Specifications

4
Eye diagram mask testing
The 86100C provides efficient, high-throughput waveform compli-
ance testing with a suite of standards based eye-diagram masks.
The test process has been streamlined into a minimum number of
keystrokes for testing at industry standard data rates.
Standard formats
Rate (Mb/s)
1X Gigabit Ethernet 1250
2X Gigabit Ethernet 2500
10 Gigabit Ethernet 9953.28
10 Gigabit Ethernet 10312.5
10 Gigabit Ethernet FEC 11095.7
10 Gigabit Ethernet LX4 3125
Fibre Channel 1062.5
2X Fibre Channel 2125
4X Fibre Channel 4250
8x Fibre Channel 8500
10X Fibre Channel 10518.75
10X Fibre Channel FEC 11317
16x Fibre channel 14025
Infiniband 2500
STM0/OC1 51.84
STM1/OC3 155.52
STM4/OC12 622.08
STM16/OC48 2488.3
STM16/OC48 FEC 2666
STM64/OC192 9953.28
STM64/OC192 FEC 10664.2
STM64/OC192 FEC 10709
STM64/OC192 Super FEC 12500
STM256/OC768 39813
STS1 EYE 51.84
STS3 EYE 155.52
Other eye-diagram masks are easily created through scaling
those listed above. In addition, mask editing allows for new
masks either by editing existing masks, or creating new masks
from scratch. A new mask can also be created or modified on
an external PC using a text editor such as Notepad, then can be
transferred to the instrument’s hard drive using LAN or Flash
drive.
Perform these mask conformance tests with convenient user-
definable measurement conditions, such as mask margins for
guardband testing, number of waveforms tested, and stop/limit
actions. Mask margin can be determined automatically to a user
definable hit/error ratio. Transmitter waveform dispersion penalty
(TWDP) tests can be performed directly in the 86100C. Exporting
the waveform for external post processing is not required. (Option
201 and MATLAB
®
required. Dispersion penalty script for specific
test standards must be loaded into the 86100C.)
Eyeline Mode
Eyeline Mode is available in the 86100C and provides insight into
the effects of specific bit transitions within a data pattern. The
unique view assists diagnosis of device or system failures due to
specific transitions or sets of transitions within a pattern. When
combined with mask limit tests, Eyeline Mode can quickly isolate
the specific bit that caused a mask violation.
Traditional triggering methods on an equivalent time sampling
scope are quite effective at generating eye diagrams. However,
these eye diagrams are made up of samples whose timing
relationship to the data pattern is effectively random, so a given
eye will be made up of samples from many different bits in the
pattern taken with no specific timing order. The result is that
amplitude versus time trajectories of specific bits in the pattern
are not visible. Also, averaging of the eye diagram is not valid,
as the randomly related samples will effectively average to the
“middle” of the eye.
Eyeline Mode uses PatternLock triggering (Option 001 required)
to build up an eye diagram from samples taken sequentially
through the data pattern. This maintains a specific timing
relationship between samples and allows Eyeline Mode to draw
the eye based on specific bit trajectories. Effects of specific bit
transitions can be investigated, and averaging can be used with
the eye diagram.
PatternLock triggering advances the capabilities of the
sampling oscilloscope
The Enhanced Trigger option (Option 001) on the 86100C provides
a fundamental capability never available before in an equivalent
time sampling oscilloscope. This new triggering mechanism
enables the DCA-J to generate a trigger at the repetition of the
input data pattern – a pattern trigger. Historically, this required
the pattern source to provide this type of trigger to the scope.
With the press of a button, PatternLock automatically detects
the pattern length, data rate and clock rate making the complex
triggering process transparent to the user.
PatternLock enables the 86100C to behave more like a real-time
oscilloscope in terms of user experience. Observation of specific
bits within the data pattern is greatly simplified. Users that are
familiar with real-time oscilloscopes, but perhaps less so with
equivalent time sampling scopes will be able to ramp up quickly.
PatternLock adds another new dimension to pattern triggering
by enabling the mainframe software to take samples at specific
locations in the data pattern with outstanding timebase accuracy.
This capability is a building block for many of the new capabilities
available in the 86100C described later.
Overview of Infiniium DCA-J
Features