Specifications

2
Industry’s
Most Advanced
RF Test Solution
Reach for unrivaled
excellence
Choose the leader in network analysis
The PNA-X Series of microwave network analyzers are the culmination of Agilent’s 40-year legacy
of technical leadership and innovation in radio frequency (RF) network analysis. More than
just a vector network analyzer, the PNA-X is the world’s most integrated and flexible microwave
test engine for measuring active devices like amplifiers, mixers, and frequency converters.
The combination of two internal signal sources, a signal combiner, S-parameter and noise
receivers, pulse modulators and generators, and a flexible set of switches and RF access points
provide a powerful hardware core for a broad range of linear and nonlinear measurements,
all with a single set of connections to your device-under-test (DUT).
When you’re characterizing active devices, the right mix of speed and performance gives you an
edge. In R&D, the PNA family provides a level of measurement integrity that helps you transform
deeper understanding into better designs. On the production line, our PNAs deliver the throughput
and repeatability you need to transform great designs into competitive products. Every Agilent VNA
is the ultimate expression of our expertise in linear and nonlinear device characterization. Choose a
PNA --and reach for unrivaled excellence in your measurements and your designs.
World´s widest range of measurement applications
PNA-X applications bring speed, accuracy, and ease-of-use to common RF measurements,
in coaxial, fixtured, and on-wafer environments. Applications include:
• S-parameters (CW and pulsed)
• Noise figure
• Gain compression
• Intermodulation and
harmonic distortion
Network analysis technology down to the nanoscale
The PNA-X is also compatible with these Agilent measurement solutions:
• Physical layer test system (PLTS) software to calibrate, measure, and analyze linear
passive interconnects, such as cables, connectors, backplanes, and printed circuit boards.
• Materials test equipment and accessories to help determine how your materials
interact with electromagnetic fields, by calculating permittivity and permeability.
• Award-winning scanning microwave microscope to create a powerful and unique
combination for topography measurements of calibrated capacitance and dopant
densities at nanoscale dimensions.
The right frequency for your application
All of the PNA-X’s powerful
measurement applications can be used
for on-wafer devices.
Build your optimal test system by selecting the frequency range for your specific device-test
needs without paying for functionality you don’t need.
10 MHz to 13.5 GHz
10 MHz to 26.5 GHz
10 MHz to 43.5 GHz
10 MHz to 50 GHz
N5241A
N5242A
N5244A
N5245A
10 MHz to 67 GHz
N5247A
PNA-X with mm-wave modules
10 MHz to 1.05 THz
10 MHz to 8.5 GHz
N5249A
• Conversion gain/loss
• True-differential stimulus
• Nonlinear waveform and
X-parameter* characterization
• Antenna test
*
X-parameters is a registered trademark of Agi-
lent Technologies. The X-parameter format and
underlying equations are open and documented.
For more information, visit;
http://www.agilent.com/find/eesof-x-parameters-info