Specifications

Fast measurement that
lowers cost-of-test
The fast measurement speed and
modular nature of the E5260A makes
it an ideal choice for high-speed
production test. For technologically
advanced devices of today and
tomorrow, the Agilent E5260A
lowers your cost-of-test with a high-
speed parametric test solution for
semiconductor, RFIC, and optical
componenttesting.Basedonwell-
proven Agilent 4070 Series system
technology, the E5260A provides
superior measurement throughput
that is several times faster than
earlier products such as the Agilent
4142B.Theinstrumentismodular,
which enables customization now
and provides for future expansion
as requirements change. A number
of innovative design elements help
to improve the efficiency of complex
testing, such as expanded program
memory to accelerate the measure-
ment process, and 16 digital I/O
lines for sophisticated triggering
requirements. Moreover, historically
encountered power limitations on
the instrument mainframe (such
asoftenoccurwiththe4142B)
have been eliminated.
Application Specific DC Power Supplies tailored solutions for specific needs
More detailed specifications at www.agilent.com/find/E5260A
146
Perform high-speed, DC parametric measurements
Eight slots for plug-in modules
Code compatible with 4142B
E5260A
Source Measure Units
E5260A 8-Slot High Speed
Measurement Mainframe
Modular design enables customization
now and provides for future expansion
The flexible, modular configuration
has eight slots available for plug-in
modules. Currently available source/
monitor unit (SMU) types are a
medium power SMU (MPSMU) –
requiring one slot – and a high-power
SMU (HPSMU) – requiring two slots.
Easily expand into the E5260A from
your current environment because
commandsdevelopedonthe4142B
can also run on the new system.
High measurement speed
The E5260A performs DC measure-
ments of current and voltage through
measurement speeds of SMUs that
are 2-3 times faster than that of the
Agilent4142B.
Innovative design elements support
complex testing and improve efficiency
Program memory has been greatly
enhanced, with storage capacity for
up to 40,000 command lines, which
accelerates the measurement process.
A fast and flexible advanced triggering
Mainframe
Characteristics
Module
Selection Guide
E5260A 8-Slot Precision Measurement Mainframe
E5290A E5291A
High Speed HPSMU High Speed MPSMU
Available slots 8
Ground Unit (GNDU) Sink Capability 4.0 A
Instrument control GPIB
External trigger inputs/outputs 1 BNC trigger in; 1 BNC trigger out; 8 programmable trigger in/out
Required slots 2 1
Maximum force voltage ± 200 V ± 100 V
Maximum force current ± 1 A ± 200 mA
Voltage measurement resolution 100 µV 100 µV
Current measurement resolution 5 pA 5 pA