Specifications

10
Pulsed-RF measurement challenges
• Pulse generators and modulators required for pulsed-RF measurements add
complexity in test setups
• For narrow pulses:
– Maximum IF bandwidth of analyzer is often too small for wideband detection
– Narrowband detection is slow, and measurements are noisy for low duty cycle pulses
PNA-X pulsed-RF measurements provide:
• A simple user interface for full control of two internal pulse modulators (Option 021
and 022), and four internal independent pulse generators (Option 025)
• Point-in-pulse measurements with 20 ns minimum pulse width, and pulse profile
measurements with 10 ns minimum resolution (Option 008)
• Improved measurement speed and accuracy for narrowband detection using hardware
filters and patented spectral-nulling and software IF-gating techniques
• Measurements using wideband detection with pulse widths as narrow as 100 ns
• Pulse I/O connector on rear panel for synchronization
with external equipment and DUT
• Accurate active-component
characterization using unique
application measurement
classes for gain compression,
swept-frequency/power IMD,
and noise figure
Pulsed-RF measurement application automatically optimizes
internal hardware configuration for specified pulse conditions to
dramatically simplify test setups. Alternately, users can choose
to manually set up the hardware for unique test requirements.
Pulse profile measurement using narrowband detection
technique allows 30 measurement points within 300 ns pulse,
with 10 ns timing resolution.
Providing the first one-box
pulsed-RF test system, the
PNA-X sets a new standard for
simplicity, speed, and accuracy.
By the 1990s,
the HP 8510 was
the industry-
standard for
pulsed-RF
vector network
analyzers.
The PNA Series
replaced the
pulsed 8510 with a
bench-top solution.
Innovative
Applications
Simple, fast and
accurate pulsed-RF
measurements
(Options 008, 021, 022, 025)