User`s guide

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Table Of Contents

Title Page
- Notices
Contents
Getting Started
- Introduction
- Documentation Map
- Additional Documentation
- System Overview
Introduction and Measurement
- Introducing the GUI
- Designing to Meet Your Needs
  - Beginning
- E5505A Operation: A Guided Tour
  - Required equipment
  - How to begin
- Powering the System On
  - To power on a racked system
  - To power on a benchtop system
- Starting the Measurement Software
- Performing a Confidence Test
- Powering the System Off
Phase Noise Basics
- What is Phase Noise?
  - Phase terms
    - Spurious signals
    - Phase noise
Expanding Your Measurement Experience
- Starting the Measurement Software
- Using the Asset Manager
  - Configuring an asset
- Using the Server Hardware Connections to Specify the Source
- Setting GPIB Addresses
  - To change the GPIB address
- Testing the 8663A Internal/External 10 MHz
- Testing the 8644B Internal/External 10 MHz
- Viewing Markers
- Omitting Spurs
- Displaying the Parameter Summary
- Exporting Measurement Results
Absolute Measurement Fundamentals
- The Phase-Lock-Loop Technique
  - Understanding the Phase-Lock-Loop Technique
  - The Phase-Lock-Loop Circuit
- What Sets the Measurement Noise Floor?
  - The System Noise Floor
  - The Noise Level of the Reference Source
- Selecting a Reference
- Estimating the Tuning Constant
- Tracking Frequency Drift
  - Evaluating beatnote drift
    - Action
- Changing the PTR
  - The Tuning Qualifications
    - Voltage controlled oscillators
    - Signal generators
- Minimizing Injection Locking
  - Adding Isolation
  - Increasing the PLL Bandwidth
- Inserting a Device
  - An attenuator
  - An amplifier
- Evaluating Noise Above the Small Angle Line
  - Determining the Phase-Lock-Loop bandwidth
    - Observing the beatnote
    - Measurement options
Absolute Measurement Examples
- Stable RF Oscillator
- Free-Running RF Oscillator
- RF Synthesizer Using DCFM
- RF Synthesizer Using EFC
- Microwave Source
Residual Measurement Fundamentals
- What is Residual Noise?
  - The noise mechanisms
    - Additive noise
    - Multiplicative noise
- Assumptions about Residual Phase Noise Measurements
  - Frequency translation devices
- Calibrating the Measurement
- Measurement Difficulties
  - System connections
Residual Measurement Examples
- Amplifier Measurement Example
FM Discriminator Fundamentals
- The Frequency Discriminator Method
  - Basic theory
  - The discriminator transfer response
    - System sensitivity
    - Optimum sensitivity
FM Discriminator Measurement Examples
- Introduction
- FM Discriminator Measurement using Double-Sided Spur Calibration
- Discriminator Measurement using FM Rate and Deviation Calibration
AM Noise Measurement Fundamentals
- AM-Noise Measurement Theory of Operation
  - Basic noise measurement
  - Phase noise measurement
- Amplitude Noise Measurement
  - AM noise measurement block diagrams
  - AM detector
    - AM detector specifications
    - AM detector considerations
- Calibration and Measurement General Guidelines
- Method 1: User Entry of Phase Detector Constant
  - Method 1, example 1
  - Method 1, example 2
- Method 2: Double-Sided Spur
  - Method 2, example 1
  - Method 2, example 2
- Method 3: Single-Sided Spur
AM Noise Measurement Examples
- AM Noise with N5500A Option 001
Baseband Noise Measurement Examples
- Baseband Noise with Test Set Measurement Example
- Baseband Noise without Test Set Measurement Example
Evaluating Your Measurement Results
- Evaluating the Results
  - Looking for obvious problems
  - Comparing against expected data
    - The device under test
    - The reference source
- Gathering More Data
  - Repeating the measurement
  - Doing more research
- Outputting the Results
  - Using a printer
- Graph of Results
  - Marker
- Omit Spurs
  - Parameter summary
- Problem Solving
Advanced Software Features
- Introduction
- Phase-Lock-Loop Suppression
  - PLL suppression parameters
- Ignore-Out-Of-Lock Mode
- PLL Suppression Verification Process
- Blanking Frequency and Amplitude Information on the Phase Noise Graph
  - Security level procedure
Reference Graphs and Tables
- Approximate System Noise Floor vs. R Port Signal Level
- Phase Noise Floor and Region of Validity
- Phase Noise Level of Various Agilent Sources
- Increase in Measured Noise as Ref Source Approaches DUT Noise
- Approximate Sensitivity of Delay Line Discriminator
- AM Calibration
- Voltage Controlled Source Tuning Requirements
- Tune Range of VCO for Center Voltage
- Peak Tuning Range Required by Noise Level
- Phase Lock Loop Bandwidth vs. Peak Tuning Range
- Noise Floor Limits Due to Peak Tuning Range
- Tuning Characteristics of Various VCO Source Options
- 8643A Frequency Limits
- 8644B Frequency Limits
- 8664A Frequency Limits
- 8665A Frequency Limits
- 8665B Frequency Limits
System Specifications
- Specifications
- Power Requirements
System Interconnections
- Making Connections
- System Connectors
- System Cables
- Connecting Instruments
PC Components Installation
- Overview
PC Digitizer Performance Verification
- Verifying PC Digitizer Card Output Performance
  - Required equipment
- PC Digitizer Card Input Performance Verification
  - Required equipment
Preventive Maintenance
- Using, Inspecting, and Cleaning RF Connectors
- General Procedures and Techniques
  - Connector Removal
- Instrument Removal
- Instrument Installation
Service, Support, and Safety Information
- Safety and Regulatory Information
- Service and Support
  - Agilent on the Web
- Return Procedure
  - Determining your instrument’s serial number
  - Shipping the instrument

