Specifications

System Introduction 11Chapter 1
Chapter 1
System Introduction
Chapter Contents
This chapter gives an introduction to the Agilent TS-5400 Functional Test
System. Chapter contents are:
Typical System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 11
System Software . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 14
Conceptual Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . page 15
System Hardware . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . page 17
Typical System
A typical Agilent Functional Test System for High Pin-Count Devices
includes:
an Agilent E6198 Switch/Load Unit,
an Agilent E8792A 32-Pin Matrix and Instrument Multiplexer
Module,
an E8401A 13-slot VXI mainframe,
an E1411B Digital Multimeter (DMM),
an E6171A Measurement Control Module (MCM)
an Industrial PC system controller
One or more Agilent E6175A, E6176A, E6177A, and/or E6178A
Load Cards
One or more power supplies
a Test System Interface or Mass Interconnect
Other optional GPIB instruments such as the Agilent 33120 Arbitrary
Waveform Generator
Other optional VXI instruments such as an E1563A 2-Channel
Digitizer or an E1418A 8-Channel DAC.
Figure 1-1 shows a typical Agilent E8780B Medium Pin-Count System and
Figure 1-2 shows an Agilent E8786B Large Pin-Count System. .
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