Specifications

8
Measurements
The following measurements are available from the tool bar,
as well as the pull down menus. The available measurements
depend on the DCA-J operating mode.
Oscilloscope mode
• Time
Rise Time, Fall Time, Jitter RMS, Jitter p-p, Period, Frequency,
+ Pulse Width, – Pulse Width, Duty Cycle, Delta Time, [Tmax,
Tmin, Tedge—remote commands only]
• Amplitude
Overshoot, Average Power, V amptd, V p-p, V rms, V top,
V base, V max, V min, V avg, OMA (Optical Modulation
Amplitude)
Eye/mask mode
• NRZ eye measurements
Extinction Ratio, Jitter RMS, Jitter p-p, Average Power,
Crossing Percentage, Rise Time, Fall Time, One Level, Zero
Level, Eye Height, Eye Width, Signal to Noise, Duty Cycle
Distortion, Bit Rate, Eye Amplitude
• RZ eye measurements
Extinction Ratio, Jitter RMS, Jitter p-p, Average Power,
Rise Time, Fall Time, One Level, Zero Level, Eye Height, Eye
Amplitude, Opening Factor, Eye Width, Pulse Width, Signal to
Noise, Duty Cycle, Bit Rate, Contrast Ratio
Mask Test
• Open Mask, Start Mask Test, Exit Mask Test, Filter, Mask
Test Margins, Mask Margin to a Hit Ratio, Mask Test Scaling,
Create NRZ Mask
Advanced measurement options
• The 86100C’s software options allow advanced analysis.
Options 200, 201, and 300 require mainframe Option 001.
Option 202 does not require Option 86100-001. Option 401
does not require Options 001 and 200 unless a DDPWS
measurement is required.
Option 200 enhanced jitter analysis software
• Measurements
Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter (DJ),
Periodic Jitter (PJ), Data Dependent Jitter (DDJ), Duty Cycle
Distortion (DCD), Intersymbol Interference (ISI), Sub-Rate Jitter
(SRJ), Asynchronous periodic jitter frequencies, Subrate jitter
components.
• Data displays
TJ histogram, RJ/PJ histogram, DDJ histogram, Composite
histogram, DDJ versus Bit position, Bathtub curve (log or Q
scale)
Option 201 advanced waveform analysis
• Measurements
Deep memory pattern waveform, user-defined measurements
through MATLAB interface, Transmitter Waveform Dispersion
Penalty (TWDP)
• Data displays
Equalized waveform
Option 202 enhanced impedence and S-parameters
Option 300 amplitude analysis/RIN/Q-factor
(requires Option 200)
• Measurements
Total Interference (TI), Deterministic Interference (Dual-Dirac
model, DI), Random Noise (RN), Periodic Interference (PI), and
Inter-symbol Interference (ISI), RIN (dBm or dB/Hz), Q-factor
• Data Displays
TI histogram, RN/PI histogram, ISI histogram
Option 400 PLL and jitter spectrum measurement software
• Jitter spectrum/phase noise measurements
Integrated Jitter: Total Jitter (TJ), Random Jitter (RJ),
Deterministic Jitter (DJ); DJ Amplitude/Frequency, Jitter
Spectrum Graph, Jitter versus Time Graph, Frequency
versus Time Graph, JitterHistogram, Post Processed Jitter
Measurements, Phase Noise Graph dBc/Hz versus Frequency
• Phase Locked Loop (PLL) measurements
PLL Bandwidth, PLL Peaking, Data Rate, Jitter Transfer
Function (JTF) Graph, Observed Jitter Transfer (OJTF) Graph,
JTF Model.
Option 401 advanced EYE analysis
• Jitter measurements
Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter (DJ),
J2 Jitter (J2), J9 Jitter (J9), Data Dependent Pulse Width
Shrinkage (DDPWS)*
* Requires 86100C-200
• Amplitude measurements
Total Interference (TI), Random Noise (RN), Deterministic
Interference (DI), Eye Opening
• Mask test
Pass/Fail Status, BER limit
TDR/TDT mode (requires TDR module)
• Quick TDR, TDR/TDT Setup, Normalize, Response, Rise Time,
Fall Time, Δ Time, Minimum Impedance, Maximum Impedance,
Average Impedance, (Single-ended and Mixed-mode
S-parameters with Option 202)