User`s guide

2-12
GPIB Tutorial and Examples
Example E - Faster Testing
Example E - Faster Testing
Load and run example program 1, then program 2, then program 3, or look at the test times
tabulated in section 4 for the Agilent 8922M. The three programs are configured to
perform an identical list of tests, yet their test times are different. This is achieved using
various techniques.
Example program 1 does use some techniques to improve speed:
❒ The complete set of DSP measurements are performed in parallel.
❒ TX peak power measurements are made in parallel with DSP measurements.
❒ Additional TX peak power measurements are made using the Fast TX Carrier Power
measurement. Points covered during the DSP test are not repeated.
❒ Loops are chosen to minimise the number of mobile TX level changes.
❒ No fixed delays are used.
❒ RXQual, RXLev and TX Timing error are checked in parallel with bit error ratio.
❒ Results are printed after testing is complete.
Example program 2 adds some additional time saving techniques:
❒ A hopped call is used for TX measurements to reduce channel changing time.
❒ Measured power is used to determine when the mobile TX Level has settled rather than
waiting for uplink SACCH report.