Specifications

1.5.2 Test signal level
The test signal (AC) applied may affect the measurement result for some components. For example,
ceramic capacitors are test-signal-voltage dependent as shown in Figure 1-10 (a). This dependency
varies depending on the dielectric constant (K) of the material used to make the ceramic capacitor.
Cored-inductors are test-signal-current dependent due to the electromagnetic hysteresis of the core
material. Typical AC current characteristics are shown in Figure 1-10 (b).
Figure 1-10. Test signal level (AC) dependencies of ceramic capacitors and cored-inductors
1.5.3 DC bias
DC bias dependency is very common in semiconductor components such as diodes and transistors.
Some passive components are also DC bias dependent. The capacitance of a high-K type dielectric
ceramic capacitor will vary depending on the DC bias voltage applied, as shown in Figure 1-11 (a).
In the case of cored-inductors, the inductance varies according to the DC bias current flowing
through the coil. This is due to the magnetic flux saturation characteristics of the core material.
Refer to Figure 1-11 (b).
Figure 1-11. DC bias dependencies of ceramic capacitors and cored-inductors
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