Service manual

8510XF Network Analyzer Systems 3-41
Operation
Service
Peek/Poke Functions The last three softkeys make it possible to read from, or write to, a location
within the memory of the millimeter-wave controller.
• {PEEK/POKE LOCATION} specifies the memory location to be read from, or
written to.
• {PEEK TEST SET} reads data from the memory location already specified.
• {POKE TEST SET} writes data to the memory location already specified.
Leveling Settings [SYSTEM] {MORE} {SERVICE FUNCTIONS} {XF TESTSET SERVICE} {LEVELING SETTINGS}
calls up the submenu shown on the right of Figure 3-22 on the previous
page.
These functions relate to detector gain calibration (see “Reset Detector Gain
Calibration” on page 3-34). They are intended to be used only by Agilent
service engineers.
{SET GAIN (IF LEVEL)} makes it possible to specify the gain (in dB) of the
programmable gain portion of the level control circuit. (Perform a detector
gain calibration before selecting this function.)
{SET ATTN} makes it possible to specify the attenuator setting for the
programmable gain portion of the level control circuit. Possible values are 0
to 133, with each increment representing 0.5 dB of attenuation.
{SET DAC} makes it possible to specify a multiplier value for the DAC in the
programmable gain portion of the level control circuit. Possible values are
0 to 255.