Technical data

N3300A
N3301A
N3302A
N3303A
N3304A
N3305A
N3306A
34 AGILENT dc ELECTRONIC LOADS
Features for Increased Test Throughput:
Program load input values more than 10 times faster.
Load commands can be stored in the instrument, so
they can be executed at maximum rate during runtime.
Triggers can be used to begin preloaded test routines
without any computer interaction.
Multiple load modules can be simultaneously triggered to
assume individual preprogrammed levels.
Measurement data can be buffered in the load, and read
back to the computer in one array.
Rising and falling slew rates are separately controllable.
Features for Increased Measurement Accuracy & Flexibility
• Dual simultaneous voltage and current measurements
• RMS measurements
• Waveform digitization, which is especially valuable for
transient response testing.
• Programmable sampling rate and sampling window
Other Key Features
• Constant current, constant voltage, and constant resistance
operating modes
• Transient generator can provide one-time or repetitive
pulses.
• GP-IB (IEEE-488.2) and RS-232 standard
• Industry standard SCPI programming commands
• Full control of all operating features from the front panel
keypad
• Analog programming allows custom waveforms
• Analog monitoring port
• Parallel modules in constant current mode for more power
• Full protection from overcurrent, overvoltage,
overtemperature, overpower, and reverse polarity.
• Remote voltage sense in constant voltage mode.
• Standard 3-year warranty
• Electronic calibration
• VXI Plug&Play drivers
These electronic loads have what is needed to test today’s dc
power supplies. The new N3300A family is optimized for
power supply test in high volume manufacturing environ-
ments. These loads provide significant operating speed
improvements, and also have many additional features that
allow the system designer to further reduce test time.
Maximize throughput of your product through your manufac-
turing facility, without increasing floorspace.
The N3300A Series of electronic loads contributes to lower
system cost, reduced test system complexity, lower cost of
ownership and support, less rack space, and less floor space.
They provide measurement functions tailored for the testing
of dc sources, which normally would only be achieved via
additional equipment in a test system. Using these flexible
built-in functions, many system designers will be able to
reduce the usage of DMMs, oscilloscopes, and the
connecting switches and cabling. A simpler more reliable
system will result.
With increased accuracy and resolution, in both programming
and measurement, these dc electronic loads provide the preci-
sion needed for testing today’s dc sources.
N3300A
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dc
Electronic
Loads