14 Agilent E5505A User’s Guide

Figure 209. Setup diagram for the FM Discrimination measurement example 276

Table 44. Test set signal input limits and characteristics 277

Figure 210. System connect diagram example 278

Making the measurement 278

Figure 211. Calibration measurement (1 of 5) 279

Figure 212. Calibration measurement (2 of 5) 279

Figure 213. Calibration measurement (3 of 5) 280

Figure 214. Calibration measurement (4 of 5) 280

Figure 215. Calibration measurement (5 of 5) 280

When the measurement is complete 280

Figure 216. Typical phase noise curve using rate and deviation calibration 281

Table 45. Parameter data for the rate and deviation calibration example 282

11 AM Noise Measurement Fundamentals

AM-Noise Measurement Theory of Operation 286

Basic noise measurement 286

Phase noise measurement 286

Amplitude Noise Measurement 287

AM noise measurement block diagrams 287

Figure 217. AM noise system with N5500A opt 001 287

Figure 218. AM noise system with external detector 287

Figure 219. AM Noise system with 70429A Opt K21 AM detector 288

Figure 220. AM noise system with N5507A downconverter 288

AM detector 288

Figure 221. AM detector schematic 288

Table 46. Maximum carrier offset frequency 289

Calibration and Measurement General Guidelines 291

Method 1: User Entry of Phase Detector Constant 292

Method 1, example 1 292

Figure 222. Phase detector constant AM noise setup (method1, example 1) 292

Figure 223. AM noise calibration setup 293

Figure 224. AM detector sensitivity graph 293

Method 1, example 2 294

Figure 225. Phase detector constant AM noise setup (method 1, example 2) 294

Figure 226. Modulation sideband calibration setup 295

Method 2: Double-Sided Spur 296

Method 2, example 1 296

Figure 227. Double-Sided spur AM noise setup (method 2, example 1) 296

Figure 228. Measuring the carrier-to-sideband ratio 297

Figure 229. Measuring the calibration constant 297