User`s guide

10 Agilent E5505A User’s Guide
Table 24. Test set signal Input Limits and Characteristics 182
Checking the beatnote 182
Figure 129. Oscilloscope display of a beatnote from the test set Monitor port 183
Making the measurement 183
Figure 130. Selecting suppressions 184
Figure 131. Typical phase noise curve for an RF synthesizer using EFC 185
Table 25. Parameter data for the RF synthesizer (EFC) measurement 186
Microwave Source 188
Required equipment 188
Defining the measurement 188
Figure 132. Select the parameters definition file 188
Figure 133. Enter source information 190
Table 26. Tuning characteristics for various sources 190
Selecting a reference source 191
Figure 134. Selecting a reference source 191
Selecting Loop Suppression Verification 191
Figure 135. Selecting loop suppression verification 192
Setup considerations for the microwave source measurement 192
Figure 136. Noise characteristics for the microwave measurement 192
Beginning the measurement 193
Figure 137. Selecting a new measurement 193
Figure 138. Confirm measurement dialog box 193
Figure 139. Connect diagram for the microwave source measurement 194
Table 27. Test set signal input limits and characteristics 195
Checking the beatnote 195
Figure 140. Oscilloscope display of a beatnote from the test set Monitor port 196
Making the measurement 197
Figure 141. Selecting suppressions 198
Figure 142. Typical phase noise curve for a microwave source 199
Table 28. Parameter data for the microwave source measurement 200
7 Residual Measurement Fundamentals
What is Residual Noise? 204
The noise mechanisms 204
Figure 143. Additive noise components 204
Figure 144. Multiplicative noise components 205
Assumptions about Residual Phase Noise Measurements 206
Figure 145. Setup for typical residual phase noise measurement 206
Frequency translation devices 207
Figure 146. Measurement setup for two similar DUTs 207