Specifications

Noise Sidebands > 50 kHz Offsets Performance Test
Agilent Technologies
PSA Series Spectrum Analyzers
Test and Adjustment Software
Noise Sidebands > 50 kHz Offsets Performance Test
This test verifies that the PSA meets it's Noise Sidebands specification for offsets greater
than 50 kHz from the center frequency.
In this test, the source is connected to the RF Input and the noise level is measured at
offsets of 100 kHz, 1 MHz, 6 MHz, and 10 MHz. In order to minimize the PSA DANL
effects, near noise corrections are applied at each offset frequency. Near noise corrections
involve measuring the noise sidebands with the RF signal On, and then measuring the
DANL with the RF signal Off. Both measurements are then converted to power (in
Watts), and the noise power is subtracted from the sideband power.
The resulting power is converted to dBm. The sideband power is then subtracted from the
carrier power to convert the measurement to dBc. The resulting dBc measurement is
normalized to 1 Hz RBW, and 2.25 dB of corrections are added. The 2.25 dB corrections
account for:
1. The Rayleigh Distribution of noise (1.05 dB).
2. The Log Response of the PSA (1.45 dB).
3. Equivalent Noise Bandwidth of the RBW filters (-.25 dB).
This test is performed in conjunction with the Noise Sidebands < 50 kHz Offsets test.
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