Specifications

150
Index
S
self-test
, 105
description
, 106
specifications
, 11
storage
, 16
system
backplane clock
, 109
operating, 10, 102
test
, 112
turn on
, 28
T
test
ADC
, 110
analyzer chip memory bus
, 108
analyzer memory bus SU/H measure,
109
chip registers
, 108
comparators calibration, 111
comparators programming
, 110
comparators V offset
, 111
CPLD register, 106
data path demux
, 111
data path pass-thru
, 111
demux data arrays programming, 110
E5378A cable
, 113
E5379A cables
, 121
EEPROM, 110
equipment
, 13, 33
FPGA load
, 106
FPGA register, 106
global and local arm lines
, 109
HW accelerated search
, 108
HW assisted memory cell, 107
inter-chip resource bus
, 109
inter-module flag bits
, 109
interval, 32
LA chip calibration
, 111
memory address bus
, 107
memory data bus, 107
memory DMA unload
, 108
memory sleep mode
, 108
memory unload modes, 107
module
, 28
multi-card module
, 32, 95
one-card module, 32
performance record
, 96
probe ID read
, 110
record description, 32
self-test
, 105
strategy
, 32
system, 112
system backplane clock
, 109
system clocks
, 108
testing performance
, 31
equipment
, 13, 33
interval
, 32
multi-card module
, 32
test record
, 96
theory of operation, 143
tools required
, 128
troubleshooting
, 101