA –12.37 V @ 1.75 A –13.
Block Diagrams Instrument Control Section Instrument Control Section Digital Control The Test Set’s Digital Control is driven by two assemblies: • A2A30 Memory/SBRC • A2A31 Controller The controller receives user control information by either the A2A70 Control Interface or by the front panel. Operating firmware on the A2A30 Memory/SBRC is then used by the A2A31 Controller to generate digital control for the Test Set.
RAM DAUGHTER BD E6380-20114 71285 DECODER DIVIDER MSC_REG LITHUM BATTERY CR2477 BUS TRANSCEMERS ACE TL16PIR552 FROM MEAS BD SBRC_BUS TO RF MODULES BATTERY MANAGER USER_BTTY CLOCK 22.
Figure 10-24 CONTROLLER ASSEMBLY, A2A31 HW LEADS RST ERR DONE CLOCK CLOCK & DIVIDER 40MHz CPU MC68020 20MHz HEAP RAM TC551001 1MB DIAG LEADS CRT_MEAS_BUS CTRL_IFACE_BUS GATED_BUS KYBD_RPG_BUS INTERRUPTS CPU_BUS RESET Controller Assembly, A2A31 Chapter 10 BUS BARN FPGA XC5210 MSC_REGS IRQ_MGR BUS_MUX KYPD/RPG_FSM GATED_BUS OFF_BD_DSACK BUS_DECODER SWISS ARMY KNIFE EPM71285 MORE CLOCKS DECODER DSACK RESET BERR SUPPLY VOLTAGE SUPERVISOR MAX700 FW FLASH ROM 28F-016 8MB FPU MC68882 20MHz TRI
Block Diagrams Instrument Control Section 320 Chapter 10
A Error Messages 321
Error Messages General Information About Error Messages General Information About Error Messages Several types of messages may be displayed on the Test Set’s screen. Error messages usually appear at the top of the start-up or default screen as shown in Figure A-1. Figure A-1 Error Message Location One or more self tests failed. Error code: 0080 CDMA ANALYZER Avg Pwr RF Channel 25 N AMER PCS dBm Pwr Zero Zero ADC FS Pwr Intvl Analyzer 5.
Error Messages General Information About Error Messages The following paragraphs give a brief description of each message format and direct you to the manual to look in for information about error messages displayed in that format. NOTE BEEPER OPERATION: Messages are always accompanied by a BEEP from the internal speaker, unless the Beeper field on the INSTRUMENT CONFIGURE screen is set to Off.
Error Messages Power-Up Self-Test Error Messages Power-Up Self-Test Error Messages The following message is typical of an error message you might encounter on the Test Set’s power-up. One or more self tests failed. Error code: 0080 In this example, the hexadecimal code 0080 corresponds to the error message “Keyboard Failure (stuck key).” For examples of other power-up error messages, see “Reading Front Panel or GPIB Codes” on page 54.
Error Messages Diagnostics Messages Diagnostics Messages The following message may occur when initiating and running the Functional Diagnostics program. Direct latch write occurred. Cycle power when done servicing. For other diagnostic messages see “Frequently Encountered Diagnostic Messages” on page 73. When a measurement is out of limits, a message is displayed at the end of the test which indicates the following: • Suspected faulty assembly.
Error Messages Calibration Download Failure Error Message Calibration Download Failure Error Message The following message occurs at powerup when the downloading of calibration data is unsuccessful. Cal file checksum incorrect. File reset to default values. It indicates that the calibration data is corrupt, and although the Test Set will function, measurements will be inaccurate.
Error Messages Flash ROM Firmware Upgrade Error Messages Flash ROM Firmware Upgrade Error Messages Test Set’s firmware is stored in flash ROMs. With flash ROMs, the firmware can be quickly upgraded with new firmware from a memory card. It is not necessary to open the Test Set and replace individual ICs. Should problems arise in the process of uploading the new firmware, the user is notified by messages on the display which state the situation and suggest any actions to be taken.
Error Messages Flash ROM Firmware Upgrade Error Messages Programming Voltage Error The programming voltage is supplied to the flash ROMs from the power supply through the Controller assembly. The fault is most likely on the Controller but can be caused by the Filter/Regulator assembly. ROM Checksum Error With the new firmware loaded into the Test Set’s flash ROMs, the checksum on the ROM is tested. A faulty checksum is most likely caused by the flash ROMs themselves or possibly the controller circuits.
Error Messages Self-Calibration Error Messages Self-Calibration Error Messages Voltmeter Self Calibration Failed. Error = 223, 0x0000ffff (EXAMPLE) The example noted above is one of many messages that may occur during self-calibration. When the Test Set is powered up and at timed intervals for certain measurements, the Test Set calibrates itself internally. Calibration usually takes 20 to 30 ms.
