Specifications

Fast measurement that
lowers cost-of-test
The fast measurement speed of the
E5263A makes it an ideal choice
for high-speed production test in
situations requiring only one or two
SMUs.BasedonAgilent4070Series
system technology, the Agilent E5263A
lowers your cost-of-test with a high-
speed parametric test solution for
semiconductor, RFIC, and optical
component testing. HPSMU and
MPSMU modules and a ground unit
are included in the E5263A, providing
just enough test capability for many
component-testing needs. The E5263A
provides superior measurement
throughput, several times faster
than earlier products such as the
Agilent 4142B.Anumberofinnova-
tive design elements help to improve
the efficiency of complex testing,
such as expanded program memory
to accelerate the measurement
process, and 16 digital I/O lines for
sophisticated triggering requirements.
High measurement speed
The E5263A performs DC measure-
ments of current and voltage and
achieves measurement speeds that
are 2-3 times faster than that of the
Agilent4142B.Easilymigratefrom
yourcurrent4142Btestenvironment
to the E5263A because programs
developedforthe4142Bcanrun
on the E5263A with only minor
modification.
Application Specific DC Power Supplies tailored solutions for specific needs
150
Perform high-speed, DC parametric measurements
Fixed-configuration dual SMU instrument
E5263A
Source Measure Units
E5263A 2-Channel
(High Power, Medium Power)
High Speed Source Monitor Unit
Innovative design elements support
complex testing and improve efficiency
Program memory has been greatly
enhanced, with storage capacity for
up to 40,000 command lines, which
accelerates the measurement process.
A fast and flexible advanced trigger-
ing scheme, based upon 16 digital
I/Olines,inadditiontotheBNC
trigger-in & trigger-out connectors,
is ideal for sophisticated triggering
requirements. Also, trigger signals
are routed through hardware rather
than firmware, resulting in the fastest
instrument response possible. To
enable parallel testing, each SMU
is equipped with its own analog-to-
digital converter (ADC) therefore no
bottlenecks. Engineers can perform
and report spot measurements easily
via a simple front-panel interface,
without programming. In addition,
you can use the same user interface
to view other items of interest, such
as error messages when debugging
the instrument performance under
automated control.
Cost-effective solution for simple
parametric test requirements
Many component measurements,
such as laser diode and photo diode
characterization, require only one or
two source/monitor units. The con-
figuration of the E5263A provides
the ideal balance of functionality for
such tasks at an affordable price.
Mainframe
Characteristics
E5263A 2-Channel High Speed Source Monitor Unit
Available slots Two channel (HPSMU and MPSMU) configuration
Ground Unit (GNDU) Sink Capability 2.2 A
Instrument control GPIB
External trigger inputs/outputs 1 BNC trigger in; 1 BNC trigger out; 8 programmable trigger in/out
Included
Module
E5290A E5291A
High Speed HPSMU High Speed MPSMU
Maximum force voltage ±200 V ±100 V
Maximum force current ±1 A ±200 mA
Voltage measurement resolution 100 µV 100 µV
Current measurement resolution 5 pA 5 pA
More detailed specifications at www.agilent.com/find/E5263A