Specifications

128 Glossary
D
DAC
Digital to Analog Converter - Converts a digital signal to an analog signal.
Datalogging
The process of collecting data about tests when the test plan runs. Subsequent study of this data can aid
you in improving the processes associated with manufacturing and testing.
Debug Panel
On the front panel of the TS-5400 system there is a test point for each ABus column (four total). These
test points allow monitoring the bus status during troubleshooting operations.
Device Under Test (DUT)
The automotive module or printed circuit board being tested. Also know as Unit Under Test (UUT).
Digitizer
Analog to digital converter - Converts an analog signal to a digital signal at a multiple sample per second
rate.
DLL
Dynamic Link Library: A library of code that is automatically loaded and unloaded as needed.
Duty Cycle
That portion of a cycle when components are actually being used. For example: A component that can
carry 10A with a 10% duty cycle, and with a cycle equal to 1 second, could carry 10A for 100ms, then
0A for 900ms.
E
Event Detector
An instrument that simultaneously compares the values of up to 32 synchronous input channels between
two consecutive clock cycles. If there is a change on any channel the new state is stored in a set of FIFO
(first in, first out) registers along with a time stamp to allow determining the relative time span between
recorded events. Up to 1024 events can be recorded at one time.
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