Specifications

140 Glossary
Information defined at the DUT layer includes:
• Definitions of convenient aliases for test points on the DUT, such as “TP1.”
U
Unit Under Test (UUT)
The automotive module or printed circuit board being tested. Also known as Device Under Test (DUT)
UUT Common
A fifth column alongside the ABus in the Measurement Control Module and 32-Pin Matrix Module that
connects to the UUT common.
V
V/I
An acronym for the concept of sourcing a voltage and measuring the resulting current, or conversely
sourcing a current and measuring the resulting voltage.
VISrcHi and VISrcLo
VISrcHi is the signal side of the V/I Source in the Measurement Control module to the ABus, and
VISrcLo is the ABus path to V/I ground. The V/I amplifier is an isolated source.
Variant
A mechanism that lets you specify which named variation on a test is executed when you run a test plan.
Each variant lets you:
• Use the same sequence of tests with different parameters and limits. For example, you
may want to specify different limits for various temperatures at which the tests are exe-
cuted.
• Control which set of tests is executed for a given test plan. For example, the set of tests
used by Quality Control may be a superset of the tests used by Production.
• Change the testing algorithm as desired. For example, a testing algorithm used by Qual-
ity Control may need greater precision than a testing algorithm used by Production.
The name of the default variant is Normal. Other typical variants might be named Hot or Cold.
V
batt
The voltage measured at the battery's terminals, ignoring cabling losses.
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