Technical data

85108L System Manual
Operation
High Power Measurements
3-37
• Test set configuration changes error terms other than frequency response between calibration
and measurement.
If changes to the test set between calibration and measurement significantly change the
directivity, isolation, source or load match, or frequency response error coefficients measured
during the calibration, then the corrected data will be in error. If only the frequency response
characteristics of the test set change, compensation can be provided using the display memory
features of the 8510. (See “Changing the Signal Path After Calibration” on page 3-35.)
In all of these situations the best choice will be to use a separate error model for each parameter.
For example, use the Response or the Response & Isolation calibration for the S21 and S12
parameters, and 1-Port calibrations for the S11 and S22 parameters. Combining error models like
this allows setup, calibration, and measurement for each parameter to be accomplished
independently. After separate calibration for each parameter, the forward/reverse switch in the test
set will respond to front panel parameter selections, and the cal set for the selected parameter will
be recalled.
General Calibration and Measurement Sequence
• Specify the device's input/output requirements.
• Configure the test set for these levels, plus a guardband.
• Connect the operating device and verify levels.
• Adjust levels for the best dynamic range.
• Perform a measurement calibration.
• Measure operating device S-parameters.
General Calibration and Measurement Sequence Using Display Math
• Specify the device input/output requirements.
• Configure the test set for these levels, plus a guardband.
• Connect the operating device and verify levels.
• Configure the setup for best dynamic range.
• Connect the standards and verify levels.
• Change the setup for best dynamic range during calibration.
• Perform a measurement calibration. (Before saving the cal set, configure the setup for the
operating device.)
• Connect the appropriate standards and store the reference traces.
• Connect the operating device.
• Use normalization to view the device parameters.