Specifications

Chapter 6 159
Test Parameters
Parameter descriptions
42 TX ORFS Ramping Offsets
NOTE This parameter is not used with the HP/Agilent 8922 unless a spectrum
analyzer is installed.
This parameter allows you to select the frequency offsets to be used
when testing the output-RF-spectrum (ORFS) due to ramping (the RF
pulse rise and fall).
• 0010 = 1.2 MHz
• 0100 = 0.6 MHz
• 1000 = 0.4 MHz
• 1110 = All of the above offset frequencies
The offset frequencies are selected by entering a numeral “1” in the
correct “XXXX” position.
NOTE The value 0001 is not used and is reserved for future use.
Default value The default frequency offsets are 1110 (all offsets).
Example Enter 1000 in the value field to test ORFS modulation at 0.4 MHz,
which corresponds with the “1XXX” parameter position.
NOTE ORFS due to ramping measurements are performed both below and
above the carrier at each of the selected offset frequencies.
43 TX ORFS Ramping Measurement Averages [>1]
NOTE This parameter is not used with the HP/Agilent 8922 unless spectrum
analyzer is installed.
This parameter determines how many measurements to average for
each offset frequency defined in parameter TX ORFS ramping
offsets. The range is 1 to 999.
Default value The default number of measurement averages for ORFS due to
ramping is 2 which is enough to provide the required accuracy.
Example If you want to average over 10 measurement results taken during the
ORFS due to ramping test, you would enter 10 in the value field.
NOTE If 10 is entered, ten measurements are made at each offset selected
both below and above the carrier frequency.