User`s guide

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Table Of Contents

Title Page
- Notices
Contents
Getting Started
- Introduction
- Documentation Map
- Additional Documentation
- System Overview
Introduction and Measurement
- Introducing the GUI
- Designing to Meet Your Needs
  - Beginning
- E5505A Operation: A Guided Tour
  - Required equipment
  - How to begin
- Powering the System On
  - To power on a racked system
  - To power on a benchtop system
- Starting the Measurement Software
- Performing a Confidence Test
- Powering the System Off
Phase Noise Basics
- What is Phase Noise?
  - Phase terms
    - Spurious signals
    - Phase noise
Expanding Your Measurement Experience
- Starting the Measurement Software
- Using the Asset Manager
  - Configuring an asset
- Using the Server Hardware Connections to Specify the Source
- Setting GPIB Addresses
  - To change the GPIB address
- Testing the 8663A Internal/External 10 MHz
- Testing the 8644B Internal/External 10 MHz
- Viewing Markers
- Omitting Spurs
- Displaying the Parameter Summary
- Exporting Measurement Results
Absolute Measurement Fundamentals
- The Phase-Lock-Loop Technique
  - Understanding the Phase-Lock-Loop Technique
  - The Phase-Lock-Loop Circuit
- What Sets the Measurement Noise Floor?
  - The System Noise Floor
  - The Noise Level of the Reference Source
- Selecting a Reference
- Estimating the Tuning Constant
- Tracking Frequency Drift
  - Evaluating beatnote drift
    - Action
- Changing the PTR
  - The Tuning Qualifications
    - Voltage controlled oscillators
    - Signal generators
- Minimizing Injection Locking
  - Adding Isolation
  - Increasing the PLL Bandwidth
- Inserting a Device
  - An attenuator
  - An amplifier
- Evaluating Noise Above the Small Angle Line
  - Determining the Phase-Lock-Loop bandwidth
    - Observing the beatnote
    - Measurement options
Absolute Measurement Examples
- Stable RF Oscillator
- Free-Running RF Oscillator
- RF Synthesizer Using DCFM
- RF Synthesizer Using EFC
- Microwave Source
Residual Measurement Fundamentals
- What is Residual Noise?
  - The noise mechanisms
    - Additive noise
    - Multiplicative noise
- Assumptions about Residual Phase Noise Measurements
  - Frequency translation devices
- Calibrating the Measurement
- Measurement Difficulties
  - System connections
Residual Measurement Examples
- Amplifier Measurement Example
FM Discriminator Fundamentals
- The Frequency Discriminator Method
  - Basic theory
  - The discriminator transfer response
    - System sensitivity
    - Optimum sensitivity
FM Discriminator Measurement Examples
- Introduction
- FM Discriminator Measurement using Double-Sided Spur Calibration
- Discriminator Measurement using FM Rate and Deviation Calibration
AM Noise Measurement Fundamentals
- AM-Noise Measurement Theory of Operation
  - Basic noise measurement
  - Phase noise measurement
- Amplitude Noise Measurement
  - AM noise measurement block diagrams
  - AM detector
    - AM detector specifications
    - AM detector considerations
- Calibration and Measurement General Guidelines
- Method 1: User Entry of Phase Detector Constant
  - Method 1, example 1
  - Method 1, example 2
- Method 2: Double-Sided Spur
  - Method 2, example 1
  - Method 2, example 2
- Method 3: Single-Sided Spur
AM Noise Measurement Examples
- AM Noise with N5500A Option 001
Baseband Noise Measurement Examples
- Baseband Noise with Test Set Measurement Example
- Baseband Noise without Test Set Measurement Example
Evaluating Your Measurement Results
- Evaluating the Results
  - Looking for obvious problems
  - Comparing against expected data
    - The device under test
    - The reference source
- Gathering More Data
  - Repeating the measurement
  - Doing more research
- Outputting the Results
  - Using a printer
- Graph of Results
  - Marker
- Omit Spurs
  - Parameter summary
- Problem Solving
Advanced Software Features
- Introduction
- Phase-Lock-Loop Suppression
  - PLL suppression parameters
- Ignore-Out-Of-Lock Mode
- PLL Suppression Verification Process
- Blanking Frequency and Amplitude Information on the Phase Noise Graph
  - Security level procedure
Reference Graphs and Tables
- Approximate System Noise Floor vs. R Port Signal Level
- Phase Noise Floor and Region of Validity
- Phase Noise Level of Various Agilent Sources
- Increase in Measured Noise as Ref Source Approaches DUT Noise
- Approximate Sensitivity of Delay Line Discriminator
- AM Calibration
- Voltage Controlled Source Tuning Requirements
- Tune Range of VCO for Center Voltage
- Peak Tuning Range Required by Noise Level
- Phase Lock Loop Bandwidth vs. Peak Tuning Range
- Noise Floor Limits Due to Peak Tuning Range
- Tuning Characteristics of Various VCO Source Options
- 8643A Frequency Limits
- 8644B Frequency Limits
- 8664A Frequency Limits
- 8665A Frequency Limits
- 8665B Frequency Limits
System Specifications
- Specifications
- Power Requirements
System Interconnections
- Making Connections
- System Connectors
- System Cables
- Connecting Instruments
PC Components Installation
- Overview
PC Digitizer Performance Verification
- Verifying PC Digitizer Card Output Performance
  - Required equipment
- PC Digitizer Card Input Performance Verification
  - Required equipment
Preventive Maintenance
- Using, Inspecting, and Cleaning RF Connectors
- General Procedures and Techniques
  - Connector Removal
- Instrument Removal
- Instrument Installation
Service, Support, and Safety Information
- Safety and Regulatory Information
- Service and Support
  - Agilent on the Web
- Return Procedure
  - Determining your instrument’s serial number
  - Shipping the instrument

Residual Measurement Fundamentals

7

Agilent E5505A User’s Guide 205

Figure 144 Multiplicative noise components

Device under

test

Source

Noiseless

source

Base band noise

Base band noise

mixed around

the signal