Error Messages Text Only Error Messages Text Only Error Messages Text only error messages are generally associated with manual operation of the Test Set. Text only error messages can also be displayed while running the Test Set’s built-in diagnostic or calibration utility programs. Diagnostic messages are described in "Frequently Encountered Diagnostic Messages" on page 73. Text only error messages take the form: This is an error message.
Error Messages Positive Numbered Error Messages Positive Numbered Error Messages Positive numbered error messages usually occur when trying to save or retrieve an IBASIC file, or when trying to run a faulty IBASIC program. Refer to the Agilent Instrument BASIC User’s Handbook for information on IBASIC error messages.
Error Messages IBASIC Error Messages IBASIC Error Messages IBASIC Error Messages are associated with IBASIC language operation. IBASIC error messages can have both positive and negative numbers (but always start with "IBASIC Error:"). Refer to the Agilent Instrument BASIC User’s Handbook for information on positive numbered error messages.
Error Messages GPIB Error Messages GPIB Error Messages GPIB Error Messages are associated with GPIB operation. Refer to the Agilent 8935 Syntax Reference Guide for information on GPIB error messages. NOTE HP-IB and GPIB are used interchangably throughout this manual and all E6380A documentation. GPIB error messages take the form: HP-IB Error: -XX error message or HP-IB Error error message For example: HP-IB Error: -410 Query INTERRUPTED. or HP-IB Error: Input value out of range.
Error Messages Non-Recoverable Firmware Error Non-Recoverable Firmware Error This error occurs when the Test Set encounters a condition that the firmware doesn’t understand - causing the Test Set to halt operation until power is cycled. The message appears in the center of the Test Set’s display and (except for the two lines in the second paragraph) has the form: Non-recoverable firmware error.
Error Messages Non-Recoverable Firmware Error Use the following procedure to re-enter the three calibration factors that were erased when RAM is cleared. Use the GENERATOR ANALYZER screen keys (to the left of the cursor control knob) to access the required screens. 1. Access the RF GENERATOR screen and select DC FM Zero (under the FM Coupling field). 2. Disconnect any cables from the ANT IN or RF IN/OUT connectors. 3. Access the RF ANALYZER screen and select Zero under the TX Pwr Zero field. 4.
Error Messages Non-Recoverable Firmware Error 336 Appendix A
Index Numerics 6 kHz BPF. See Audio Filters (A2A80A1, A2A80A2) A A1. See Front Panel assembly (A1) A1A1. See Display assembly (A1A1) A1A2. See Keypad assembly (A1A2) A1A3. See RPG assembly (A1A3) A2. See PC Board assemblies (A2) A2A1. See Motherboard assembly (A2A1) A2A10. See PCMCIA assembly (A2A10) A2A100. See Gen Ref assembly (A2A100) A2A110. See Upconverter assembly (A2A110) A2A115. See Downconverter assembly (A2A115) A2A120. See LO IF/IQ Mod assembly (A2A120) A2A130.
Index calibration. See periodic adjustments calibration data how to recover, 81, 158 loss of, 81, 158 storage locations, 159 troubleshooting, 81, 158 calibration factors, 162 calibration, internal, 329 carrier feedthrough, minimizing, 170 CDMA Diagnostics. See diagnostics Channel Power Level Accuracy (CDMA Analyzer) performance test, 227 cleaning air filter, 95 assemblies, 95 clearing RAM, 89 clock, real-time, 95 C-MESS FLTR. See Audio Filters (A2A80A1, A2A80A2) codes.
Index "Voltmeter Self Calibration Failed...
Index P parts ordering information, 46 parts identification Attenuator assembly (A2A200), 142 Audio 1 assembly (A2A80), 141 Audio 2 assembly (A2A40), 140 Audio Filters (A2A80A1, A2A80A2), 141 Batter Holder assembly (A3A4), 147 cables, 148, 149 Control Interface assembly (A2A70), 143 Controller assembly (A2A31), 141 covers, 138 Data Buffer assembly (A2A34), 141 Display assembly (A1A1), 139 Display Driver assembly (A2A50), 140 Downconverter assembly (A2A115), 144 Fan assembly (A3B1), 147 Front Panel assembly
Index power cables, 23 power supply LEDs, 52 test points, 53 Power Supply assembly (A3A2) disassembly, 127 parts identification, 147 power supply regulator.
Index Gen Ref assembly (A2A100), 78 manual procedures, 75 Rcvr Synth (A2A22), 80 Reference (A2A23), 80 RF analyzer, 82 RF source section, 84 Sig Gen Synth (A2A25), 80 U Upconverter assembly (A2A110) block diagram, 313 disassembly, 118 parts identification, 144 upgrades firmware, 40 V Value (hex) field, SERVICE screen, 89 Variable Frequency Notch Filter adjustment, 168 verification after repair, 90 See Also performance tests video output signal, 53 Voltmeter Connection field, SERVICE screen, 87 Voltmeter Re
