Specifications

95
Chapter 3: Testing Performance
Performance Test Record
Performance Test Record
Performance Test Record
16760A Logic Analyzer
Logic Analyzer Serial No. Work Order No.
Date: Recommended Test Interval - 2 Year/4000 hours
Recommended next testing:
Test Equipment Used
Pulse Generator Model No. Oscilloscope Model No.
Pulse Generator Serial No. Oscilloscope Serial No.
Pulse Generator Calibration Due Date: Oscilloscope Calibration Due Date:
Measurement Uncertainty
Clock Rate Pulse Width (Eye Width)
Pulse Generator Frequency Accuracy:
8133A: 1% of setting
Test Margin: 1%
Oscilloscope Horizontal Accuracy:
54845B: ±[((0.007%) (t)+(full scale/(2x memory
depth))+30 ps] 30 ps
54845A/B Oscilloscope Display Resolution: ±5 ps
Test Margin: 35 ps. Sum: 70 ps
Setting: 200 MHz+2%=204 MHz (102 MHz double edge)
400 MHz+2%=408 MHz (204 MHz double edge)
800 MHz+2%=816 MHz (408 MHz double edge)
1250 MHz+2%=1275 MHz (638 MHz double edge)
1500 MHz+2%=1530 MHz (765 MHz double edge)
Pulse Width setting: 1.5 ns - 70 ps = 1430 ps
Pulse Width setting: 1.5 ns - 70 ps = 1430 ps
Pulse Width setting: 750 ps - 70 ps = 680 ps
Pulse Width setting: 750 ps - 70 ps = 680 ps
Pulse Width setting: 600 ps - 70 ps = 530 ps
Te s t s
Test Settings Results
Initial Self-Tests n/a Pass/Fail:
200 Mb/s mode Minimum clock interval, min. eye width Pass/Fail:
400 Mb/s mode Minimum clock interval, min. eye width Pass/Fail:
800 Mb/s mode Minimum clock interval, min. eye width Pass/Fail:
1250 Mb/s mode Minimum clock interval, min. eye width Pass/Fail:
1500 Mb/s mode Minimum clock interval, min. eye width Pass/Fail:
Multi-card module self test n/a Pass/Fail: